DELMIC IP B.V.

City:

Delft

Country:

Netherlands

Published Applications:

Last publication date:

2023-02-09

Patent Grants:

Last grant date:

2025-09-16

Top Inventors for applications by DELMIC IP B.V.

These are the the leading inventors for applications assigned to DELMIC IP B.V.:

Andries Pieter Johan EFFTING 3 Delft, Netherlands
Sander Vincent DEN HOEDT 2 Delft, Netherlands
Jacob Pieter Hoogenboom 2 Delft, Netherlands
Lenard Maarten VOORTMAN 1 Delft, Netherlands

Nalan LIV HAMARAT 1 DELFT, Netherlands
Sander DEN HOEDT 1 Delft, Netherlands
Pieter Kruit 1 Delft, Netherlands

Recent patent applications by DELMIC IP B.V.

DELMIC IP B.V. based in Delft, NL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2023-02-09 ✅ Patent 12,417,894 granted on 2025-09-16

US20230045007A1

Electricity

METHOD AND MANIPULATION DEVICE FOR HANDLING SAMPLES

#2 | 2023-02-09 ✅ Patent 12,123,841 granted on 2024-10-22

US20230038465A1

Physics

Apparatus and method for projecting an array of multiple charged particle beamlets on a sample

#3 | 2023-01-19 ✅ Patent 12,306,121 granted on 2025-05-20

US20230020967A1

Physics

Method and apparatus for inspecting a sample by means of multiple charged particle beamlets

#4 | 2022-07-28 ✅ Patent 12,387,905 granted on 2025-08-12

US20220238297A1

Electricity

APPARATUS AND METHOD FOR DETECTING ONE OR MORE SCANNING CHARGED PARTICLE BEAMS

#5 | 2022-06-02 ✅ Patent 11,742,173 granted on 2023-08-29

US20220172921A1

Electricity

Integrated optical and charged particle inspection apparatus

#6 | 2017-08-03 ✅ Patent 10,651,009 granted on 2020-05-12

US20170221675A1

Electricity

Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope

Also check out DELMIC IP B.V.'s (Delft, Netherlands) applicant profile with 6 patent applications submitted.

AssigneeID:

572558 ⎘