Assignee profile:

Advantest Test Solutions, Inc.

City:

San Jose, California

Country:

United States

Published Applications:

35

Last publication date:

2025-08-28

Patent Grants:

35

Last grant date:

2026-01-27

Top Inventors for applications by Advantest Test Solutions, Inc.

These are the the leading inventors for applications assigned to Advantest Test Solutions, Inc.:

Recent patent applications by Advantest Test Solutions, Inc.

Advantest Test Solutions, Inc. based in San Jose, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2025-08-28 βœ… Patent 12,535,522 granted on 2026-01-27
US20250271497A1
Physics

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

#2 | 2025-08-28 βœ… Patent 12,540,968 granted on 2026-02-03
US20250271496A1
Physics

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

#3 | 2025-08-21 βœ… Patent 12,540,967 granted on 2026-02-03
US20250264525A1
Physics

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

#4 | 2025-04-24 βœ… Patent 12,613,273 granted on 2026-04-28
US20250130276A1
Physics

WAFER SCALE ACTIVE THERMAL INTERPOSER FOR DEVICE TESTING

#5 | 2024-06-06 βœ… Patent 12,618,896 granted on 2026-05-05
US20240183898A1
Physics

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

#6 | 2024-04-25 βœ… Patent 12,345,756 granted on 2025-07-01
US20240133943A1
Physics

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PARALLEL SOCKET ACTUATION

#7 | 2024-02-01 βœ… Patent 12,210,056 granted on 2025-01-28
US20240036104A1
Physics

Thermal array with gimbal features and enhanced thermal performance

#8 | 2024-01-25 βœ… Patent 12,203,958 granted on 2025-01-21
US20240027492A1
Physics

Shielded socket and carrier for high-volume test of semiconductor devices

#9 | 2024-01-04 βœ… Patent 12,216,154 granted on 2025-02-04
US20240003967A1
Physics

Active thermal interposer device

#10 | 2023-12-07 βœ… Patent 12,174,248 granted on 2024-12-24
US20230393190A1
Physics

Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system

#11 | 2023-12-07 βœ… Patent 12,411,167 granted on 2025-09-09
US20230393188A1
Physics

TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THERMAL ARRAY

#12 | 2023-10-05 βœ… Patent 12,320,852 granted on 2025-06-03
US20230314512A1
Physics

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

#13 | 2023-10-05 βœ… Patent 12,235,315 granted on 2025-02-25
US20230314499A1
Physics

Test system support component exchange system and method

#14 | 2023-09-21 βœ… Patent 12,203,979 granted on 2025-01-21
US20230296667A1
Physics

Multi-input multi-zone thermal control for device testing

#15 | 2023-07-27 βœ… Patent 11,835,549 granted on 2023-12-05
US20230236241A1
Physics

Thermal array with gimbal features and enhanced thermal performance

#16 | 2023-07-20 βœ… Patent 11,940,487 granted on 2024-03-26
US20230228812A1
Physics

Thermal solution for massively parallel testing

#17 | 2023-06-22 βœ… Patent 12,374,420 granted on 2025-07-29
US20230197185A1
Physics

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP STRUCTURES

#18 | 2023-05-11 βœ… Patent 11,656,273 granted on 2023-05-23
US20230143240A1
Physics

High current device testing apparatus and systems

#19 | 2023-04-27 βœ… Patent 11,846,669 granted on 2023-12-19
US20230129112A1
Physics

Active thermal interposer device

#20 | 2023-03-30 βœ… Patent 11,852,678 granted on 2023-12-26
US20230103082A1
Physics

Multi-input multi-zone thermal control for device testing

#21 | 2023-03-16 βœ… Patent 12,235,314 granted on 2025-02-25
US20230083634A1
Physics

Parallel test cell with self actuated sockets

#22 | 2023-03-02 βœ… Patent 11,742,055 granted on 2023-08-29
US20230062440A1
Physics

Carrier based high volume system level testing of devices with pop structures

#23 | 2022-10-13 βœ… Patent 11,774,492 granted on 2023-10-03
US20220326299A1
Physics

Test system including active thermal interposer device

#24 | 2022-09-08 βœ… Patent 11,587,640 granted on 2023-02-21
US20220284982A1
Physics

Carrier based high volume system level testing of devices with pop structures

#25 | 2022-09-01 βœ… Patent 11,674,999 granted on 2023-06-13
US20220276301A1
Physics

Wafer scale active thermal interposer for device testing

#26 | 2022-08-25 βœ… Patent 11,754,620 granted on 2023-09-12
US20220268831A1
Physics

DUT placement and handling for active thermal interposer device

#27 | 2022-06-30 βœ… Patent 11,573,262 granted on 2023-02-07
US20220206061A1
Physics

Multi-input multi-zone thermal control for device testing

#28 | 2022-06-16 βœ… Patent 11,567,119 granted on 2023-01-31
US20220187361A1
Physics

Testing system including active thermal interposer device

#29 | 2022-06-09 βœ… Patent 11,609,266 granted on 2023-03-21
US20220178991A1
Physics

Active thermal interposer device

#30 | 2022-05-19 βœ… Patent 12,320,841 granted on 2025-06-03
US20220155364A1
Physics

Wafer scale active thermal interposer for device testing

#31 | 2022-05-05 βœ… Patent 11,808,812 granted on 2023-11-07
US20220137129A1
Physics

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

#32 | 2022-05-05 βœ… Patent 11,821,913 granted on 2023-11-21
US20220137092A1
Physics

Shielded socket and carrier for high-volume test of semiconductor devices

#33 | 2022-04-07 βœ… Patent 11,549,981 granted on 2023-01-10
US20220107360A1
Physics

Thermal solution for massively parallel testing

#34 | 2021-12-23 βœ… Patent 11,493,551 granted on 2022-11-08
US20210396801A1
Physics

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

#35 | 2018-01-25 βœ… Patent 10,656,200 granted on 2020-05-19
US20180024188A1
Physics

High volume system level testing of devices with pop structures

Also check out ADVANTEST TEST SOLUTIONS, INC.'s (San Jose, United States) applicant profile with 43 patent applications submitted.

AssigneeID:

355019 ⎘