84048 ⎘
Subject matter not provided for in other groups of this subclass Testing
Sub-classes:MICRO-DIFFERENTIAL PRESSURE SENSOR, PACKAGING STRUCTURE, TESTING METHOD AND ELECTRONIC DEVICE
#2ENVIRONMENTAL SENSOR AND METHOD FOR OPERATING AN ENVIRONMENTAL SENSOR
#3Electrical test structure and method for monitoring deep trench impedance to substrate
#4Microelectromechanical systems sensor testing device, system and method
#5Method for producing a micromechanical component
#6Controlled pulse generation methods and apparatuses for evaluating stiction in microelectromechanical systems devices
#7Circuitry and method for generating a discrete-time high voltage
#8MEMS microphone and method for forming the same
#9Method for testing signal-to-noise ratio using a film frame
#10Micromechanical sensor device and corresponding manufacturing method
#11MEMS device calibration
#12Centrifuge MEMS stiction detection and screening system and method
#13Semiconductor device and method for detecting damaging of a semiconductor device
#14Centrifuge MEMS stiction test system and method
#15Wafer level centrifuge for MEMS stiction detection and screening system and method
#16Compensation and calibration for MEMS devices
#17Capacitive physical quantity sensor and diagnosis method
#18Low charging dielectric for capacitive MEMS devices and method of making same
#19Noninvasive method for characterizing and identifying embedded micropatterns