Suwon-si
South Korea
8
2026-01-22
6
2025-08-26
These are the the leading inventors for applications assigned to Park Systems Corp.:
Park Systems Corp. based in Suwon-si, KR has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE
#2 | 2023-10-12 ✅ Patent 12,399,195 granted on 2025-08-26METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED, ATOMIC FORCE MICROSCOPE FOR PERFORMING SAME METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM TO PERFORM SAME METHOD
#3 | 2023-06-29APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE
#4 | 2023-06-15 ✅ Patent 12,038,455 granted on 2024-07-16Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source
#5 | 2023-04-04 ✅ Patent 11,619,649 granted on 2023-04-04Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same
#6 | 2022-06-30 ✅ Patent 11,761,981 granted on 2023-09-19Method and apparatus for identifying sample position in atomic force microscope
#7 | 2021-12-02 ✅ Patent 11,598,788 granted on 2023-03-07Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source
#8 | 2014-10-09 ✅ Patent 9,081,272 granted on 2015-07-14Leveling apparatus and atomic force microscope including the same
Also check out Park Systems Corp.'s (Suwon-si, South Korea) applicant profile with 7 patent applications submitted.
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