Rotterdam
Netherlands
8
2024-06-06
8
2026-01-20
These are the the leading inventors for applications assigned to Nearfield Instruments B.V.:
Nearfield Instruments B.V. based in Rotterdam, NL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
COMPACT OPTICAL MICROSCOPE, METROLOGY DEVICE COMPRISING THE OPTICAL MICROSCOPE AND A WAFER POSITIONING METROLOGY APPARATUS COMPRISING THE METROLOGY DEVICE
#2 | 2024-04-04 ✅ Patent 12,546,800 granted on 2026-02-10AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME
#3 | 2024-01-25 ✅ Patent 12,618,868 granted on 2026-05-05CASSETTE FOR HOLDING A PROBE
#4 | 2024-01-04 ✅ Patent 12,346,036 granted on 2025-07-01ALIGNMENT SYSTEM AND METHOD FOR ALIGNING AN OBJECT HAVING AN ALIGNMENT MARK
#5 | 2023-12-07 ✅ Patent 12,429,496 granted on 2025-09-30ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN A SCANNING PROBE MICROSCOPY SYSTEM
#6 | 2023-07-06 ✅ Patent 12,523,678 granted on 2026-01-13A PROBE CASSETTE AND METHOD FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM
#7 | 2023-06-15 ✅ Patent 12,523,676 granted on 2026-01-13METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BETWEEN LAYERS OF A SEMICONDUCTOR SUBSTRATE, SCANNING PROBE MICROSCOPY SYSTEM AND COMPUTER PROGRAM
#8 | 2023-05-11 ✅ Patent 12,123,895 granted on 2024-10-22Method of determining dimensions of features of a subsurface topography, scanning probe microscopy system and computer program
Also check out Nearfield Instruments B.V.'s (Rotterdam, Netherlands) applicant profile with 18 patent applications submitted.
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