Meterologic Instruments, Inc.

City:

Blackwood, New Jersey

Country:

United States

Published Applications:

Last publication date:

2007-08-16

Patent Grants:

Last grant date:

2009-06-16

Top Inventors for applications by Meterologic Instruments, Inc.

These are the the leading inventors for applications assigned to Meterologic Instruments, Inc.:

Dale Fisher 1 Voorhees, NJ United States
Michael Veksland 1 Marlton, NJ United States
Richard Hou 1 Donghuan Village, China
Daniel Hu 1 Suzhou, China

Ka Man Au 1 Philadelphia, PA United States
C. Harry Knowles 1 Moorestown, NJ United States
Anatoly Kotlarsky 1 Holland, PA United States
Timothy Good 1 Clementon, NJ United States

Mark Meagher 1 Woodbury, NJ United States
Mark C. Schmidt 1 Williamstown, NJ United States
Xiaoxun Zhu 1 Marlton, NJ United States

Recent patent applications by Meterologic Instruments, Inc.

Meterologic Instruments, Inc. based in Blackwood, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2007-08-16 ✅ Patent 7,546,951 granted on 2009-06-16

US20070187510A1

Physics

Digital image capture and processing system employing real-time analysis of image exposure quality and the reconfiguration of system control parameters based on the results of such exposure quality analysis

#2 | 2006-04-27 ✅ Patent 7,303,132 granted on 2007-12-04

US20060086794A1

Physics

X-radiation scanning system having an automatic object identification and attribute information acquisition and linking mechanism integrated therein

AssigneeID:

401154 ⎘