Santa Clara, California
United States
14
2011-09-13
14
2011-09-13
These are the the leading inventors for applications assigned to Gradient Design Automation, Inc.:
Gradient Design Automation, Inc. based in Santa Clara, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Transient thermal analysis
#2 | 2009-01-22 ✅ Patent 7,472,363 granted on 2008-12-30Semiconductor chip design having thermal awareness across multiple sub-system domains
#3 | 2009-01-22 ✅ Patent 8,286,111 granted on 2012-10-09Thermal simulation using adaptive 3D and hierarchical grid mechanisms
#4 | 2009-01-15 ✅ Patent 7,823,102 granted on 2010-10-26Thermally aware design modification
#5 | 2008-11-25 ✅ Patent 7,458,052 granted on 2008-11-25Method and apparatus for normalizing thermal gradients over semiconductor chip designs
#6 | 2008-10-02 ✅ Patent 8,082,137 granted on 2011-12-20Method and apparatus for thermal modeling and analysis of semiconductor chip designs
#7 | 2008-04-01 ✅ Patent 7,353,471 granted on 2008-04-01Method and apparatus for using full-chip thermal analysis of semiconductor chip designs to compute thermal conductance
#8 | 2008-03-13 ✅ Patent 7,383,520 granted on 2008-06-03Method and apparatus for optimizing thermal management system performance using full-chip thermal analysis of semiconductor chip designs
#9 | 2007-07-05 ✅ Patent 7,590,958 granted on 2009-09-15Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities
#10 | 2007-05-31 ✅ Patent 7,587,692 granted on 2009-09-08Method and apparatus for full-chip thermal analysis of semiconductor chip designs
#11 | 2006-05-04 ✅ Patent 7,194,711 granted on 2007-03-20Method and apparatus for full-chip thermal analysis of semiconductor chip designs
#12 | 2006-02-09 ✅ Patent 7,401,304 granted on 2008-07-15Method and apparatus for thermal modeling and analysis of semiconductor chip designs
#13 | 2005-07-28 ✅ Patent 7,203,920 granted on 2007-04-10Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities
#14 | 2005-07-28 ✅ Patent 7,191,413 granted on 2007-03-13Method and apparatus for thermal testing of semiconductor chip designs
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