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Assignee profile:

AON BENFIELD, INC.

City:

Chicago, Illinois

Country:

United States

Published Applications:

14

Last publication date:

2024-10-17

Patent Grants:

10

Last grant date:

2025-01-21

Top Inventors for applications by AON BENFIELD, INC.

These are the the leading inventors for applications assigned to AON BENFIELD, INC.:

Takeshi Okazaki 9 Tokyo, Japan
STEPHEN JOHN MARTIN MILDENHALL 3 OAK PARK, IL United States
Bryon G. Ehrhart 2 Chicago, IL United States
KIRK WILLIAM DYBVIK 2 CHASKA, MN United States

Bryon Gerard EHRHART 1 Chicago, IL United States
STEPHEN CHARLES FIETE 1 EVANSTON, IL United States

Recent patent applications by AON BENFIELD, INC.

AON BENFIELD, INC. based in Chicago, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2024-10-17 ✅ Patent 12,205,031 granted on 2025-01-21

US20240346308A1

Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis

#2 | 2023-09-07 ✅ Patent 11,853,889 granted on 2023-12-26

US20230281447A1

Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis

#3 | 2023-03-16 ✅ Patent 11,687,768 granted on 2023-06-27

US20230082808A1

Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis

#4 | 2022-09-08 ✅ Patent 11,551,040 granted on 2023-01-10

US20220284244A1

Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis

#5 | 2022-02-24 ✅ Patent 11,347,976 granted on 2022-05-31

US20220058447A1

Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis

#6 | 2021-05-13 ✅ Patent 11,030,491 granted on 2021-06-08

US20210142123A1

Platform, systems, and methods for identifying property characteristics and property feature conditions through imagery analysis

#7 | 2021-03-25 ✅ Patent 11,195,058 granted on 2021-12-07

US20210089839A1

Platform, systems, and methods for identifying property characteristics and property feature conditions through aerial imagery analysis

#8 | 2020-05-07 ✅ Patent 10,650,285 granted on 2020-05-12

US20200143212A1

Platform, systems, and methods for identifying property characteristics and property feature conditions through aerial imagery analysis

#9 | 2018-03-29 ✅ Patent 10,529,029 granted on 2020-01-07

US20180089763A1

Platform, systems, and methods for identifying property characteristics and property feature maintenance through aerial imagery analysis

#10 | 2017-06-29

US20170185909A1

SYSTEMS AND METHODS FOR PERFORMING REAL-TIME CONVOLUTION CALCULATIONS OF MATRICES INDICATING AMOUNTS OF EXPOSURE

#11 | 2015-04-30

US20150120333A1

SYSTEMS AND METHODS FOR INSURANCE RATEMAKING USING WEATHER SCORE

#12 | 2015-04-30

US20150120332A1

SYSTEMS AND METHODS FOR DETERMINING RISK EXPOSURE

#13 | 2011-08-25 ✅ Patent 8,290,846 granted on 2012-10-16

US20110208547A1

Method of providing catastrophic loss protection through a mortgage

#14 | 2011-08-25

US20110208546A1

Method of Providing Catastrophic Loss Protection Through a Mortgage

Also check out Aon Benfield Inc.'s (Chicago, United States) applicant profile with 9 patent applications submitted.

AssigneeID:

91749 ⎘