Finland
7
2008-12-25
7
2010-02-09
These are the the leading inventors for applications assigned to Oxford Instruments Analytical Oy:
Oxford Instruments Analytical Oy based in , FI has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Gas tight radiation window, and a method for its manufacturing
#2 | 2008-10-30 ✅ Patent 7,727,796 granted on 2010-06-01Method for patterning detector crystal using Q-switched laser
#3 | 2008-04-24 ✅ Patent 7,443,959 granted on 2008-10-28Selective irradiation of small target area in X-ray fluorescent spectroscopy
#4 | 2007-11-22 ✅ Patent 7,409,037 granted on 2008-08-05X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
#5 | 2007-05-17 ✅ Patent 7,618,906 granted on 2009-11-17Window membrane for detector and analyser devices, and a method for manufacturing a window membrane
#6 | 2006-11-23 ✅ Patent 7,233,643 granted on 2007-06-19Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy
#7 | 2006-11-23 ✅ Patent 7,426,019 granted on 2008-09-16Method and arrangement for non-destructive composition analysis of delicate samples
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