ClassID:

87789

C03C17/3665 - CPC Classification

Classification description:

Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer the multilayer coating having optical properties specially adapted for use as photomask

Recent Application in this class:
#1
20240069428
2024-02-29

REFLECTIVE MASK BLANK, REFLECTIVE MASK, REFLECTIVE MASK MANUFACTURING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

#2
20210096456
2021-04-01

MULTILAYERED-REFLECTIVE-FILM-PROVIDED SUBSTRATE, REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

#3
20180275507
2018-09-27

Mask blank substrate, substrate with multilayer reflection film, transmissive mask blank, reflective mask, and semiconductor device fabrication method

#4
20170010527
2017-01-12

Mask blank substrate, substrate with multilayer reflection film, transmissive mask blank, reflective mask, and semiconductor device fabrication method

#5
20160346960
2016-12-01

Blank for mold production and method for manufacturing mold

#6
20150017574
2015-01-15

Mask blank substrate, substrate with multilayer reflection film, transmissive mask blank, reflective mask, and semiconductor device fabrication method

#7
20120260222
2012-10-11

Mask fabrication supporting method, mask blank providing method, and mask blank dealing system

#8
20100178597
2010-07-15

Mask fabrication supporting method, mask blank providing method, and mask blank dealing system

#9
20100126367
2010-05-27

Method for etching glass or metal substrates using negative photoresist and method for fabricating cliche using the same

#10
20100080961
2010-04-01

METHOD OF PROCESSING GLASS SUBSTRATE SURFACE

#11
20090286166
2009-11-19

Process for smoothing surface of glass substrate

#12
20080113303
2008-05-15

Multilayer Coatings For EUV Mask Substrates

#13
20070275308
2007-11-29

Reflective mask blank, reflective mask, and method of manufacturing semiconductor device

#14
20070240453
2007-10-18

Method for smoothing a surface of a glass substrate for a reflective mask blank used in EUV lithography

#15
20070178387
2007-08-02

Mask fabrication supporting method, mask blank providing method, and mask blank dealing system

#16
20070166630
2007-07-19

Photomasks including multi-layered light-shielding and methods of manufacturing the same

#17
20070091421
2007-04-26

Multilayer reflective film coated substrate, manufacturing method thereof, reflective mask blank, and reflective mask

#18
20070091420
2007-04-26

Multilayer reflective film coated substrate, manufacturing method thereof, reflective mask blank, and reflective mask

#19
20070003844
2007-01-04

Method for adjusting dimensions of photomask features

#20
20060251973
2006-11-09

Reflective-type mask blank for EUV lithography and method for producing the same

#21
20060240335
2006-10-26

Mask blank and process for producing and process for using the same, and mask and process for producing and process for using the same

#22
20050238922
2005-10-27

Substrate with a multilayer reflection film, reflection type mask blank for exposure, reflection type mask for exposure and methods of manufacturing them

#23
20050227152
2005-10-13

Dual-layer EUV mask absorber with trenches having opposing sidewalls that are straight and parallel

#24
20050130046
2005-06-16

Method for adjusting dimensions of photomask features

#25
20050064298
2005-03-24

Multilayer coatings for EUV mask substrates