HEFEI XINSHENG OPTOELECTRONICS

City:

Hefei

Country:

China

Published Applications:

Last publication date:

2019-09-19

Patent Grants:

Last grant date:

2021-11-30

Top Inventors for applications by HEFEI XINSHENG OPTOELECTRONICS

These are the the leading inventors for applications assigned to HEFEI XINSHENG OPTOELECTRONICS:

Lei CHEN 1 Beijing, China

Recent patent applications by HEFEI XINSHENG OPTOELECTRONICS

HEFEI XINSHENG OPTOELECTRONICS based in Hefei, CN has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2019-09-19 ✅ Patent 11,187,772 granted on 2021-11-30

US20190285716A1

Physics

Method for calibrating current measurement device, current measurement method and device, display device

AssigneeID:

596259 ⎘