Assignee profile:

SEMILAB Semiconductor Physics Laboratory Co., Ltd.

City:

Budapest

Country:

Hungary

Published Applications:

10

Last publication date:

2024-10-17

Patent Grants:

10

Last grant date:

2024-11-26

Top Inventors for applications by SEMILAB Semiconductor Physics Laboratory Co., Ltd.

These are the the leading inventors for applications assigned to SEMILAB Semiconductor Physics Laboratory Co., Ltd.:

Recent patent applications by SEMILAB Semiconductor Physics Laboratory Co., Ltd.

SEMILAB Semiconductor Physics Laboratory Co., Ltd. based in Budapest, HU has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-10-17 โœ… Patent 12,154,833 granted on 2024-11-26
US20240347399A1
Electricity

Semiconductor doping characterization method using photoneutralization time constant of corona surface charge

#2 | 2024-07-02 โœ… Patent 12,027,430 granted on 2024-07-02
US18123211
Electricity

Semiconductor doping characterization method using photoneutralization time constant of corona surface charge

#3 | 2022-12-01 โœ… Patent 11,561,254 granted on 2023-01-24
US20220381816A1
Physics

Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substrates

#4 | 2020-09-24 โœ… Patent 10,883,941 granted on 2021-01-05
US20200300767A9
Physics

Micro photoluminescence imaging

#5 | 2019-12-26 โœ… Patent 10,883,941 granted on 2021-01-05
US20190391079A1
Physics

Micro Photoluminescence Imaging

#6 | 2018-11-01 โœ… Patent 10,209,190 granted on 2019-02-19
US20180313761A1
Physics

Micro photoluminescence imaging with optical filtering

#7 | 2016-12-08 โœ… Patent 10,969,370 granted on 2021-04-06
US20160356750A1
Physics

Measuring semiconductor doping using constant surface potential corona charging

#8 | 2016-11-10 โœ… Patent 10,012,593 granted on 2018-07-03
US20160328840A1
Physics

Micro photoluminescence imaging

#9 | 2016-11-10 โœ… Patent 10,018,565 granted on 2018-07-10
US20160327485A1
Physics

Micro photoluminescence imaging with optical filtering

#10 | 2016-09-01 โœ… Patent 10,763,179 granted on 2020-09-01
US20160252565A1
Physics

Non-contact method to monitor and quantify effective work function of metals

AssigneeID:

356083 โŽ˜