Yongin-si
South Korea
20
2025-09-04
15
2026-06-02
These are the the leading inventors for applications assigned to UNITEST INC.:
UNITEST INC. based in Yongin-si, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
TEST BOARD FOR BURN-IN TEST
#2 | 2025-08-21ELECTRICAL CONNECTOR FOR SUPPLYING UTILITY
#3 | 2025-08-21 ✅ Patent 12,644,550 granted on 2026-06-02AUTOMATIC CONNECTOR FOR SUPPLYING UTILITY
#4 | 2025-08-07CARTRIDGE MODULE AND MULTI WAFER BURN-IN TEST DEVICE UTILIZING SAME
#5 | 2025-05-15 ✅ Patent 12,601,782 granted on 2026-04-14PROBE CARD HOLDER FOR WAFER TESTING
#6 | 2018-09-13 ✅ Patent 11,031,091 granted on 2021-06-08Apparatus and method for measuring round-trip time of test signal using programmable logic
#7 | 2014-04-24 ✅ Patent 9,062,842 granted on 2015-06-23Lighting device for street lamp
#8 | 2008-09-25 ✅ Patent 7,656,178 granted on 2010-02-02Method for calibrating semiconductor device tester
#9 | 2008-08-21 ✅ Patent 7,688,099 granted on 2010-03-30Sequential semiconductor device tester
#10 | 2008-08-21 ✅ Patent 7,652,497 granted on 2010-01-26Sequential semiconductor device tester
#11 | 2008-08-14 ✅ Patent 7,875,193 granted on 2011-01-25Method for manufacturing probe structure of probe card
#12 | 2008-08-14 ✅ Patent 7,723,143 granted on 2010-05-25Method for manufacturing cantilever structure of probe card
#13 | 2008-08-14 ✅ Patent 7,685,704 granted on 2010-03-30Method for manufacturing bump of probe card
#14 | 2008-02-28 ✅ Patent 7,951,302 granted on 2011-05-31Method for forming bump of probe card
#15 | 2008-02-14Apparatus and Method For Generating Test Pattern Data For Testing Semiconductor Device
#16 | 2008-02-07 ✅ Patent 7,739,572 granted on 2010-06-15Tester for testing semiconductor device
#17 | 2008-02-07Tester For Testing Semiconductor Device
#18 | 2008-02-07 ✅ Patent 7,872,488 granted on 2011-01-18Tester for testing semiconductor device
#19 | 2008-02-07 ✅ Patent 7,824,561 granted on 2010-11-02Method for manufacturing probe structure
#20 | 2007-12-20 ✅ Patent 7,459,399 granted on 2008-12-02Method for manufacturing probe structure of probe card
Also check out UNITEST INC.'s (Yongin-si, South Korea) applicant profile with 6 patent applications submitted.
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