Japan
92
2013-02-07
92
2014-11-18
These are the the leading inventors for applications assigned to SII NanoTechnology Inc.:
SII NanoTechnology Inc. based in , JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
X-ray analyzer and X-ray analysis method
#2 | 2013-02-07 ✅ Patent 8,912,503 granted on 2014-12-16Transmission X-ray analyzer and transmission X-ray analysis method
#3 | 2012-09-27 ✅ Patent 8,615,811 granted on 2013-12-24Method of measuring vibration characteristics of cantilever
#4 | 2012-09-06 ✅ Patent 8,601,609 granted on 2013-12-03Friction force microscope
#5 | 2012-09-06 ✅ Patent 8,869,311 granted on 2014-10-21Displacement detection mechanism and scanning probe microscope using the same
#6 | 2012-01-05 ✅ Patent 8,269,188 granted on 2012-09-18Charged particle beam apparatus and sample processing method
#7 | 2011-09-29 ✅ Patent 8,822,945 granted on 2014-09-02Focused ion beam apparatus
#8 | 2011-09-22 ✅ Patent 8,274,049 granted on 2012-09-25Sample processing and observing method
#9 | 2011-09-22 ✅ Patent 8,642,958 granted on 2014-02-04Composite charged particle beam apparatus and sample processing and observing method
#10 | 2011-09-15 ✅ Patent 8,596,866 granted on 2013-12-03X-ray transmission inspection apparatus and x-ray transmission inspection method
#11 | 2011-08-25 ✅ Patent 8,705,698 granted on 2014-04-22X-ray analyzer and mapping method for an X-ray analysis
#12 | 2011-08-25 ✅ Patent 8,389,953 granted on 2013-03-05Focused ion beam apparatus
#13 | 2011-08-04 ✅ Patent 8,460,842 granted on 2013-06-11Defect repair apparatus and method for EUV mask using a hydrogen ion beam
#14 | 2011-08-04 ✅ Patent 8,664,598 granted on 2014-03-04Electron microscope and specimen analyzing method
#15 | 2011-03-03 ✅ Patent 8,359,180 granted on 2013-01-22Thermal analysis apparatus
#16 | 2011-02-17 ✅ Patent 8,608,373 granted on 2013-12-17Softening point measuring apparatus and thermal conductivity measuring apparatus
#17 | 2010-12-16 ✅ Patent 8,422,630 granted on 2013-04-16X-ray inspection device and X-ray inspection method
#18 | 2010-11-18 ✅ Patent 8,274,063 granted on 2012-09-25Composite focused ion beam device, process observation method using the same, and processing method
#19 | 2010-09-02 ✅ Patent 8,342,744 granted on 2013-01-01Differential scanning calorimeter
#20 | 2010-08-26 ✅ Patent 8,581,206 granted on 2013-11-12Focused ion beam system and sample processing method using the same
#21 | 2010-07-15 ✅ Patent 8,257,887 granted on 2012-09-04Photomask defect correcting method and device
#22 | 2010-07-15 ✅ Patent 8,269,194 granted on 2012-09-18Composite focused ion beam device, and processing observation method and processing method using the same
#23 | 2010-05-27 ✅ Patent 8,161,568 granted on 2012-04-17Self displacement sensing cantilever and scanning probe microscope
#24 | 2010-04-29 ✅ Patent 8,214,915 granted on 2012-07-03Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever
#25 | 2010-02-25 ✅ Patent 7,970,101 granted on 2011-06-28X-ray analyzer and X-ray analysis method
#26 | 2010-01-28 ✅ Patent 7,789,557 granted on 2010-09-07Superconducting radiometry apparatus
#27 | 2010-01-14 ✅ Patent 8,306,264 granted on 2012-11-06Section processing method and its apparatus
#28 | 2010-01-07 ✅ Patent 8,068,583 granted on 2011-11-29X-ray analysis apparatus and X-ray analysis method
#29 | 2009-10-01 ✅ Patent 8,124,932 granted on 2012-02-28Charged particle beam apparatus and method adjusting axis of aperture
#30 | 2009-09-10 ✅ Patent 7,927,769 granted on 2011-04-19Method for fabricating EUVL mask
#31 | 2009-08-27 ✅ Patent 8,513,627 granted on 2013-08-20Charged particle beam apparatus
#32 | 2009-08-20 ✅ Patent 8,111,079 granted on 2012-02-07Conductivity measuring apparatus and conductivity measuring method
#33 | 2009-08-20 ✅ Patent 8,058,780 granted on 2011-11-15Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those
#34 | 2009-08-20 ✅ Patent 7,973,280 granted on 2011-07-05Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same
#35 | 2009-05-07 ✅ Patent 8,198,603 granted on 2012-06-12Sample preparing device and sample posture shifting method
#36 | 2008-12-11 ✅ Patent 7,750,318 granted on 2010-07-06Working method by focused ion beam and focused ion beam working apparatus
#37 | 2008-02-05 ✅ Patent 7,326,445 granted on 2008-02-05Method and apparatus for manufacturing ultra fine three-dimensional structure
#38 | 2008-01-31 ✅ Patent 7,748,894 granted on 2010-07-06Thermal analysis equipment
#39 | 2008-01-31 ✅ Patent 7,427,744 granted on 2008-09-23Piezoelectric actuator and scanning probe microscope using the same
#40 | 2007-12-20 ✅ Patent 7,589,323 granted on 2009-09-15Superconducting X-ray detector and X-ray analysis apparatus using the same
#41 | 2007-12-20 ✅ Patent 7,997,124 granted on 2011-08-16Scanning probe microscope
#42 | 2007-10-16 ✅ Patent 7,282,157 granted on 2007-10-16Method of manufacturing light-propagating probe for near-field microscope
#43 | 2007-09-11 ✅ Patent 7,267,731 granted on 2007-09-11Method and system for fabricating three-dimensional microstructure
#44 | 2007-09-06 ✅ Patent 7,511,289 granted on 2009-03-31Working method utilizing irradiation of charged particle beam onto sample through passage in gas blowing nozzle
#45 | 2007-08-30 ✅ Patent 7,500,779 granted on 2009-03-10Thermal analysis apparatus
#46 | 2007-08-14 ✅ Patent 7,257,785 granted on 2007-08-14Method and apparatus of evaluating layer matching deviation based on CAD information
#47 | 2007-08-02 ✅ Patent 7,550,723 granted on 2009-06-23Atom probe apparatus and method for working sample preliminary for the same
#48 | 2007-05-10 ✅ Patent 7,605,368 granted on 2009-10-20Vibration-type cantilever holder and scanning probe microscope
#49 | 2007-03-06 ✅ Patent 7,187,166 granted on 2007-03-06Electrical property evaluation apparatus
#50 | 2007-03-01 ✅ Patent 7,442,942 granted on 2008-10-28Charged particle beam apparatus
#51 | 2007-02-22 ✅ Patent 7,518,125 granted on 2009-04-14Processing apparatus using focused charged particle beam
#52 | 2007-02-06 ✅ Patent 7,172,839 granted on 2007-02-06Photomask correction method using composite charged particle beam, and device used in the correction method
#53 | 2006-10-12 ✅ Patent 7,289,597 granted on 2007-10-30Optical axis adjusting mechanism for X-ray lens, X-ray analytical instrument, and method of adjusting optical axis of X-ray lens
#54 | 2006-10-05 ✅ Patent 7,375,322 granted on 2008-05-20Cantilever holder and scanning probe microscope
#55 | 2006-10-05 ✅ Patent 7,442,925 granted on 2008-10-28Working method using scanning probe
#56 | 2006-09-28 ✅ Patent 7,923,267 granted on 2011-04-12Method of measuring length of measurement object article in micro-structure
#57 | 2006-09-21 ✅ Patent 7,404,313 granted on 2008-07-29Scanning probe microscope
#58 | 2006-09-05 ✅ Patent 7,103,209 granted on 2006-09-05Method for extracting objective image
#59 | 2006-08-31 ✅ Patent 7,423,266 granted on 2008-09-09Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus
#60 | 2006-08-24 ✅ Patent 7,345,289 granted on 2008-03-18Sample support prepared by semiconductor silicon process technique
#61 | 2006-08-24 ✅ Patent 7,736,893 granted on 2010-06-15Nanobio device of imitative anatomy structure
#62 | 2006-07-27 ✅ Patent 7,276,691 granted on 2007-10-02Ion beam device and ion beam processing method
#63 | 2006-07-20 ✅ Patent 7,700,367 granted on 2010-04-20Method of making lamina specimen
#64 | 2006-04-20 ✅ Patent 7,441,445 granted on 2008-10-28Surface information measuring apparatus and surface information measuring method
#65 | 2006-03-23 ✅ Patent 7,507,957 granted on 2009-03-24Probe microscope system suitable for observing sample of long body
#66 | 2006-03-02 ✅ Patent 7,170,054 granted on 2007-01-30Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder
#67 | 2006-03-02 ✅ Patent 7,511,269 granted on 2009-03-31Method of approaching probe and apparatus for realizing the same
#68 | 2006-03-02 ✅ Patent 7,241,987 granted on 2007-07-10Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
#69 | 2006-02-02 ✅ Patent 7,232,995 granted on 2007-06-19Method of removing particle of photomask using atomic force microscope
#70 | 2006-01-19 ✅ Patent 7,337,656 granted on 2008-03-04Surface characteristic analysis apparatus
#71 | 2005-12-29 ✅ Patent 7,375,352 granted on 2008-05-20Photomask defect correction method employing a combined device of a focused electron beam device and an atomic force microscope
#72 | 2005-12-01 ✅ Patent 7,259,372 granted on 2007-08-21Processing method using probe of scanning probe microscope
#73 | 2005-12-01 ✅ Patent 7,278,299 granted on 2007-10-09Method of processing vertical cross-section using atomic force microscope
#74 | 2005-10-27 ✅ Patent 7,297,944 granted on 2007-11-20Ion beam device and ion beam processing method, and holder member
#75 | 2005-10-20 ✅ Patent 7,288,762 granted on 2007-10-30Fine-adjustment mechanism for scanning probe microscopy
#76 | 2005-10-13 ✅ Patent 7,107,826 granted on 2006-09-19Scanning probe device and processing method by scanning probe
#77 | 2005-09-29 ✅ Patent 7,251,987 granted on 2007-08-07Scanning probe microscope and measuring method by means of the same
#78 | 2005-09-22 ✅ Patent 7,285,792 granted on 2007-10-23Scratch repairing processing method and scanning probe microscope (SPM) used therefor
#79 | 2005-09-15 ✅ Patent 7,378,654 granted on 2008-05-27Processing probe
#80 | 2005-09-15 ✅ Patent 7,284,415 granted on 2007-10-23Scanning probe microscope
#81 | 2005-09-01 ✅ Patent 7,098,453 granted on 2006-08-29Scanning probe microscopy system and method of measurement by the same
#82 | 2005-08-25 ✅ Patent 7,173,261 granted on 2007-02-06Image noise removing method in FIB/SEM complex apparatus
#83 | 2005-08-25 ✅ Patent 7,154,106 granted on 2006-12-26Composite system of scanning electron microscope and focused ion beam
#84 | 2005-08-25 ✅ Patent 7,241,997 granted on 2007-07-10Superconducting X-ray detection apparatus and superconducting X-ray analyzer using the apparatus
#85 | 2005-08-04 ✅ Patent 7,235,783 granted on 2007-06-26Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working method
#86 | 2005-07-28 ✅ Patent 7,275,862 granted on 2007-10-02Differential scanning calorimeter with a second heater
#87 | 2005-06-23 ✅ Patent 7,494,575 granted on 2009-02-24Method for manufacturing a split probe
#88 | 2005-06-09 ✅ Patent 7,104,680 granted on 2006-09-12Thermal analyzer with gas mixing chamber
#89 | 2005-05-05 ✅ Patent 7,356,900 granted on 2008-04-15Manipulator needle portion repairing method
#90 | 2005-04-28 ✅ Patent 7,476,418 granted on 2009-01-13Method for fabricating nanometer-scale structure
#91 | 2005-03-10 ✅ Patent 7,234,861 granted on 2007-06-26Cooling mechanism, cooling apparatus having cooling mechanism, and thermal analyzer equipped with cooling apparatus
#92 | 2005-03-10 ✅ Patent 7,373,806 granted on 2008-05-20Scanning probe microscope and scanning method
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