Assignee profile:

PANalytical B.V.

City:

Almelo

Country:

Netherlands

Published Applications:

24

Last publication date:

2016-09-08

Patent Grants:

24

Last grant date:

2017-08-22

Top Inventors for applications by PANalytical B.V.

These are the the leading inventors for applications assigned to PANalytical B.V.:

Recent patent applications by PANalytical B.V.

PANalytical B.V. based in Almelo, NL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2016-09-08 ✅ Patent 9,739,730 granted on 2017-08-22
US20160258892A1
Physics

Quantitative X-ray analysis—multi optical path instrument

#2 | 2016-09-08 ✅ Patent 9,784,699 granted on 2017-10-10
US20160258890A1
Physics

Quantitative X-ray analysis—matrix thickness correction

#3 | 2016-09-08 ✅ Patent 9,851,313 granted on 2017-12-26
US20160258889A1
Physics

Quantitative X-ray analysis—ratio correction

#4 | 2015-08-20 ✅ Patent 9,547,094 granted on 2017-01-17
US20150234060A1
Physics

X-ray analysis apparatus

#5 | 2015-07-16 ✅ Patent 9,640,292 granted on 2017-05-02
US20150200030A1
Physics

X-ray apparatus

#6 | 2015-07-16 ✅ Patent 9,658,352 granted on 2017-05-23
US20150198727A1
Physics

Method of making a standard

#7 | 2015-01-01 ✅ Patent 9,506,880 granted on 2016-11-29
US20150003592A1
Physics

Diffraction imaging

#8 | 2014-05-29 ✅ Patent 9,239,305 granted on 2016-01-19
US20140146940A1
Physics

Sample holder

#9 | 2013-09-19 ✅ Patent 9,110,003 granted on 2015-08-18
US20130243159A1
Physics

Microdiffraction

#10 | 2012-07-12 ✅ Patent 8,437,451 granted on 2013-05-07
US20120177180A1
Physics

X-ray shutter arrangement

#11 | 2012-05-24 ✅ Patent 8,488,740 granted on 2013-07-16
US20120128128A1
Physics

Diffractometer

#12 | 2011-08-18 ✅ Patent 8,477,904 granted on 2013-07-02
US20110200164A1
Physics

X-ray diffraction and computed tomography

#13 | 2011-06-30 ✅ Patent 8,210,000 granted on 2012-07-03
US20110154858A1
Chemistry; metallurgy

Bead furnace

#14 | 2011-04-28 ✅ Patent 7,978,820 granted on 2011-07-12
US20110096898A1
Physics

X-ray diffraction and fluorescence

#15 | 2011-03-10 ✅ Patent 7,949,092 granted on 2011-05-24
US20110058648A1
Physics

Device and method for performing X-ray analysis

#16 | 2009-09-17 ✅ Patent 7,756,248 granted on 2010-07-13
US20090232276A1
Physics

X-ray detection in packaging

#17 | 2009-08-13 ✅ Patent 7,858,945 granted on 2010-12-28
US20090200478A1
Physics

Imaging detector

#18 | 2009-05-26 ✅ Patent 7,538,328 granted on 2009-05-26
US12041148
-

Imaging detector

#19 | 2008-12-18 ✅ Patent 7,720,192 granted on 2010-05-18
US20080310587A1
Physics

X-ray fluorescence apparatus

#20 | 2008-07-24 ✅ Patent 7,542,547 granted on 2009-06-02
US20080175352A1
Physics

X-ray diffraction equipment for X-ray scattering

#21 | 2007-07-24 ✅ Patent 7,247,854 granted on 2007-07-24
US10482606
-

Limiting device for electromagnetic radiation, notably in an analysis device

#22 | 2006-09-28 ✅ Patent 7,477,724 granted on 2009-01-13
US20060215818A1
Physics

X-ray instrument

#23 | 2006-09-14 ✅ Patent 7,516,031 granted on 2009-04-07
US20060206278A1
Physics

Apparatus and method for correcting for aberrations

#24 | 2005-09-08 ✅ Patent 7,116,754 granted on 2006-10-03
US20050195941A1
Chemistry; metallurgy

Diffractometer

Also check out PANalytical B.V.'s (Almelo, Netherlands) applicant profile with 9 patent applications submitted.

AssigneeID:

39346 ⎘