Assignee profile:

Rapiscan Systems, Inc.

City:

Hawthorne, California

Country:

United States

Published Applications:

15

Last publication date:

2010-12-02

Patent Grants:

15

Last grant date:

2011-04-19

Top Inventors for applications by Rapiscan Systems, Inc.

These are the the leading inventors for applications assigned to Rapiscan Systems, Inc.:

Recent patent applications by Rapiscan Systems, Inc.

Rapiscan Systems, Inc. based in Hawthorne, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2010-12-02 ✅ Patent 7,929,663 granted on 2011-04-19
US20100303295A1
Physics

X-ray monitoring

#2 | 2010-08-05 ✅ Patent 8,085,897 granted on 2011-12-27
US20100195788A1
Physics

X-ray scanning system

#3 | 2010-01-14 ✅ Patent 8,094,784 granted on 2012-01-10
US20100008471A1
Electricity

X-ray sources

#4 | 2009-10-01 ✅ Patent 7,903,789 granted on 2011-03-08
US20090245470A1
Electricity

X-ray tube electron sources

#5 | 2009-03-05 ✅ Patent 8,135,110 granted on 2012-03-13
US20090060135A1
Physics

X-ray tomography inspection systems

#6 | 2009-01-08 ✅ Patent 7,724,868 granted on 2010-05-25
US20090010382A1
Physics

X-ray monitoring

#7 | 2008-12-11 ✅ Patent 7,876,879 granted on 2011-01-25
US20080304622A1
Physics

X-ray tomography inspection systems

#8 | 2008-10-30 ✅ Patent 7,505,563 granted on 2009-03-17
US20080267355A1
Electricity

X-ray sources

#9 | 2008-06-19 ✅ Patent 7,664,230 granted on 2010-02-16
US20080144774A1
Electricity

X-ray tubes

#10 | 2007-07-26 ✅ Patent 7,684,538 granted on 2010-03-23
US20070172024A1
Physics

X-ray scanning system

#11 | 2007-07-26 ✅ Patent 7,564,939 granted on 2009-07-21
US20070172023A1
Human necessities

Control means for heat load in X-ray scanning apparatus

#12 | 2007-03-08 ✅ Patent 7,512,215 granted on 2009-03-31
US20070053495A1
Electricity

X-ray tube electron sources

#13 | 2006-11-16 ✅ Patent 7,349,525 granted on 2008-03-25
US20060256924A1
Electricity

X-ray sources

#14 | 2006-09-28 ✅ Patent 7,257,189 granted on 2007-08-14
US20060215811A1
Physics

Method and system for certifying operators of x-ray inspection systems

#15 | 2006-09-14 ✅ Patent 7,440,543 granted on 2008-10-21
US20060203961A1
Physics

X-ray monitoring

AssigneeID:

398340 ⎘