Assignee profile:

ABBERIOR INSTRUMENTS GMBH

City:

Goettingen

Country:

Germany

Published Applications:

20

Last publication date:

2024-07-11

Patent Grants:

20

Last grant date:

2026-05-19

Top Inventors for applications by ABBERIOR INSTRUMENTS GMBH

These are the the leading inventors for applications assigned to ABBERIOR INSTRUMENTS GMBH:

Recent patent applications by ABBERIOR INSTRUMENTS GMBH

ABBERIOR INSTRUMENTS GMBH based in Goettingen, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-07-11 βœ… Patent 12,631,863 granted on 2026-05-19
US20240231066A9
Physics

LUMINESCENCE MICROSCOPE FOR IMAGING A SAMPLE OR FOR LOCALIZING OR TRACKING EMITTERS IN A SAMPLE

#2 | 2024-07-04 βœ… Patent 12,181,413 granted on 2024-12-31
US20240219304A1
Physics

Method, computer program, and apparatus for adapting an estimator for use in a microscope

#3 | 2024-03-14 βœ… Patent 12,055,728 granted on 2024-08-06
US20240085680A1
Physics

Method and light microscope for a high-resolution examination of a sample

#4 | 2024-02-08 βœ… Patent 12,644,838 granted on 2026-06-02
US20240046595A1
Physics

METHOD, DEVICE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR LOCALIZING INDIVIDUAL EMITTERS IN A SAMPLE

#5 | 2024-02-08 βœ… Patent 12,560,791 granted on 2026-02-24
US20240045190A1
Physics

METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A SAMPLE

#6 | 2022-04-14 βœ… Patent 11,493,744 granted on 2022-11-08
US20220113524A1
Physics

Methods and apparatuses for checking the confocality of a scanning and descanning microscope assembly

#7 | 2022-02-24 βœ… Patent 12,352,943 granted on 2025-07-08
US20220057615A1
Physics

Method and device for illuminating a sample in a microscope in points

#8 | 2022-02-10 βœ… Patent 11,933,729 granted on 2024-03-19
US20220042914A1
Physics

Method, computer program, and apparatus for adapting an estimator for use in a microscope

#9 | 2022-01-13 βœ… Patent 12,111,455 granted on 2024-10-08
US20220011559A1
Physics

Detecting movements of a sample with respect to an objective

#10 | 2021-07-22 βœ… Patent 11,947,097 granted on 2024-04-02
US20210223528A1
Physics

Bandpass filter for light having variable lower and upper cut-off wavelengths

#11 | 2021-06-03 βœ… Patent 11,598,943 granted on 2023-03-07
US20210165199A1
Physics

Fluorescence microscope with stabilized adjustment and group of components and module for upgrading a fluorescence microscope

#12 | 2020-11-26 βœ… Patent 11,774,740 granted on 2023-10-03
US20200371339A1
Physics

Apparatus for monitoring a focal state of microscope

#13 | 2020-05-21 βœ… Patent 11,460,618 granted on 2022-10-04
US20200158935A1
Physics

Apparatus for selectively shaping phase fronts of a light beam, and use thereof

#14 | 2019-06-27 βœ… Patent 11,131,630 granted on 2021-09-28
US20190195800A1
Physics

Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system

#15 | 2019-02-21 βœ… Patent 10,488,342 granted on 2019-11-26
US20190056327A1
Physics

Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers

#16 | 2018-08-23 βœ… Patent 10,429,305 granted on 2019-10-01
US20180238804A1
Physics

Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers

#17 | 2017-08-31 βœ… Patent 10,795,140 granted on 2020-10-06
US20170248778A1
Physics

Method, device and laser scanning microscope for generating rasterized images

#18 | 2017-07-27 βœ… Patent 10,386,621 granted on 2019-08-20
US20170212340A1
Physics

Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope

#19 | 2017-05-04 βœ… Patent 9,632,297 granted on 2017-04-25
US20170123197A1
Physics

Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device

#20 | 2017-04-20 βœ… Patent 9,645,376 granted on 2017-05-09
US20170108684A1
Physics

Scanner head and device with scanner head

Also check out Abberior Instruments GmbH's (Goettingen, Germany) applicant profile with 24 patent applications submitted.

AssigneeID:

359455 ⎘