Scan Systems Corp.

City:

Houston, Texas

Country:

United States

Published Applications:

Last publication date:

2008-11-06

Patent Grants:

Last grant date:

2009-11-24

Top Inventors for applications by Scan Systems Corp.

These are the the leading inventors for applications assigned to Scan Systems Corp.:

Xiaowen Wu 1 Houston, TX United States
William T. Walters 1 LaMarque, TX United States

Recent patent applications by Scan Systems Corp.

Scan Systems Corp. based in Houston, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2008-11-06 ✅ Patent 7,622,917 granted on 2009-11-24

US20080272772A1

Physics

Methods and apparatus for inspecting materials

AssigneeID:

421085 ⎘