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Assignee profile:

Advantest Corporation

City:

Country:

Japan

Published Applications:

Last publication date:

2016-01-21

Patent Grants:

Last grant date:

2017-02-28

Top Inventors for applications by Advantest Corporation

These are the the leading inventors for applications assigned to Advantest Corporation:

Takashi Sekino 3 Tokyo, Japan
Yasuo Furukawa 2 Tokyo, Japan
Katsuhiko Degawa 2 Tokyo, Japan
YASUHIDE KURAMOCHI 2 TOKYO, Japan

Masahiro Ishida 2 Tokyo, Japan
Akira Matsuzawa 2 Tokyo, Japan
Takahiro Yamaguchi 2 Tokyo, Japan
Takahiko Shimizu 2 Tokyo, Japan

TOSHIAKI AWAJI 2 TOKYO, Japan
Yasuhiro Maeda 1 Tokyo, Japan
Toshiyuki Okayasu 1 Tokyo, Japan
Masakazu ANDO 1 Tokyo, Japan

Satoshi Umezu 1 Tokyo, Japan
Tasuku Fujibe 1 Tokyo, Japan
Kazuhiro YAMAMOTO 1 Saitama, Japan
Masahiko TAKIKAWA 1 Tokyo, Japan

Kouji MIYAUCHI 1 Tokyo, Japan
Shinichi KOBAYASHI 1 Tokyo, Japan
Akihiko Ito 1 Tokyo, Japan
TOMOYUKI KANAUMI 1 TOKYO, Japan

Hiroyuki SATOH 1 Tokyo, Japan
Masayuki Kawabata 1 Tokyo, Japan
FUMIKAZU TAKAYANAGI 1 TOKYO, Japan
Hiromi Oshima 1 Tokyo, Japan

Mani SOMA 1 Seattle, WA United States
Toshiyuki OKAYASU 1 Saitama, Japan
Kazuhiro Yamamoto 1 Tokyo, Japan
Tomoaki UEDA 1 Kyoto, Japan

Masayuki NAKAMURA 1 Tokyo, Japan
Taku SATO 1 Tokyo, Japan
Advantest Corporation 1 Tokyo, Japan
Tsuyoshi YAMASHITA 1 Tokyo, Japan

Naoki Matsumoto 1 Tokyo, Japan
KOICHI TANAKA 1 TOKYO, Japan
Yuki Endo 1 Tokyo, Japan
Jun Miyajima 1 Tokyo, Japan

Masaru Tsuto 1 Tokyo, Japan
Kensuke Kamo 1 TOKYO, Japan
Shoji KOJIMA 1 Tokyo, Japan
Yoshiyuki HATA 1 Tokyo, Japan

Toshiyuki WATANABE 1 Tokyo, Japan
Norio Arakawa 1 Tokyo, Japan

Recent patent applications by Advantest Corporation

Advantest Corporation based in , JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2016-01-21 ✅ Patent 9,584,114 granted on 2017-02-28

US20160020765A1

Electricity

Semiconductor switch

#2 | 2015-01-29 ✅ Patent 9,329,215 granted on 2016-05-03

US20150028891A1

Physics

Impedance measurement apparatus

#3 | 2014-01-02 ✅ Patent 9,318,955 granted on 2016-04-19

US20140002036A1

Physics

Power supply apparatus with feedback ratio calculation unit

#4 | 2013-12-05 ✅ Patent 9,140,752 granted on 2015-09-22

US20130326299A1

Physics

Tester hardware

#5 | 2013-06-20 ✅ Patent 9,262,376 granted on 2016-02-16

US20130158905A1

Physics

Test apparatus and test method

#6 | 2012-08-30 ✅ Patent 9,188,633 granted on 2015-11-17

US20120218004A1

Physics

Power supply apparatus for test apparatus

#7 | 2010-02-04 ✅ Patent 7,859,444 granted on 2010-12-28

US20100026541A1

Electricity

D-A converter and D-A converting method

#8 | 2010-01-21 ✅ Patent 7,705,763 granted on 2010-04-27

US20100013693A1

Electricity

A-D convert apparatus

#9 | 2010-01-21 ✅ Patent 7,696,918 granted on 2010-04-13

US20100013690A1

Electricity

A-D convert apparatus

#10 | 2009-12-10 ✅ Patent 7,772,931 granted on 2010-08-10

US20090302908A1

Electricity

Oscillator and a tuning method of a loop bandwidth of a phase-locked-loop

#11 | 2009-08-20 ✅ Patent 7,778,785 granted on 2010-08-17

US20090207897A1

Electricity

Signal-to-noise ratio measurement for discrete waveform

#12 | 2009-08-20 ✅ Patent 7,952,359 granted on 2011-05-31

US20090206843A1

Physics

Test apparatus having bidirectional differential interface

#13 | 2009-05-28 ✅ Patent 7,876,120 granted on 2011-01-25

US20090134900A1

Physics

Test apparatus, pin electronics card, electrical device and switch

#14 | 2009-05-21 ✅ Patent 7,755,377 granted on 2010-07-13

US20090128182A1

Physics

Driver circuit and test apparatus

#15 | 2009-04-23 ✅ Patent 7,656,234 granted on 2010-02-02

US20090102521A1

Electricity

Circuit and oscillating apparatus

#16 | 2009-04-23 ✅ Patent 7,804,316 granted on 2010-09-28

US20090102497A1

Physics

Pusher, pusher unit and semiconductor testing apparatus

#17 | 2009-02-26 ✅ Patent 7,688,077 granted on 2010-03-30

US20090051366A1

Physics

Test system and daughter unit

#18 | 2009-02-19 ✅ Patent 7,756,654 granted on 2010-07-13

US20090048796A1

Physics

Test apparatus

#19 | 2009-01-01 ✅ Patent 7,840,858 granted on 2010-11-23

US20090006025A1

Physics

Detection apparatus and test apparatus

#20 | 2008-12-11 ✅ Patent 7,638,997 granted on 2009-12-29

US20080303509A1

Physics

Phase measurement apparatus

#21 | 2008-11-20 ✅ Patent 7,679,390 granted on 2010-03-16

US20080284448A1

Physics

Test apparatus and pin electronics card

#22 | 2008-09-25 ✅ Patent 7,757,134 granted on 2010-07-13

US20080235540A1

Physics

Test apparatus for testing a memory and electronic device housing a circuit

#23 | 2008-09-25 ✅ Patent 7,756,664 granted on 2010-07-13

US20080234961A1

Physics

Test apparatus and measurement circuit

#24 | 2006-04-25 ✅ Patent 7,035,959 granted on 2006-04-25

US9835824

Adapter for controlling a measuring device, a measuring device, a controller for a measuring device, a method for processing measurement and a recording medium

#25 | 2006-04-13 ✅ Patent 7,126,367 granted on 2006-10-24

US20060076970A1

Physics

Test apparatus, test method, electronic device, and electronic device manufacturing method

#26 | 2005-08-30 ✅ Patent 6,937,040 granted on 2005-08-30

US10776033

Probe module and a testing apparatus

AssigneeID:

367852 ⎘