E Measuring Device Limited

City:

Hong Kong

Country:

Hong Kong

Published Applications:

Last publication date:

2014-04-17

Patent Grants:

Last grant date:

Top Inventors for applications by E Measuring Device Limited

These are the the leading inventors for applications assigned to E Measuring Device Limited:

Yiu-Ming Lee 1 Hong Kong, Hong Kong
Tak-Yu Yuen 1 Hong Kong, Hong Kong

Recent patent applications by E Measuring Device Limited

E Measuring Device Limited based in Hong Kong, HK has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2014-04-17

US20140101948A1

Physics

Garment Measurement and Reporting System

AssigneeID:

61246 ⎘