Osaka
Japan
55
2025-12-11
51
2026-03-10
These are the the leading inventors for applications assigned to Otsuka Electronics Co., Ltd.:
Otsuka Electronics Co., Ltd. based in Osaka, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
OPTICAL MEASUREMENT SYSTEM AND NON-TRANSITORY STORAGE MEDIUM
#2 | 2025-10-30OPTICAL MEASUREMENT SYSTEM AND OPTICAL MEASUREMENT METHOD
#3 | 2024-02-08 ✅ Patent 12,572,112 granted on 2026-03-10OPTICAL MEASUREMENT SYSTEM AND OPTICAL MEASUREMENT METHOD
#4 | 2023-10-19 ✅ Patent 12,411,108 granted on 2025-09-09ZETA-POTENTIAL MEASUREMENT JIG SET
#5 | 2022-10-06 ✅ Patent 11,892,281 granted on 2024-02-06Optical measurement system, optical measurement method, and non-transitory storage medium having measurement program stored thereon
#6 | 2022-07-21MEASUREMENT DEVICE AND MEASUREMENT METHOD
#7 | 2022-05-19 ✅ Patent 12,174,103 granted on 2024-12-24Light scattering measuring apparatus and measuring jig
#8 | 2021-10-21 ✅ Patent 11,953,465 granted on 2024-04-09Zeta-potential measurement jig
#9 | 2021-10-07 ✅ Patent 11,598,713 granted on 2023-03-07Particle size measurement method, particle size measurement apparatus, and particle size measurement program
#10 | 2021-07-22 ✅ Patent 12,111,146 granted on 2024-10-08Optical measurement apparatus and optical measurement method
#11 | 2021-05-13 ✅ Patent 11,293,750 granted on 2022-04-05Film thickness measuring apparatus and film thickness measuring method
#12 | 2021-04-29 ✅ Patent 11,215,443 granted on 2022-01-04Optical measurement apparatus and optical measurement method
#13 | 2020-09-24 ✅ Patent 10,996,106 granted on 2021-05-04Luminous body measurement apparatus and luminous body measurement method comprising a control unit to pivot a first and a second arm to hold an image pickup device in plural postures
#14 | 2019-11-21 ✅ Patent 10,480,997 granted on 2019-11-19Optical measurement apparatus and optical measurement method
#15 | 2019-10-31 ✅ Patent 10,795,067 granted on 2020-10-06Confocal optical system-based measurement apparatus and method for manufacturing confocal optical system-based measurement apparatus
#16 | 2019-06-13MEASUREMENT APPARATUS AND SAMPLE HOLDER USED IN THE SAME
#17 | 2019-06-06 ✅ Patent 10,422,695 granted on 2019-09-24Optical characteristic measurement system and calibration method for optical characteristic measurement system
#18 | 2019-06-06 ✅ Patent 10,422,694 granted on 2019-09-24Optical characteristic measurement system and calibration method for optical characteristic measurement system
#19 | 2019-05-09 ✅ Patent 10,733,750 granted on 2020-08-04Optical characteristics measuring method and optical characteristics measuring system
#20 | 2019-01-10 ✅ Patent 10,788,412 granted on 2020-09-29Optical measurement apparatus, and optical measurement method
#21 | 2018-12-06 ✅ Patent 10,309,767 granted on 2019-06-04Optical measurement apparatus and optical measurement method
#22 | 2018-12-06 ✅ Patent 10,288,412 granted on 2019-05-14Optical measurement apparatus and optical measurement method
#23 | 2018-08-09 ✅ Patent 10,481,001 granted on 2019-11-19Optical spectrum measuring apparatus and optical spectrum measuring method
#24 | 2018-06-21 ✅ Patent 10,168,142 granted on 2019-01-01Optical characteristic measuring apparatus and optical characteristic measuring method
#25 | 2018-03-15 ✅ Patent 10,429,238 granted on 2019-10-01Optical measurement method and optical measurement apparatus
#26 | 2018-03-01 ✅ Patent 10,330,530 granted on 2019-06-25Reference light source device used for calibration of spectral luminance meter and calibration method using same
#27 | 2017-06-29 ✅ Patent 10,120,177 granted on 2018-11-06Optical characteristic measurement apparatus and optical system
#28 | 2017-04-13 ✅ Patent 9,921,149 granted on 2018-03-20Optical measurement apparatus and optical measurement method
#29 | 2017-03-02 ✅ Patent 9,891,105 granted on 2018-02-13Microspectroscope including optical fibers and spectroscope
#30 | 2017-01-12 ✅ Patent 10,222,261 granted on 2019-03-05Optical characteristic measurement system and calibration method for optical characteristic measurement system
#31 | 2016-08-18 ✅ Patent 10,127,472 granted on 2018-11-13Light distribution characteristic measurement apparatus and light distribution characteristic measurement method
#32 | 2015-09-17 ✅ Patent 9,500,520 granted on 2016-11-22Optical measurement apparatus
#33 | 2015-08-27 ✅ Patent 9,746,374 granted on 2017-08-29Spectrophotometer and spectrophotometric measurement method
#34 | 2015-06-18 ✅ Patent 9,488,568 granted on 2016-11-08Polarization analysis apparatus
#35 | 2014-01-23 ✅ Patent 8,970,835 granted on 2015-03-03Optical characteristic measuring apparatus
#36 | 2013-10-10 ✅ Patent 8,896,823 granted on 2014-11-25Light distribution characteristic measurement apparatus and light distribution characteristic measurement method
#37 | 2013-08-22 ✅ Patent 9,127,832 granted on 2015-09-08Light source support apparatus and optical radiation characteristic measurement apparatus using the same
#38 | 2012-03-29 ✅ Patent 8,169,608 granted on 2012-05-01Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurement
#39 | 2011-06-30 ✅ Patent 8,119,996 granted on 2012-02-21Quantum efficiency measurement apparatus and quantum efficiency measurement method
#40 | 2010-04-15 ✅ Patent 8,169,607 granted on 2012-05-01Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurement
#41 | 2009-04-30 ✅ Patent 7,663,744 granted on 2010-02-16Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the same
#42 | 2008-11-20 ✅ Patent 7,528,967 granted on 2009-05-05Optical characteristic measuring apparatus and measuring method using light reflected from object to be measured
#43 | 2008-11-11 ✅ Patent 7,449,097 granted on 2008-11-11Electrophoretic mobility measuring apparatus
#44 | 2008-09-25 ✅ Patent 7,847,935 granted on 2010-12-07Method and apparatus for gas concentration quantitative analysis
#45 | 2008-03-06 ✅ Patent 7,808,625 granted on 2010-10-05Aperture variable inspection optical system and color filter evaluation process
#46 | 2007-09-13 ✅ Patent 8,164,632 granted on 2012-04-24Method and apparatus for measuring moving picture response curve
#47 | 2007-06-12 ✅ Patent 7,230,713 granted on 2007-06-12Method for measuring gap of liquid crystal cell
#48 | 2007-02-01 ✅ Patent 7,483,550 granted on 2009-01-27Method and system for evaluating moving image quality of displays
#49 | 2006-01-19 ✅ Patent 7,176,464 granted on 2007-02-13Method of and apparatus for determining the amount of impurity in gas
#50 | 2006-01-12 ✅ Patent 7,847,819 granted on 2010-12-07Measurement system for evaluating moving image quality of displays
#51 | 2005-12-22 ✅ Patent 7,251,035 granted on 2007-07-31Optical cell measurement apparatus
#52 | 2005-11-24 ✅ Patent 7,394,483 granted on 2008-07-01Display evaluation method and apparatus
#53 | 2005-07-26 ✅ Patent 6,922,247 granted on 2005-07-26Automatic optical measurement method
#54 | 2005-06-09 ✅ Patent 7,236,250 granted on 2007-06-26Dynamic light scattering measurement apparatus using phase modulation interference method
#55 | 2005-04-26 ✅ Patent 6,885,448 granted on 2005-04-26Photon correlator
Also check out Otsuka Electronics Co., Ltd.'s (Osaka, Japan) applicant profile with 31 patent applications submitted.
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