84047 ⎘
Subject matter not provided for in other groups of this subclass Characterising MEMS devices, e.g. measuring and identifying electrical or mechanical constants
PACKAGED MEMS DEVICE HAVING A HUMIDITY SENSOR
#2METHOD AND APPARATUS FOR EVALUATING ELECTROSTATIC OR NONLINEAR DEVICES
#3MICRO-ASSEMBLER SYSTEM WITH MICRO-OBJECT TRAP LOCATIONS
#4METHOD AND A SYSTEM FOR CHARACTERISING STRUCTURES THROUGH A SUBSTRATE
#5METHOD AND DEVICE FOR ASCERTAINING DYNAMIC PARAMETERS OF A MEMS APPARATUS, AND MEMS APPARATUS
#6METHODS OF SEPARATING GOOD PROBE STRUCTURES FROM DEFECTIVE PROBE STRUCTURES IN AN ELECTROCHEMICAL FABRICATION SYSTEM
#7Method and a system for characterising structures through a substrate
#8Systems and methods for thermally regulating sensor operation
#9METHOD AND APPARATUS FOR EVALUATING ELECTROSTATIC OR NONLINEAR DEVICES
#10MEMS transducer system and associated methods
#11Systems and methods for thermally regulating sensor operation
#12MEMS sensor compensation for off-axis movement
#13Method and apparatus for evaluating electrostatic or nonlinear devices
#14MEMS sensor compensation for off-axis movement
#15Method for determining the quality factor of an oscillator
#16Sensor device with integrated calibration system and calibration method
#17MEMS transducer system and associated methods
#18Environmental sensor
#19Self-tuning microelectromechanical impedance matching circuits and methods of fabrication
#20Microelectromechanical or/and nanoelectromechanical device with out-of-plane displacement having capacitive elements having a variable surface
#21Systems and methods for thermally regulating sensor operation
#22Electric device, in particular a microphone having re-adjustable sensitivity, and adjustment method
#23Capacitance measurement
#24Internally generated DFT stepped hysteresis sweep for electrostatic MEMS
#25MEMS PRESSURE SENSOR AND METHOD FOR FORMING THE SAME
#26Device and method for sensor calibration
#27Compensation and calibration for MEMS devices
#28Calibration of a mechanical property of SPM cantilevers
#29Detecting failure of scanning mirror
#30Methods, apparatus, and systems for fabrication of polymeric nano- and micro-fibers in aligned configurations
#31Torsional and lateral stiffness measurement
#32Method and system for characterization of nano- and micromechanical structures
#33Pressure sensor with built-in calibration capability
#34Sensor device with integrated calibration system and calibration method
#35Method for adapting the parameters of a controller for micromechanical actuators, and device
#36Inertial angular sensor of balanced MEMS type and method for balancing such a sensor
#37Compensation and calibration for MEMS devices
#38Mechanical component, mechanical system, and method for operating a mechanical component
#39Calibration of MEMS sensor
#40Method for measuring a microelectromechanical semiconductor component
#41Method and device for measuring a microelectromechanical semiconductor component
#42System and method of sensing actuation and release voltages of an interferometric modulator
#43METHOD AND APPARATUS FOR SENSING, MEASUREMENT OR CHARACTERIZATION OF DISPLAY ELEMENTS INTEGRATED WITH THE DISPLAY DRIVE SCHEME, AND SYSTEM AND APPLICATIONS USING THE SAME
#44System for mechanical characterization of materials and biological samples in the sub-millinewton force range
#45On-chip measurement of capacitance for micro-electro-mechanical system (MEMS) actuator circuit
#46Microelectromechanical structure (MEMS) monitoring
#47Force, pressure, or stiffness measurement or calibration using graphene or other sheet membrane
#48Method for determining the sensitivity of an acceleration sensor or magnetic field sensor
#49Method of measuring micro- and nano-scale properties
#50Methods and Systems for Detection Using Threshold-Type Electrostatic Sensors
#51Method and apparatus for sensing, measurement or characterization of display elements integrated with the display drive scheme, and system and applications using the same
#52Methods, apparatus, and systems for fabrication of polymeric nano- and micro-fibers in aligned configurations
#53System and method of sensing actuation and release voltages of an interferometric modulator
#54METHOD AND APPARATUS FOR SENSING, MEASUREMENT OR CHARACTERIZATION OF DISPLAY ELEMENTS INTEGRATED WITH THE DISPLAY DRIVE SCHEME, AND SYSTEM AND APPLICATIONS USING THE SAME
#55METHOD AND APPARATUS FOR SENSING, MEASUREMENT OR CHARACTERIZATION OF DISPLAY ELEMENTS INTEGRATED WITH THE DISPLAY DRIVE SCHEME, AND SYSTEM AND APPLICATIONS USING THE SAME
#56Apparatus and method for drive controlling micro machine device
#57Microsystem manipulation apparatus
#58System and method of sensing actuation and release voltages of an interferometric modulator
#59Trimming method for microresonators and microresonators made thereby
#60Method to test the quality factor of a MEMS gyroscope at chip probe