San Jose, California
United States
35
2025-08-28
35
2026-01-27
These are the the leading inventors for applications assigned to Advantest Test Solutions, Inc.:
Advantest Test Solutions, Inc. based in San Jose, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
#2 | 2025-08-28 β Patent 12,540,968 granted on 2026-02-03WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
#3 | 2025-08-21 β Patent 12,540,967 granted on 2026-02-03WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
#4 | 2025-04-24 β Patent 12,613,273 granted on 2026-04-28WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING
#5 | 2024-06-06 β Patent 12,618,896 granted on 2026-05-05ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
#6 | 2024-04-25 β Patent 12,345,756 granted on 2025-07-01INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PARALLEL SOCKET ACTUATION
#7 | 2024-02-01 β Patent 12,210,056 granted on 2025-01-28Thermal array with gimbal features and enhanced thermal performance
#8 | 2024-01-25 β Patent 12,203,958 granted on 2025-01-21Shielded socket and carrier for high-volume test of semiconductor devices
#9 | 2024-01-04 β Patent 12,216,154 granted on 2025-02-04Active thermal interposer device
#10 | 2023-12-07 β Patent 12,174,248 granted on 2024-12-24Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system
#11 | 2023-12-07 β Patent 12,411,167 granted on 2025-09-09TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THERMAL ARRAY
#12 | 2023-10-05 β Patent 12,320,852 granted on 2025-06-03Passive carrier-based device delivery for slot-based high-volume semiconductor test system
#13 | 2023-10-05 β Patent 12,235,315 granted on 2025-02-25Test system support component exchange system and method
#14 | 2023-09-21 β Patent 12,203,979 granted on 2025-01-21Multi-input multi-zone thermal control for device testing
#15 | 2023-07-27 β Patent 11,835,549 granted on 2023-12-05Thermal array with gimbal features and enhanced thermal performance
#16 | 2023-07-20 β Patent 11,940,487 granted on 2024-03-26Thermal solution for massively parallel testing
#17 | 2023-06-22 β Patent 12,374,420 granted on 2025-07-29CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP STRUCTURES
#18 | 2023-05-11 β Patent 11,656,273 granted on 2023-05-23High current device testing apparatus and systems
#19 | 2023-04-27 β Patent 11,846,669 granted on 2023-12-19Active thermal interposer device
#20 | 2023-03-30 β Patent 11,852,678 granted on 2023-12-26Multi-input multi-zone thermal control for device testing
#21 | 2023-03-16 β Patent 12,235,314 granted on 2025-02-25Parallel test cell with self actuated sockets
#22 | 2023-03-02 β Patent 11,742,055 granted on 2023-08-29Carrier based high volume system level testing of devices with pop structures
#23 | 2022-10-13 β Patent 11,774,492 granted on 2023-10-03Test system including active thermal interposer device
#24 | 2022-09-08 β Patent 11,587,640 granted on 2023-02-21Carrier based high volume system level testing of devices with pop structures
#25 | 2022-09-01 β Patent 11,674,999 granted on 2023-06-13Wafer scale active thermal interposer for device testing
#26 | 2022-08-25 β Patent 11,754,620 granted on 2023-09-12DUT placement and handling for active thermal interposer device
#27 | 2022-06-30 β Patent 11,573,262 granted on 2023-02-07Multi-input multi-zone thermal control for device testing
#28 | 2022-06-16 β Patent 11,567,119 granted on 2023-01-31Testing system including active thermal interposer device
#29 | 2022-06-09 β Patent 11,609,266 granted on 2023-03-21Active thermal interposer device
#30 | 2022-05-19 β Patent 12,320,841 granted on 2025-06-03Wafer scale active thermal interposer for device testing
#31 | 2022-05-05 β Patent 11,808,812 granted on 2023-11-07Passive carrier-based device delivery for slot-based high-volume semiconductor test system
#32 | 2022-05-05 β Patent 11,821,913 granted on 2023-11-21Shielded socket and carrier for high-volume test of semiconductor devices
#33 | 2022-04-07 β Patent 11,549,981 granted on 2023-01-10Thermal solution for massively parallel testing
#34 | 2021-12-23 β Patent 11,493,551 granted on 2022-11-08Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
#35 | 2018-01-25 β Patent 10,656,200 granted on 2020-05-19High volume system level testing of devices with pop structures
Also check out ADVANTEST TEST SOLUTIONS, INC.'s (San Jose, United States) applicant profile with 43 patent applications submitted.
355019 β