ClassID:

84048

B81C99/0035 - CPC Classification

Classification description:

Subject matter not provided for in other groups of this subclass Testing

Sub-classes:
Recent Application in this class:
#1
20250282611
2025-09-11

MICRO-DIFFERENTIAL PRESSURE SENSOR, PACKAGING STRUCTURE, TESTING METHOD AND ELECTRONIC DEVICE

#2
20250066186
2025-02-27

ENVIRONMENTAL SENSOR AND METHOD FOR OPERATING AN ENVIRONMENTAL SENSOR

#3
20210208187
2021-07-08

Electrical test structure and method for monitoring deep trench impedance to substrate

#4
20200048083
2020-02-13

Microelectromechanical systems sensor testing device, system and method

#5
20180111828
2018-04-26

Method for producing a micromechanical component

#6
20170370799
2017-12-28

Controlled pulse generation methods and apparatuses for evaluating stiction in microelectromechanical systems devices

#7
20170146364
2017-05-25

Circuitry and method for generating a discrete-time high voltage

#8
20160241965
2016-08-18

MEMS microphone and method for forming the same

#9
20160183021
2016-06-23

Method for testing signal-to-noise ratio using a film frame

#10
20160152466
2016-06-02

Micromechanical sensor device and corresponding manufacturing method

#11
20150362395
2015-12-17

MEMS device calibration

#12
20150284245
2015-10-08

Centrifuge MEMS stiction detection and screening system and method

#13
20150253375
2015-09-10

Semiconductor device and method for detecting damaging of a semiconductor device

#14
20140352403
2014-12-04

Centrifuge MEMS stiction test system and method

#15
20140290331
2014-10-02

Wafer level centrifuge for MEMS stiction detection and screening system and method

#16
20140260508
2014-09-18

Compensation and calibration for MEMS devices

#17
20070236231
2007-10-11

Capacitive physical quantity sensor and diagnosis method

#18
20060138604
2006-06-29

Low charging dielectric for capacitive MEMS devices and method of making same

#19
20050018171
2005-01-27

Noninvasive method for characterizing and identifying embedded micropatterns