Yavne
Israel
129
2026-02-12
115
2026-02-24
These are the the leading inventors for applications assigned to ORBOTECH LTD.:
ORBOTECH LTD. based in Yavne, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
MULTI-MODALITY WITH TDI SENSOR
#2 | 2025-05-08 ✅ Patent 12,461,299 granted on 2025-11-04LED AND LASER DIODE COMBINED ILLUMINATION SYSTEM
#3 | 2025-05-08 ✅ Patent 12,644,851 granted on 2026-06-02METHOD AND APPARATUS FOR INSPECTION OF PANEL EMBEDDED DIES USING COMBINED THERMAL AND OPTICAL IMAGING
#4 | 2025-03-27 ✅ Patent 12,566,208 granted on 2026-03-03PULSED LASER MICRO LED INSPECTION
#5 | 2024-12-12 ✅ Patent 12,645,107 granted on 2026-06-02PARAFFINIC COMPOUND ADDITION TO LIQUID CRYSTALS FOR REDUCED SWITCHING VOLTAGE ON NCAP-BASED ELECTRO-OPTICAL MODULATOR
#6 | 2024-11-14 ✅ Patent 12,511,731 granted on 2025-12-30SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A MACHINE LEARNING ALGORITHM
#7 | 2024-08-01 ✅ Patent 12,493,245 granted on 2025-12-09ENHANCING EFFICIENCY OF RESIST PATTERNING
#8 | 2024-05-02 ✅ Patent 12,613,515 granted on 2026-04-28SYSTEM AND METHOD FOR DEFECT MITIGATION USING DATA ANALYSIS
#9 | 2024-04-11 ✅ Patent 12,421,453 granted on 2025-09-23CATIONIC GETTERING IN LIQUID CRYSTAL NCAP AND PDLC FILMS
#10 | 2024-03-21 ✅ Patent 12,276,897 granted on 2025-04-15Dynamic correction for an acousto-optic deflector
#11 | 2024-03-21 ✅ Patent 12,055,810 granted on 2024-08-06Enhanced defect detection with planar macrocycle dyes in liquid-crystal films
#12 | 2024-03-21 ✅ Patent 12,044,727 granted on 2024-07-23Probes for electrical testing in defect detection systems
#13 | 2024-03-14 ✅ Patent 12,259,606 granted on 2025-03-25Method for fabricating a liquid-crystal-based electro-optical light modulator using surface MEMS techniques for flat panel display inspection
#14 | 2023-12-21 ✅ Patent 12,449,475 granted on 2025-10-21Resampling with TDI Sensors
#15 | 2023-10-12 ✅ Patent 11,959,961 granted on 2024-04-16Method of determining an X and Y location of a surface particle
#16 | 2023-08-17 ✅ Patent 12,535,769 granted on 2026-01-27Systems and Methods for Reconstruction of Digital Holograms
#17 | 2023-05-18 ✅ Patent 12,561,782 granted on 2026-02-24PANEL DESIGN TO IMPROVE ACCURATE DEFECT LOCATION REPORT
#18 | 2023-04-06 ✅ Patent 12,320,758 granted on 2025-06-03System and method for inspection of multiple features of patterned objects in the manufacture of electrical circuits
#19 | 2022-08-04 ✅ Patent 11,627,667 granted on 2023-04-11High-resolution soldering
#20 | 2022-05-19 ✅ Patent 11,977,211 granted on 2024-05-07Multi-modal wide-angle illumination employing a compound beam combiner
#21 | 2022-04-21 ✅ Patent 12,204,228 granted on 2025-01-21High-speed dynamic beam shaping
#22 | 2022-03-31 ✅ Patent 11,596,070 granted on 2023-02-28Apparatus for use in preparing a printed circuit board and photosensitive ink for in an ink jet printer
#23 | 2022-03-31 ✅ Patent 12,122,621 granted on 2024-10-22Roll to roll web processing system
#24 | 2022-03-17 ✅ Patent 11,944,996 granted on 2024-04-02System and method for coating substrates
#25 | 2022-01-13 ✅ Patent 11,652,008 granted on 2023-05-16Adaptive routing for correcting die placement errors
#26 | 2021-09-23 ✅ Patent 12,579,476 granted on 2026-03-17ADAPTIVE LEARNING FOR IMAGE CLASSIFICATION
#27 | 2021-06-24 ✅ Patent 11,464,114 granted on 2022-10-04System producing a conductive path on a substrate
#28 | 2021-06-10 ✅ Patent 11,640,559 granted on 2023-05-02Accuracy of classification models
#29 | 2021-04-08 ✅ Patent 11,313,794 granted on 2022-04-26Hybrid 3D inspection system
#30 | 2021-01-28 ✅ Patent 11,881,466 granted on 2024-01-23Electrical interconnection of circuit elements on a substrate without prior patterning
#31 | 2020-03-19METHOD PRODUCING A CONDUCTIVE PATH ON A SUBSTRATE
#32 | 2019-12-05 ✅ Patent 11,409,184 granted on 2022-08-09Acousto-optic deflector with multiple output beams
#33 | 2019-08-29 ✅ Patent 11,159,712 granted on 2021-10-26Range differentiators for auto-focusing in optical imaging systems
#34 | 2019-08-29 ✅ Patent 12,042,984 granted on 2024-07-23Hybrid, multi-material 3D printing
#35 | 2019-03-21 ✅ Patent 11,271,119 granted on 2022-03-08LIFT printing of conductive traces onto a semiconductor substrate
#36 | 2018-11-08 ✅ Patent 10,429,742 granted on 2019-10-01Stitchless direct imaging for high resolution electronic patterning
#37 | 2018-10-04 ✅ Patent 10,688,692 granted on 2020-06-23Control of surface properties of printed three-dimensional structures
#38 | 2018-07-12 ✅ Patent 10,471,538 granted on 2019-11-12Control of lift ejection angle
#39 | 2017-12-21 ✅ Patent 10,633,758 granted on 2020-04-28Printing of three-dimensional metal structures with a sacrificial support
#40 | 2017-11-23 ✅ Patent 10,416,530 granted on 2019-09-17Acousto-optic deflector with multiple output beams
#41 | 2017-08-31 ✅ Patent 10,193,004 granted on 2019-01-29LIFT printing of conductive traces onto a semiconductor substrate
#42 | 2017-07-27 ✅ Patent 9,925,797 granted on 2018-03-27Lift printing system
#43 | 2017-06-22 ✅ Patent 10,622,244 granted on 2020-04-14Pulsed-mode direct-write laser metallization
#44 | 2016-08-11 ✅ Patent 10,629,442 granted on 2020-04-21Lift printing of multi-composition material structures
#45 | 2016-03-31IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR
#46 | 2016-01-28 ✅ Patent 10,455,137 granted on 2019-10-22Auto-focus system
#47 | 2015-12-31 ✅ Patent 10,015,887 granted on 2018-07-03Two-step, direct-write laser metallization
#48 | 2015-11-12 ✅ Patent 9,269,149 granted on 2016-02-23Calibration of a direct-imaging system
#49 | 2015-10-08 ✅ Patent 9,599,572 granted on 2017-03-21Optical inspection system and method
#50 | 2015-06-18 ✅ Patent 9,523,873 granted on 2016-12-20System and method for direct imaging
#51 | 2015-02-05 ✅ Patent 10,537,027 granted on 2020-01-14Method producing a conductive path on a substrate
#52 | 2014-06-12 ✅ Patent 8,888,328 granted on 2014-11-18Light engine
#53 | 2014-05-15 ✅ Patent 9,523,714 granted on 2016-12-20Electrical inspection of electronic devices using electron-beam induced plasma probes
#54 | 2013-12-12 ✅ Patent 9,232,114 granted on 2016-01-05Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
#55 | 2013-12-05 ✅ Patent 8,964,274 granted on 2015-02-24System and method for direct imaging
#56 | 2013-06-13LIGHTING SYSTEM
#57 | 2013-02-21 ✅ Patent 8,531,751 granted on 2013-09-10System and method for direct imaging
#58 | 2013-02-14AUTOMATIC REPAIR OF ELECTRIC CIRCUITS
#59 | 2012-08-16 ✅ Patent 8,536,506 granted on 2013-09-17Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
#60 | 2012-02-02OPTICAL IMAGING SYSTEM
#61 | 2011-12-15 ✅ Patent 8,335,999 granted on 2012-12-18System and method for optical shearing
#62 | 2011-11-17METHOD AND SYSTEM FOR ELECTRICAL CIRCUIT REPAIR
#63 | 2011-09-29DIRECTIONAL RADIATION DETECTOR
#64 | 2011-07-21 ✅ Patent 8,770,563 granted on 2014-07-08Vacuum hold-down apparatus
#65 | 2011-06-30 ✅ Patent 8,769,471 granted on 2014-07-01Producing electrical circuit patterns using multi-population transformation
#66 | 2011-05-26 ✅ Patent 8,462,328 granted on 2013-06-11Efficient telecentric optical system (ETOS)
#67 | 2011-05-19 ✅ Patent 8,119,969 granted on 2012-02-21Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
#68 | 2010-12-30 ✅ Patent 8,390,795 granted on 2013-03-05Multiple mirror calibration system
#69 | 2010-12-09 ✅ Patent 11,113,803 granted on 2021-09-07Inspection of a substrate using multiple cameras
#70 | 2010-11-11 ✅ Patent 8,395,083 granted on 2013-03-12Multiple beam drilling system
#71 | 2010-09-30 ✅ Patent 8,144,973 granted on 2012-03-27Multi-modal imaging
#72 | 2010-09-16 ✅ Patent 7,986,404 granted on 2011-07-26Inspection system employing illumination that is selectable over a continuous range angles
#73 | 2010-01-05 ✅ Patent 7,642,484 granted on 2010-01-05Multiple beam micro-machining system and method
#74 | 2009-12-17 ✅ Patent 8,054,553 granted on 2011-11-08Illumination angle control using dichroic filters
#75 | 2009-12-15 ✅ Patent 7,633,036 granted on 2009-12-15Micro-machining system employing a two stage beam steering mechanism
#76 | 2009-12-08 ✅ Patent 7,629,555 granted on 2009-12-08Multiple beam micro-machining system and method
#77 | 2009-10-15 ✅ Patent 8,077,307 granted on 2011-12-13Illumination system for optical inspection
#78 | 2009-05-07 ✅ Patent 7,947,922 granted on 2011-05-24Multiple beam micro-machining system and method
#79 | 2008-11-13 ✅ Patent 7,897,902 granted on 2011-03-01Imaging device and method for high-sensitivity optical scanning and integrated circuit therefor
#80 | 2008-10-02 ✅ Patent 7,663,111 granted on 2010-02-16Variable collimation in radiation detection
#81 | 2008-09-18 ✅ Patent 7,795,887 granted on 2010-09-14Photoconductive based electrical testing of transistor arrays
#82 | 2008-08-07 ✅ Patent 8,530,784 granted on 2013-09-10Method and system of machining using a beam of photons
#83 | 2008-06-17 ✅ Patent 7,388,978 granted on 2008-06-17Apparatus and methods for the inspection of objects
#84 | 2008-05-22INKJET PRINTING OF COLOR FILTERS
#85 | 2008-04-17 ✅ Patent 7,641,365 granted on 2010-01-05Linear light concentrator
#86 | 2008-02-21 ✅ Patent 7,945,087 granted on 2011-05-17Alignment of printed circuit board targets
#87 | 2008-02-07 ✅ Patent 7,598,688 granted on 2009-10-06Tilting device
#88 | 2007-12-27 ✅ Patent 7,347,530 granted on 2008-03-25Inkjet printing of color filters
#89 | 2007-12-27PLOTTING AN IMAGE ON A THIN MATERIAL HAVING VARIATIONS IN THICKNESS
#90 | 2007-12-27 ✅ Patent 7,525,098 granted on 2009-04-28High resolution energy detector
#91 | 2007-12-13FABRICATION OF FLAT PANEL DISPLAYS EMPLOYING FORMATION OF SPACED APART COLOR FILTER ELEMENTS
#92 | 2007-12-13METHOD AND APPARATUS FOR FABRICATING FLAT PANEL DISPLAYS EMPLOYING PARTIALLY TRANSPARENT BORDERS
#93 | 2007-11-15 ✅ Patent 7,925,073 granted on 2011-04-12Multiple optical input inspection system
#94 | 2007-10-16 ✅ Patent 7,283,660 granted on 2007-10-16Multi-layer printed circuit board fabrication system and method
#95 | 2007-09-27CAM reference for inspection of contour images
#96 | 2007-08-07 ✅ Patent 7,253,891 granted on 2007-08-07Method and apparatus for simultaneous 2-D and topographical inspection
#97 | 2007-08-07 ✅ Patent 7,253,120 granted on 2007-08-07Selectable area laser assisted processing of substrates
#98 | 2007-07-26 ✅ Patent 7,391,510 granted on 2008-06-24System and method for inspecting patterned devices having microscopic conductors
#99 | 2007-07-19REDUCTION OF FALSE ALARMS IN PCB INSPECTION
#100 | 2007-07-12 ✅ Patent 7,636,466 granted on 2009-12-22System and method for inspecting workpieces having microscopic features
Also check out Orbotech Ltd.'s (Yavne, Israel) applicant profile with 95 patent applications submitted.
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