Control Screening, LLC

City:

Fairfield, New Jersey

Country:

United States

Published Applications:

Last publication date:

2010-02-11

Patent Grants:

Last grant date:

2011-06-21

Top Inventors for applications by Control Screening, LLC

These are the the leading inventors for applications assigned to Control Screening, LLC:

Scott D. Kravis 3 West Caldwell, NJ United States
Stewart Berry 2 Ottawa, Canada
Arthur W. Mario 2 Hopatcong, NJ United States
Dao Hinh Nguyen 2 Ottawa, Canada

Phuong Huynh 1 Ottawa, Canada
David L. Christensen 1 Kingston, Canada
Karl E. Geisel 1 Ringwood, NJ United States
Karl Voigtland 1 Hoboken, NJ United States

Chris Klymowsky 1 Ottawa, Canada
Guy Couture 1 Ottawa, Canada
Jan Prot Geblewicz 1 Toronto, Canada

Recent patent applications by Control Screening, LLC

Control Screening, LLC based in Fairfield, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2010-02-11 ✅ Patent 7,965,816 granted on 2011-06-21

US20100034353A1

Physics

Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes

#2 | 2006-06-29 ✅ Patent 7,092,485 granted on 2006-08-15

US20060140340A1

Physics

X-ray inspection system for detecting explosives and other contraband

#3 | 2006-01-10 ✅ Patent 6,984,524 granted on 2006-01-10

US10241407

Chemiluminescent detection of explosives, narcotics, and other chemical substances

#4 | 2005-09-20 ✅ Patent 6,946,300 granted on 2005-09-20

US10459889

Multi-modal detection of explosives, narcotics, and other chemical substances

#5 | 2005-04-28 ✅ Patent 7,072,440 granted on 2006-07-04

US20050089140A1

Physics

Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation

AssigneeID:

365402 ⎘