ClassID:

98193

C08F216/10 - CPC Classification

Classification description:

Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal or ketal radical by an alcohol radical Carbocyclic compounds

Recent Application in this class:
#1
20250172875
2025-05-29

POLYMER, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS

#2
20250136736
2025-05-01

PREPARATION OF TERTIARY ESTER-CONTAINING AROMATIC VINYL MONOMER

#3
20230355833
2023-11-09

RADIOPAQUE POLYMERS

#4
20230288806
2023-09-14

PHOTOSENSITIVE POLYMER CAPABLE OF MULTI-STEP DEPROTECTION REACTION, PHOTORESIST COMPOSITION INCLUDING THE PHOTOSENSITIVE POLYMER, AND METHOD OF MANUFACTURING THE INTEGRATED CIRCUIT DEVICE

#5
20220153934
2022-05-19

Polymer material and method for producing same

#6
20210015963
2021-01-21

Radiopaque polymers

#7
20200331830
2020-10-22

Surfactant composition

#8
20190185603
2019-06-20

Cyclopentene monomers and methods of polymerization

#9
20170226250
2017-08-10

Polymer, resist composition, and pattern forming process

#10
20170038683
2017-02-09

Compound, polymer compound, resist composition, and patterning process

#11
20170037167
2017-02-09

Polymer compound, positive resist composition, laminate, and resist patterning process

#12
20160377979
2016-12-29

Resist composition

#13
20160376233
2016-12-29

Positive-type resist composition, method for forming resist pattern, photo-reactive quencher, and polymeric compound

#14
20160342086
2016-11-24

Polymer, monomer, resist composition, and patterning process

#15
20160320700
2016-11-03

Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank provided with actinic ray-sensitive or radiation-sensitive film, pattern forming method, method for manufacturing electronic device, and electronic device

#16
20160291467
2016-10-06

Resin, resist composition and method for producing resist pattern

#17
20160266494
2016-09-15

Polymers for hard masks, hard mask compositions including the same, and methods for forming a pattern of a semiconductor device using a hard mask composition

#18
20160229940
2016-08-11

POLYMER, RESIST COMPOSITION, AND PATTERN FORMING PROCESS

#19
20160229939
2016-08-11

Silicon-containing polymer, silicon-containing compound, composition for forming a resist under layer film, and patterning process

#20
20160168296
2016-06-16

POLYMER, RESIST COMPOSITION, AND PATTERN FORMING PROCESS

#21
20160075805
2016-03-17

CNSL-based hydrocarbon resins, preparation and uses thereof

#22
20160027653
2016-01-28

Compound for forming organic film, and organic film composition using the same, process for forming organic film, and patterning process

#23
20160018735
2016-01-21

Compound for forming organic film, and organic film composition using the same, process for forming organic film, and patterning process

#24
20150293446
2015-10-15

ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE COMPOSITION, RESIST FILM USING THE SAME, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE

#25
20150284492
2015-10-08

Actinic ray-sensitive or radiation-sensitive composition, resist film using the same, pattern forming method, method for manufacturing electronic device, and electronic device

#26
20150253666
2015-09-10

Positive resist composition and patterning process

#27
20150253665
2015-09-10

Positive resist composition and patterning process

#28
20150253662
2015-09-10

ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE

#29
20150239806
2015-08-27

Polymerizable spirobisindane monomers and polymers prepared therefrom

#30
20150147698
2015-05-28

Negative resist composition and pattern forming process

#31
20150099851
2015-04-09

CNSL-based hydrocarbon resins, preparation and uses thereof

#32
20150086912
2015-03-26

ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM AND PATTERN FORMING METHOD USING THE SAME, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE

#33
20150064622
2015-03-05

Compound, resin, photoresist composition, and method for producing photoresist pattern

#34
20150030983
2015-01-29

Resist top coat composition and patterning process

#35
20140363690
2014-12-11

Photocurable polymeric dielectrics and methods of preparation and use thereof

#36
20130143163
2013-06-06

Resist-protective film-forming composition and patterning process

#37
20120282553
2012-11-08

Immersion upper layer film forming composition and method of forming photoresist pattern

#38
20110215334
2011-09-08

Photocurable polymeric dielectrics containing 6-substituted coumarin moieties and methods of preparation and use thereof

#39
20080166410
2008-07-10

Acidic superabsorbent hydrogels

#40
20070269734
2007-11-22

Upper layer film forming composition for liquid immersion and method of forming photoresist pattern

#41
20070149740
2007-06-28

Method of producing water-soluble nonturbid copolymers of at least one water-soluble N-vinyllactam and at least one hydrophobic comonomer

#42
20070149739
2007-06-28

Method of producing water-soluble nonturbid copolymers of at least one water-soluble N-vinyllactam and at least one hydrophobic comonomer

#43
20070149738
2007-06-28

Method of producing water-soluble nonturbid copolymers of at least one water-soluble N-vinyllactam and at least one hydrophobic comonomer

#44
20070149737
2007-06-28

Method of producing water-soluble nonturbid copolymers of at least one water-soluble n-vinyllactam and at least one hydrophobic comonomer

#45
20070149716
2007-06-28

Acidic superabsorbent hydrogels

#46
20050234413
2005-10-20

Acidic superabsorbent hydrogels