Sick, Inc.

City:

Minneapolis, Minnesota

Country:

United States

Published Applications:

Last publication date:

2018-01-11

Patent Grants:

Last grant date:

2018-04-03

Top Inventors for applications by Sick, Inc.

These are the the leading inventors for applications assigned to Sick, Inc.:

John Dwinell 2 Wrentham, MA United States
Robert L. Stone 2 Perry Hall, MD United States
Mohammed T. Islam 2 Ellicott City, MD United States
Long Xiang Bian 2 Sharon, MA United States

George LIU 1 Dover, MA United States
Aaron ROTHMEYER 1 Minneapolis, MN United States
Patrick L. Mohney 1 Fort Mitchell, KY United States
Christian SHEPHERD 1 Minneapolis, MN United States

Steven T. Smith 1 Mason, OH United States
Alexander Shteinfeld 1 Newton, MA United States
Udrekh GAVALE 1 Natick, MA United States
Richard Lydon 1 Hanover, MA United States

Omid Athari 1 Cockeysville, MD United States
Don ALEXANDER 1 Minneapolis, MN United States
Monisha SHIVANNA 1 Minneapolis, MN United States
Dale HOEPNER 1 Minneapolis, MN United States

Recent patent applications by Sick, Inc.

Sick, Inc. based in Minneapolis, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2018-01-11 ✅ Patent 9,933,110 granted on 2018-04-03

US20180010733A1

Mechanical engineering

Toolless alignment and securing of sensor or other device

#2 | 2017-10-19 ✅ Patent 10,262,222 granted on 2019-04-16

US20170302905A1

Electricity

Method and system for measuring dimensions of a target object

#3 | 2017-02-16 ✅ Patent 9,630,557 granted on 2017-04-25

US20170043716A1

Performing operations; transporting

Open confined area object detection

#4 | 2012-12-13 ✅ Patent 8,780,358 granted on 2014-07-15

US20120314222A1

Performing operations; transporting

Inspection apparatus, system, and method

#5 | 2011-08-11 ✅ Patent 8,631,922 granted on 2014-01-21

US20110192703A1

Performing operations; transporting

System, apparatus, and method for object edge detection

#6 | 2008-10-09 ✅ Patent 8,132,728 granted on 2012-03-13

US20080245873A1

Physics

Parcel dimensioning measurement system and method

#7 | 2007-12-13 ✅ Patent 8,139,117 granted on 2012-03-20

US20070285537A1

Physics

Image quality analysis with test pattern

Also check out SICK, INC.'s (Minneapolis, United States) applicant profile with 2 patent applications submitted.

AssigneeID:

449756 ⎘