Japan
52
2026-04-30
52
2026-05-26
These are the the leading inventors for applications assigned to Horiba, Ltd.:
Horiba, Ltd. based in , JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
TESTING SYSTEM, TESTING METHOD, AND PROGRAM RECORDING MEDIUM FOR TESTING SYSTEM
#2 | 2024-05-02 ✅ Patent 12,542,415 granted on 2026-02-03SEMICONDUCTOR LASER DEVICE
#3 | 2024-02-01 ✅ Patent 12,553,802 granted on 2026-02-17BRAKE DUST MEASUREMENT DEVICE, BRAKE DUST MEASUREMENT METHOD, AND BRAKE DUST MEASUREMENT PROGRAM INSTRUCTIONS
#4 | 2024-02-01 ✅ Patent 12,612,060 granted on 2026-04-28ON-ROAD DRIVING TEST EVALUATION METHOD, VEHICLE TEST SYSTEM, AND COMPUTER READABLE STORAGE MEDIUM FOR AN ON-ROAD DRIVING TEST EVALUATION PROGRAM
#5 | 2024-01-25 ✅ Patent 12,640,538 granted on 2026-05-26SEMICONDUCTOR LASER ELEMENT, SEMICONDUCTOR LASER DEVICE, SEMICONDUCTOR LASER DEVICE MANUFACTURING METHOD, AND GAS ANALYSIS DEVICE
#6 | 2023-12-14 ✅ Patent 12,542,012 granted on 2026-02-03TEST SYSTEM, CONTROL DEVICE, TEST METHOD, AND TEST SYSTEM PROGRAM
#7 | 2023-11-16 ✅ Patent 12,480,882 granted on 2025-11-25EXHAUST GAS ANALYSIS DEVICE, EXHAUST GAS ANALYSIS METHOD, AND PROGRAM STORAGE MEDIUM FOR EXHAUST GAS ANALYSIS DEVICE
#8 | 2023-06-29 ✅ Patent 12,298,232 granted on 2025-05-13Analysis device, program for analysis device, and analysis method
#9 | 2023-06-29 ✅ Patent 12,517,019 granted on 2026-01-06DILUTION GAS MIXING UNIT AND EXHAUST GAS ANALYSIS SYSTEM
#10 | 2022-10-06 ✅ Patent 12,590,890 granted on 2026-03-31SAMPLE GAS ANALYSIS DEVICE, SAMPLE GAS ANALYSIS METHOD, AND PROGRAM FOR SAMPLE GAS ANALYSIS
#11 | 2022-07-28 ✅ Patent 12,111,255 granted on 2024-10-08Analysis device
#12 | 2022-07-21 ✅ Patent 12,553,873 granted on 2026-02-17EXHAUST GAS ANALYZING DEVICE, GAS SUPPLY METHOD, AND EXHAUST GAS SAMPLING DEVICE
#13 | 2022-01-20 ✅ Patent 11,993,249 granted on 2024-05-28Vehicle testing system and vehicle testing method
#14 | 2020-09-10 ✅ Patent 11,949,210 granted on 2024-04-02Semiconductor laser device and analysis apparatus
#15 | 2015-03-26 ✅ Patent 9,250,201 granted on 2016-02-02X-ray analyzer
#16 | 2014-12-25 ✅ Patent 9,243,989 granted on 2016-01-26Particle size distribution measuring apparatus
#17 | 2014-12-18 ✅ Patent 9,329,116 granted on 2016-05-03Particle size distribution measuring device
#18 | 2014-11-06 ✅ Patent 9,170,220 granted on 2015-10-27X-ray analyzer
#19 | 2014-05-15 ✅ Patent 8,964,175 granted on 2015-02-24Colorant identification method and colorant identification apparatus
#20 | 2014-05-08 ✅ Patent 8,859,985 granted on 2014-10-14Radiation detector, radiation detection apparatus, and X-ray analyzer
#21 | 2014-04-17 ✅ Patent 9,063,071 granted on 2015-06-23Multi-ion sensor
#22 | 2014-02-20 ✅ Patent 8,877,027 granted on 2014-11-04Liquid analyzer
#23 | 2014-01-23 ✅ Patent 8,816,288 granted on 2014-08-26Radiation detector
#24 | 2013-10-17 ✅ Patent 9,116,107 granted on 2015-08-25X-ray detection apparatus for X-ray flourescence analysis
#25 | 2013-10-17 ✅ Patent 9,116,106 granted on 2015-08-25X-ray detection apparatus for X-ray fluorescence analysis
#26 | 2013-08-22 ✅ Patent 9,243,892 granted on 2016-01-26Particle analytical device
#27 | 2013-08-22 ✅ Patent 8,531,663 granted on 2013-09-10Particle diameter distribution measurement device
#28 | 2013-08-08 ✅ Patent 9,222,920 granted on 2015-12-29Elemental analyzer
#29 | 2013-03-07 ✅ Patent 8,999,128 granted on 2015-04-07Reference electrode and ion concentration measurement device
#30 | 2013-01-10 ✅ Patent 8,669,534 granted on 2014-03-11Electrostatic lens for charged particle radiation
#31 | 2012-10-11 ✅ Patent 9,140,664 granted on 2015-09-22Liquid characteristic analyzing apparatus
#32 | 2012-10-04 ✅ Patent 8,877,026 granted on 2014-11-04Electrode assembly
#33 | 2012-09-06 ✅ Patent 8,965,724 granted on 2015-02-24Measuring device
#34 | 2012-09-06 ✅ Patent 9,001,057 granted on 2015-04-07Measurement device
#35 | 2012-09-06 ✅ Patent 9,360,450 granted on 2016-06-07Measuring device with error content question sentence and user-selectable choices
#36 | 2012-06-21 ✅ Patent 8,758,586 granted on 2014-06-24Reference electrode
#37 | 2012-03-01 ✅ Patent 9,034,164 granted on 2015-05-19Particle characterization cell and particle characterization instrument
#38 | 2011-09-01 ✅ Patent 9,297,736 granted on 2016-03-29Particle size distribution measuring device
#39 | 2011-07-28 ✅ Patent 8,625,093 granted on 2014-01-07Particle characterization device
#40 | 2011-05-05 ✅ Patent 8,582,717 granted on 2013-11-12Concentration measuring method and fluorescent X-ray spectrometer
#41 | 2011-02-24 ✅ Patent 8,305,574 granted on 2012-11-06Analyzer
#42 | 2011-02-10 ✅ Patent 8,825,448 granted on 2014-09-02Spectroscopic reflectometer
#43 | 2010-09-16 ✅ Patent 8,279,432 granted on 2012-10-02Particle inspection and removal apparatus and particle inspection and removal program
#44 | 2009-11-19 ✅ Patent 8,280,645 granted on 2012-10-02Method and apparatus of measuring particulate matters
#45 | 2009-04-16 ✅ Patent 7,772,678 granted on 2010-08-10Metallic compound thin film that contains high-k dielectric metal, nitrogen, and oxygen
#46 | 2009-04-09 ✅ Patent 7,724,369 granted on 2010-05-25Correlator
#47 | 2009-03-19 ✅ Patent 7,907,289 granted on 2011-03-15Substrate measuring stage
#48 | 2009-03-19 ✅ Patent 7,869,037 granted on 2011-01-11Particle size distribution measuring device
#49 | 2006-09-21 ✅ Patent 8,079,838 granted on 2011-12-20Pure particle generator
#50 | 2006-08-17 ✅ Patent 7,372,112 granted on 2008-05-13Semiconductor device, process for producing the same and process for producing metal compound thin film
#51 | 2006-07-06 ✅ Patent 7,419,920 granted on 2008-09-02Metal thin film and semiconductor comprising a metal thin film
#52 | 2005-06-02 ✅ Patent 7,482,234 granted on 2009-01-27Method of fabricating a metal oxynitride thin film that includes a first annealing of a metal oxide film in a nitrogen-containing atmosphere to form a metal oxynitride film and a second annealing of the metal oxynitride film in an oxidizing atmosphere
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