Assignee profile:

Intekplus CO., LTD

City:

Daejeon

Country:

South Korea

Published Applications:

14

Last publication date:

2024-08-22

Patent Grants:

11

Last grant date:

2025-10-21

Top Inventors for applications by Intekplus CO., LTD

These are the the leading inventors for applications assigned to Intekplus CO., LTD:

Recent patent applications by Intekplus CO., LTD

Intekplus CO., LTD based in Daejeon, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-08-22 ✅ Patent 12,452,544 granted on 2025-10-21
US20240284054A1
Electricity

INSPECTION SYSTEM FOR ROLL-TO-ROLL EQUIPMENT

#2 | 2023-05-18 ✅ Patent 12,085,608 granted on 2024-09-10
US20230152368A1
Physics

Picker device

#3 | 2023-05-11
US20230144924A1
Electricity

SYSTEM AND METHOD FOR CONFIRMING MOUNTED STATE OF PICKER MOUNTS

#4 | 2020-03-19 ✅ Patent 11,280,736 granted on 2022-03-22
US20200088638A1
Physics

Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor

#5 | 2019-12-19 ✅ Patent 10,753,872 granted on 2020-08-25
US20190383740A1
Physics

Apparatus and method for measuring fluorescence lifetime

#6 | 2019-10-10 ✅ Patent 10,845,311 granted on 2020-11-24
US20190310198A1
Physics

Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error through virtual fluorescence distribution model from signal collected in analog mean delay method

#7 | 2018-11-08
US20180317999A1
Human necessities

TISSUE ABLATION SYSTEM

#8 | 2014-08-14 ✅ Patent 9,412,159 granted on 2016-08-09
US20140226004A1
Physics

Method for inspecting flat panel

#9 | 2010-10-21 ✅ Patent 8,493,570 granted on 2013-07-23
US20100265517A1
Physics

Three-dimensional shape measuring apparatus

#10 | 2010-10-14 ✅ Patent 8,259,305 granted on 2012-09-04
US20100259765A1
Physics

Surface shape measuring system and surface shape measuring method using the same

#11 | 2010-07-08
US20100171963A1
Physics

APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE

#12 | 2010-06-10 ✅ Patent 8,319,961 granted on 2012-11-27
US20100141937A1
Physics

Apparatus to perform a non-contact test of a semiconductor package

#13 | 2010-02-11 ✅ Patent 8,056,698 granted on 2011-11-15
US20100032262A1
Physics

Tray handling apparatus and semiconductor device inspecting method using the same

#14 | 2008-10-23 ✅ Patent 8,155,483 granted on 2012-04-10
US20080260204A1
Physics

Apparatus for and method of measuring image

Also check out INTEKPLUS CO., LTD.'s (Daejeon, South Korea) applicant profile with 4 patent applications submitted.

AssigneeID:

74516 ⎘