Remote Sensing Metrics, LLC

City:

Chicago, Illinois

Country:

United States

Published Applications:

Last publication date:

2017-03-16

Patent Grants:

Last grant date:

2018-11-13

Top Inventors for applications by Remote Sensing Metrics, LLC

These are the the leading inventors for applications assigned to Remote Sensing Metrics, LLC:

Thomas Peter Diamond 4 Chicago, IL United States
Alex H. Diamond 4 Buena Vista, CO United States

Recent patent applications by Remote Sensing Metrics, LLC

Remote Sensing Metrics, LLC based in Chicago, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2017-03-16 ✅ Patent 10,127,457 granted on 2018-11-13

US20170076158A1

Physics

System and methods for generating quality, verified, and synthesized information

#2 | 2016-06-16 ✅ Patent 10,248,700 granted on 2019-04-02

US20160171059A1

Physics

System and methods for efficient selection and use of content

#3 | 2014-12-11 ✅ Patent 9,965,528 granted on 2018-05-08

US20140365470A1

Physics

System and methods for generating quality, verified, synthesized, and coded information

#4 | 2014-09-18 ✅ Patent 9,542,627 granted on 2017-01-10

US20140270524A1

Physics

System and methods for generating quality, verified, and synthesized information

Also check out REMOTE SENSING METRICS, LLC's (Chicago, United States) applicant profile with 3 patent applications submitted.

AssigneeID:

517602 ⎘