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Assignee profile:

Abberior Instruments GmbH

City:

Göttingen

Country:

Germany

Published Applications:

Last publication date:

2025-02-13

Patent Grants:

Last grant date:

2026-05-26

Top Inventors for applications by Abberior Instruments GmbH

These are the the leading inventors for applications assigned to Abberior Instruments GmbH:

Roman Schmidt 5 Göttingen, Germany
Benjamin HARKE 4 Gottingen, Germany
Lars KASTRUP 4 Göttingen, Germany
Matthias Henrich 3 Heidelberg, Germany

Joachim Fischer 3 Karlsruhe, Germany
Winfried Willemer 2 Bovenden, Germany
Christian WURM 2 Gottingen, Germany
Matthias REUSS 2 Göttingen, Germany

Jörn Heine 2 Witzenhausen, Germany
Christian WURM 1 Goettingen, Germany
Haugen MITTELSTADT 1 Bovenden, Germany
Haugen MITTELSTÄDT 1 Bovenden, Germany

Matthias Reuss 1 Goettingen, Germany

Recent patent applications by Abberior Instruments GmbH

Abberior Instruments GmbH based in Göttingen, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2025-02-13 ✅ Patent 12,638,397 granted on 2026-05-26

US20250052682A1

Physics

METHOD FOR LOCALIZING AND TRACKING EMITTERS IN A SAMPLE

#2 | 2024-02-01 ✅ Patent 12,461,009 granted on 2025-11-04

US20240035950A1

Physics

METHOD AND MICROSCOPE FOR RECORDING TRAJECTORIES OF INDIVIDUAL PARTICLES IN A SAMPLE

#3 | 2023-11-30 ✅ Patent 12,523,607 granted on 2026-01-13

US20230384223A1

Physics

METHOD AND FLUORESCENCE MICROSCOPE FOR DETERMINING THE LOCATION OF INDIVIDUAL FLUORESCENT DYE MOLECULES BY MEANS OF ADAPTIVE SCANNING

#4 | 2023-11-23 ✅ Patent 12,535,416 granted on 2026-01-27

US20230375473A1

Physics

METHOD, LIGHT MICROSCOPE AND COMPUTER PROGRAM FOR DETERMINING A REFERENCE TIME POINT

#5 | 2023-11-02 ✅ Patent 12,510,740 granted on 2025-12-30

US20230350179A1

Physics

METHOD AND APPARATUS FOR HIGH-RESOLUTION LOCALIZATION OF A SINGLE EMITTER IN MULTIPLE SPATIAL DIRECTIONS

#6 | 2023-08-10 ✅ Patent 12,306,392 granted on 2025-05-20

US20230251479A1

Physics

Method, apparatus and computer program for localizing an emitter in a sample

#7 | 2023-06-22 ✅ Patent 12,216,019 granted on 2025-02-04

US20230194383A1

Physics

Apparatuses for testing the lateral and axial confocality of a scanning and descanning microscope component group

#8 | 2023-06-08 ✅ Patent 12,601,901 granted on 2026-04-14

US20230176353A1

Physics

DETECTION DEVICE FOR A LASER SCANNING MICROSCOPE

#9 | 2023-03-30 ✅ Patent 12,265,033 granted on 2025-04-01

US20230101017A1

Physics

Method, computer program and apparatus for determining positions of molecules in a sample

#10 | 2023-01-05 ✅ Patent 12,259,329 granted on 2025-03-25

US20230003651A1

Physics

Method of disturbance correction, and laser scanning microscope having disturbance correction

#11 | 2022-08-04 ✅ Patent 12,554,111 granted on 2026-02-17

US20220244515A1

Physics

METHOD AND APPARATUS FOR CORRECTING ABERRATIONS IN FLUORESCENCE MICROSCOPY

#12 | 2022-04-14 ✅ Patent 11,967,090 granted on 2024-04-23

US20220114738A1

Physics

Method of and microscope comprising a device for detecting movements of a sample with respect to an objective

Also check out Abberior Instruments GmbH's (Göttingen, Germany) applicant profile with 28 patent applications submitted.

AssigneeID:

613421 ⎘