Wintest Corporation

City:

Country:

Japan

Published Applications:

Last publication date:

2005-06-02

Patent Grants:

Last grant date:

2006-12-26

Top Inventors for applications by Wintest Corporation

These are the the leading inventors for applications assigned to Wintest Corporation:

Chisato Nagamine 1 Yokohama, Japan
Chisato Nagamine 1 Kanagawa, Japan
Makoto Ookuma 1 Yokohama, Japan
Masatoshi Itoh 1 Fujisawa, Japan

Makoto Ookuma 1 Yokohama-shi, Japan
Wataru Yamamoto 1 Yokohama-shi, Japan
Shouji Nara 1 Kanagawa, Japan
Shoji Nara 1 Yokohama, Japan

Shigekatsu Maruyama 1 Yokohama, Japan
Shigekatsu Maruyama 1 Kanagawa, Japan
Wataru Yamamoto 1 Yokohama, Japan
Shoji Nara 1 Yokohama-shi, Japan

Makoto Ookuma 1 Kanagawa, Japan
Masatoshi Itoh 1 Fujisawa-shi, Japan
Masatoshi Itoh 1 Kanagawa, Japan

Recent patent applications by Wintest Corporation

Wintest Corporation based in , JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2005-06-02 ✅ Patent 7,154,261 granted on 2006-12-26

US20050116728A1

Physics

Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device

#2 | 2005-05-10 ✅ Patent 6,891,532 granted on 2005-05-10

US10128031

Apparatus and method for inspecting picture elements of an active matrix type display board

#3 | 2005-05-05 ✅ Patent 7,199,602 granted on 2007-04-03

US20050093567A1

Physics

Inspection method and inspection device for display device and active matrix substrate used for display device

AssigneeID:

369208 ⎘