164278 ⎘
Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using an exciting beam and a detection beam including surface acoustic waves [SAW]
HYBRID METROLOGY METHOD AND SYSTEM
#2Additive Manufacturing with Photo-Acoustic Tomography Defect Testing
#3RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
#4HYBRID METROLOGY METHOD AND SYSTEM
#5NON-DESTRUCTIVE ESTIMATION OF COATING LAYER THICKNESS BASED ON SWEEP FREQUENCY PHOTO ACOUSTIC GUIDED WAVE TECHNIQUE
#6Plasma processing apparatus and plasma processing method
#7Raman spectroscopy based measurements in patterned structures
#8Hybrid metrology method and system
#9Additive Manufacturing With Photo-Acoustic Tomography Defect Testing
#10Hybrid metrology method and system
#11Raman spectroscopy based measurements in patterned structures
#12Methods for nondestructive measurements of thickness of underlying layers
#13Inspection apparatus, inspection method, computer program and recording medium
#14Method for real-time inspection of structural components
#15Hybrid metrology method and system
#16Raman spectroscopy based measurements in patterned structures
#17METHOD AND DEVICE FOR MEASURING A LONG PROFILE
#18Method for determining the layer thickness of a connecting layer between two packaging layers
#19Wavelength-selectable coating thickness measurement apparatus
#20Interferometric material sensing apparatus including adjustable coupling and associated methods
#21Interferometric biometric sensing apparatus including adjustable coupling and associated methods
#22Interferometric sensing apparatus including adjustable coupling and associated methods
#23Interferometric material sensing apparatus including adjustable coupling and associated methods
#24Interferometric biometric sensing apparatus including adjustable coupling and associated methods
#25Interferometric sensing apparatus including adjustable coupling and associated methods
#26Contact-free pipe wall thickness measurement device and pipe wall thickness measurement
#27Method and arrangement for detecting a surface of an object
#28Optical method and system for the characterization of laterally-patterned samples in integrated circuits
#29NONCONTACT FILM THICKNESS MEASUREMENT METHOD AND DEVICE
#30Optical method for the characterization of laterally-patterned samples in integrated circuits
#31Metrology system with spectroscopic ellipsometer and photoacoustic measurements
#32Optical method for the characterization of laterally patterned samples in integrated circuits
#33Characterization of micro- and nano scale materials by acoustic wave generation with a CW modulated laser
#34Metrology system with spectroscopic ellipsometer and photoacoustic measurements
#35Method for measuring thin films
#36Method and apparatus for measuring thickness of thin films via transient thermoreflectance
#37Method of determining properties of patterned thin film metal structures using transient thermal response
#38Device and method for measuring thickness
#39Metrology system with spectroscopic ellipsometer and photoacoustic measurements
#40Method and apparatus for measuring thickness of metal layer