Taipei
Taiwan
28
2020-11-19
28
2021-07-20
These are the the leading inventors for applications assigned to Test Research, Inc.:
Test Research, Inc. based in Taipei, TW has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Test system and method of operating the same
#2 | 2018-09-27 ✅ Patent 10,841,561 granted on 2020-11-17Apparatus and method for three-dimensional inspection
#3 | 2018-09-27 ✅ Patent 10,438,340 granted on 2019-10-08Automatic optical inspection system and operating method thereof
#4 | 2017-07-20 ✅ Patent 10,139,454 granted on 2018-11-27Test device and alternating current power detection method of the same
#5 | 2017-07-06 ✅ Patent 10,156,606 granted on 2018-12-18Multi-chassis test device and test signal transmission apparatus of the same
#6 | 2017-06-29 ✅ Patent 10,600,174 granted on 2020-03-24Optical inspection apparatus
#7 | 2017-01-26 ✅ Patent 9,841,387 granted on 2017-12-12Inspection method and device
#8 | 2017-01-19 ✅ Patent 9,838,612 granted on 2017-12-05Inspecting device and method for inspecting inspection target
#9 | 2016-07-21 ✅ Patent 9,423,242 granted on 2016-08-23Board-warping measuring apparatus and board-warping measuring method thereof
#10 | 2016-06-16 ✅ Patent 9,485,491 granted on 2016-11-01Optical system
#11 | 2016-06-16 ✅ Patent 9,686,517 granted on 2017-06-20Optical system and image compensating method of optical apparatus
#12 | 2016-06-16 ✅ Patent 9,885,561 granted on 2018-02-06Optical inspection system
#13 | 2016-03-31 ✅ Patent 9,791,387 granted on 2017-10-17Inspection system and method for controlling the same
#14 | 2014-09-25 ✅ Patent 9,562,947 granted on 2017-02-07Testing apparatus for providing per pin level setting
#15 | 2014-09-04 ✅ Patent 9,140,755 granted on 2015-09-22Testing apparatus with backdriving protection function
#16 | 2014-07-17 ✅ Patent 9,015,541 granted on 2015-04-21Device and method for performing timing analysis
#17 | 2014-01-23 ✅ Patent 9,019,351 granted on 2015-04-28Three-dimensional image measuring apparatus
#18 | 2014-01-09 ✅ Patent 9,423,246 granted on 2016-08-23Three-dimensional measurement system
#19 | 2013-08-29 ✅ Patent 8,767,900 granted on 2014-07-01Signal transition detection circuit and method of the same
#20 | 2011-09-22 ✅ Patent 9,420,235 granted on 2016-08-16Measuring system for a 3D object
#21 | 2011-08-25 ✅ Patent 8,077,827 granted on 2011-12-13Method for thickness calibration and measuring thickness of material
#22 | 2011-06-30 ✅ Patent 8,324,908 granted on 2012-12-04Electrical connection defect detection device
#23 | 2011-06-30 ✅ Patent 8,350,575 granted on 2013-01-08Electrical connection defect detection system and method
#24 | 2010-04-15 ✅ Patent 8,179,143 granted on 2012-05-15Apparatus for testing printed circuit and method therefor
#25 | 2009-10-01 ✅ Patent 7,855,567 granted on 2010-12-21Electronic device testing system and method
#26 | 2009-04-02 ✅ Patent 7,702,982 granted on 2010-04-20Electronic device testing system and method
#27 | 2008-12-04 ✅ Patent 7,529,336 granted on 2009-05-05System and method for laminography inspection
#28 | 2008-09-11 ✅ Patent 7,612,568 granted on 2009-11-03Open-circuit testing system and method
Also check out Test Research, Inc.'s (Taipei, Taiwan) applicant profile with 19 patent applications submitted.
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