Hsinchu
Taiwan
29
2025-04-03
29
2025-12-16
These are the the leading inventors for applications assigned to Star Technologies, Inc.:
Star Technologies, Inc. based in Hsinchu, TW has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOF
#2 | 2024-05-23 ✅ Patent 12,355,430 granted on 2025-07-08SWITCH PROTECTION SYSTEM AND SWITCH PROTECTION METHOD
#3 | 2023-04-20 ✅ Patent 11,828,789 granted on 2023-11-28Test apparatus and jumper thereof
#4 | 2022-07-14 ✅ Patent 11,754,619 granted on 2023-09-12Probing apparatus with temperature-adjusting mechanism
#5 | 2022-06-30 ✅ Patent 11,953,518 granted on 2024-04-09Switching matrix system and operating method thereof for semiconductor characteristic measurement
#6 | 2021-12-28 ✅ Patent 11,209,462 granted on 2021-12-28Testing apparatus
#7 | 2021-10-07 ✅ Patent 11,217,649 granted on 2022-01-04Method of testing and analyzing display panel
#8 | 2021-04-22 ✅ Patent 11,054,465 granted on 2021-07-06Method of operating a probing apparatus
#9 | 2021-03-25 ✅ Patent 11,307,246 granted on 2022-04-19Probing apparatus and method of operating the same
#10 | 2020-10-15 ✅ Patent 10,890,614 granted on 2021-01-12Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test
#11 | 2020-07-16 ✅ Patent 11,047,880 granted on 2021-06-29Probing device
#12 | 2017-12-28 ✅ Patent 10,184,957 granted on 2019-01-22Testing apparatus, holding assembly, and probe card carrier
#13 | 2016-09-01 ✅ Patent 10,088,502 granted on 2018-10-02Test assembly and method of manufacturing the same
#14 | 2014-11-20 ✅ Patent 9,739,830 granted on 2017-08-22Test assembly
#15 | 2014-05-29 ✅ Patent 9,535,114 granted on 2017-01-03Testing device
#16 | 2013-09-26 ✅ Patent 9,329,205 granted on 2016-05-03High-precision semiconductor device probing apparatus and system thereof
#17 | 2013-04-04 ✅ Patent 9,885,746 granted on 2018-02-06Switching matrix and testing system for semiconductor characteristic measurement using the same
#18 | 2013-01-31 ✅ Patent 8,988,092 granted on 2015-03-24Probing apparatus for semiconductor devices
#19 | 2011-12-15 ✅ Patent 8,279,451 granted on 2012-10-02Probing apparatus with on-probe device-mapping function
#20 | 2011-11-17 ✅ Patent 8,692,570 granted on 2014-04-08Probe card for testing high-frequency signals
#21 | 2011-07-26 ✅ Patent 7,986,157 granted on 2011-07-26High speed probing apparatus for semiconductor devices and probe stage for the same
#22 | 2011-06-30 ✅ Patent 8,198,725 granted on 2012-06-12Heat sink and integrated circuit assembly using the same
#23 | 2011-03-17 ✅ Patent 8,389,926 granted on 2013-03-05Testing apparatus for light-emitting devices with a design for a removable sensing module
#24 | 2010-12-02 ✅ Patent 8,169,227 granted on 2012-05-01Probing apparatus with multiaxial stages for testing semiconductor devices
#25 | 2010-09-16 ✅ Patent 8,310,264 granted on 2012-11-13Method for configuring combinational switching matrix and testing system for semiconductor devices using the same
#26 | 2010-07-08 ✅ Patent 7,928,749 granted on 2011-04-19Vertical probe comprising slots and probe card for integrated circuit devices using the same
#27 | 2010-03-04 ✅ Patent 8,035,405 granted on 2011-10-11Semiconductor devices testing apparatus with temperature-adjusting design
#28 | 2010-03-04 ✅ Patent 7,791,363 granted on 2010-09-07Low temperature probing apparatus
#29 | 2010-03-04 ✅ Patent 8,188,758 granted on 2012-05-29Enclosed probe station
Also check out STAR TECHNOLOGIES, INC.'s (Hsinchu, Taiwan) applicant profile with 14 patent applications submitted.
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