Kabushiki Kaisha Nihon Micronics

City:

Country:

Japan

Published Applications:

Last publication date:

2010-12-02

Patent Grants:

Last grant date:

2012-06-19

Top Inventors for applications by Kabushiki Kaisha Nihon Micronics

These are the the leading inventors for applications assigned to Kabushiki Kaisha Nihon Micronics:

Kenichi Washio 1 Yokohama, Japan
Umenori Sugiyama 1 Hirakawa-shi, Japan
Kenichi WASHIO 1 Tokyo, Japan
EICHI OSATO 1 TOKYO, Japan

Masato Ikeda 1 Tokyo, Japan
Takehiko HIRAI 1 Tokyo, Japan
Kenichi WASHIO 1 Yokohama-shi, Japan
Umenori Sugiyama 1 Hirakawa, Japan

Masashi Hasegawa 1 Tokyo, Japan
Katsuo Yasuta 1 Hirosaki-shi, Japan
Katsuo YASUTA 1 Tokyo, Japan
Toshikazu OSHIMA 1 Tokyo, Japan

Katsuo Yasuta 1 Hirosaki, Japan

Recent patent applications by Kabushiki Kaisha Nihon Micronics

Kabushiki Kaisha Nihon Micronics based in , JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2010-12-02 ✅ Patent 8,203,202 granted on 2012-06-19

US20100301476A1

Electricity

Stacked package and method for forming stacked package

#2 | 2010-11-18 ✅ Patent 8,278,965 granted on 2012-10-02

US20100289514A1

Physics

Inspection apparatus

#3 | 2010-05-13 ✅ Patent 7,946,855 granted on 2011-05-24

US20100120299A1

Electricity

Contact and electrical connecting apparatus

#4 | 2010-01-21 ✅ Patent 7,936,058 granted on 2011-05-03

US20100013072A1

Electricity

Stacked package and method for forming stacked package

#5 | 2008-09-18 ✅ Patent 7,719,300 granted on 2010-05-18

US20080224723A1

Physics

Method for testing a semiconductor wafer and apparatus thereof

AssigneeID:

426832 ⎘