NEUF Inc.

City:

Suncheon-si

Country:

South Korea

Published Applications:

Last publication date:

2024-03-28

Patent Grants:

Last grant date:

2024-12-31

Top Inventors for applications by NEUF Inc.

These are the the leading inventors for applications assigned to NEUF Inc.:

Myoung Chan NA 3 Yeosu-si, South Korea

Recent patent applications by NEUF Inc.

NEUF Inc. based in Suncheon-si, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-03-28 ✅ Patent 12,181,426 granted on 2024-12-31

US20240102949A1

Physics

System and method for inspecting defects of structure by using X-ray

#2 | 2023-07-06 ✅ Patent 11,821,854 granted on 2023-11-21

US20230213461A1

Physics

System and method for inspecting defects of structure by using X-ray

#3 | 2023-03-02 ✅ Patent 11,585,768 granted on 2023-02-21

US20230066283A1

Physics

System and method for inspecting defects of structure by using x-ray

Also check out NEUF Inc.'s (Suncheon-si, South Korea) applicant profile with 3 patent applications submitted.

AssigneeID:

358303 ⎘