Patents-Review.com
ClassID:

44166 ⎘

B23Q17/2495 - CPC Classification

Classification description:

Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interferometers

Recent Application in this class:
#1
20250276417
2025-09-04

MACHINING DEVICE

 #2
20210299731
2021-09-30

MOBILE MACHINE TOOL

 #3
20210291310
2021-09-23

Direct pose feedback control method and direct pose feedback controlled machine

 #4
20200189061
2020-06-18

Tool device and method for measuring a condition of a machining tool

 #5
20190314947
2019-10-17

Multi-degree-of-freedom error measurement system for rotary axes and method thereof

 #6
20180178339
2018-06-28

Measurement, calibration and compensation system and method for machine tool

 #7
20170151643
2017-06-01

Manufacturing system

 #8
20140355002
2014-12-04

Error measurement method and machine tool

 #9
20130068051
2013-03-21

Precision feeding device and precision transfer equipment

 #10
20130068050
2013-03-21

Precision transfer equipment

 #11
20120038763
2012-02-16

Measuring apparatus and measuring method thereof, apparatus for correcting processing position of cutting machine and method thereof for correcting processing position, and imaging apparatus and cutting machine comprising the same

 #12
20110213490
2011-09-01

Method of detecting a dynamic path of a five-axis machine tool and dectecting assembly for the same

 #13
20090315280
2009-12-24

Chucking fixture with device for measuring the distance between a chunk and a toolholder or workholder

 #14
20080136078
2008-06-12

Positioning apparatus, exposure apparatus, and device manufacturing method

 #15
20060138871
2006-06-29

Two-dimensional nanopositioner with crude and fine stages

 #16
20050134851
2005-06-23

Method for calibrating the geometry of a multi-axis metrology system