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Assignee profile:

Oxford Instruments Analytical Oy

City:

ESPOO

Country:

Finland

Published Applications:

18

Last publication date:

2015-06-11

Patent Grants:

18

Last grant date:

2017-01-17

Top Inventors for applications by Oxford Instruments Analytical Oy

These are the the leading inventors for applications assigned to Oxford Instruments Analytical Oy:

Recent patent applications by Oxford Instruments Analytical Oy

Oxford Instruments Analytical Oy based in ESPOO, FI has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2015-06-11 ✅ Patent 9,548,402 granted on 2017-01-17
US20150162455A1
Electricity

Semiconductor radiation detector with large active area, and method for its manufacture

 #2 | 2015-03-26 ✅ Patent 9,310,324 granted on 2016-04-12
US20150085976A1
Physics

X-ray fluorescence analyzer with safety features

 #3 | 2014-12-04 ✅ Patent 9,123,837 granted on 2015-09-01
US20140353786A1
Electricity

Semiconductor detector with radiation shield

 #4 | 2014-11-27 ✅ Patent 9,159,849 granted on 2015-10-13
US20140346630A1
Electricity

Semiconductor detector head and a method for manufacturing the same

 #5 | 2013-12-26 ✅ Patent 9,530,902 granted on 2016-12-27
US20130341752A1
Electricity

Two-dimensional guard structure and a radiation detector with the same

 #6 | 2013-12-26 ✅ Patent 8,921,797 granted on 2014-12-30
US20130341520A1
Physics

Leakage current collection structure and a radiation detector with the same

 #7 | 2011-12-22 ✅ Patent 8,494,119 granted on 2013-07-23
US20110311029A1
Electricity

Radiation window, and a method for its manufacturing

 #8 | 2008-10-30 ✅ Patent 7,508,906 granted on 2009-03-24
US20080267348A1
Physics

Filter for X-ray radiation, and an arrangement for using filtered X-ray radiation for excitation

 #9 | 2008-06-26 ✅ Patent 7,394,537 granted on 2008-07-01
US20080151241A1
Physics

Practical laser induced breakdown spectroscopy unit

 #10 | 2008-04-24 ✅ Patent 7,474,730 granted on 2009-01-06
US20080095309A1
Physics

Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser

 #11 | 2007-04-10 ✅ Patent 7,203,283 granted on 2007-04-10
US11358835
-

X-ray tube of the end window type, and an X-ray fluorescence analyzer

 #12 | 2006-07-18 ✅ Patent 7,078,695 granted on 2006-07-18
US10444260
-

Superconducting antenna-coupled hot-spot microbolometer, methods for its manufacture and use, and a bolometric imaging arrangement

 #13 | 2006-04-27 ✅ Patent 7,193,216 granted on 2007-03-20
US20060086906A1
Electricity

Method and circuit arrangement for compensating for rate dependent change of conversion factor in a drift-type radiation detector and a detector appliance

 #14 | 2006-03-28 ✅ Patent 7,020,238 granted on 2006-03-28
US11047247
-

Adapter and analyzer device for performing X-ray fluorescence analysis on hot surfaces

 #15 | 2005-11-22 ✅ Patent 6,967,329 granted on 2005-11-22
US10308303
-

Radiation detector, arrangement and method for measuring radioactive radiation, where continuous low-energy background noise is reduced

 #16 | 2005-08-23 ✅ Patent 6,934,021 granted on 2005-08-23
US10650014
-

Method and arrangement for applying optical emission spectroscopy to the detection of the 193 nm spectral line of carbon

 #17 | 2005-08-23 ✅ Patent 6,933,503 granted on 2005-08-23
US10458910
-

Imaging X-ray detector based on direct conversion

 #18 | 2005-06-16 ✅ Patent 7,065,174 granted on 2006-06-20
US20050129174A1
Physics

Measurement arrangement for X-ray fluoresence analysis

Also check out Oxford Instruments Analytical Oy's (Espoo, Finland) applicant profile with 5 patent applications submitted.

AssigneeID:

83364 ⎘