Candela Instruments

City:

Fremont, California

Country:

United States

Published Applications:

Last publication date:

2006-10-17

Patent Grants:

Last grant date:

2006-10-17

Top Inventors for applications by Candela Instruments

These are the the leading inventors for applications assigned to Candela Instruments:

Steven W. Meeks 3 Fremont, CA United States

Recent patent applications by Candela Instruments

Candela Instruments based in Fremont, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2006-10-17 ✅ Patent 7,123,357 granted on 2006-10-17

US10444652

Method of detecting and classifying scratches and particles on thin film disks or wafers

#2 | 2005-06-21 ✅ Patent 6,909,500 granted on 2005-06-21

US10219632

Method of detecting and classifying scratches, particles and pits on thin film disks or wafers

#3 | 2005-05-24 ✅ Patent 6,897,957 granted on 2005-05-24

US10029957

Material independent optical profilometer

AssigneeID:

683475 ⎘