164302 ⎘
Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using interferometry
Analyzing surface structure using scanning interferometry
#602Light wave interferometer apparatus
#603Measurement method, a measurement apparatus, and a computer-readable recording medium
#604Refractive prescription using optical coherence tomography
#605Interferometric nanoimaging system
#606Ultra precision profile measuring method
#607Method and apparatus for determining a deviation of an actual shape from a desired shape of an optical surface
#608Methods and systems for white light interferometry and characterization of films
#609Inner surface measuring apparatus
#610Measuring apparatus, exposure apparatus, and device fabrication method
#611Dental optical coherence tomograph
#612Method and system for measuring a surface of an object
#613Apparatus and method for a combined interferometric and image based geometric determination, particularly in the microsystem technology
#614Systems and methods for characterizing thickness and topography of microelectronic workpiece layers
#615Method for image calibration and apparatus for image acquiring
#616Method for measuring surface profile, and apparatus using the same
#617Interferometer
#618LASER SCANNING INTERFEROMETRIC SURFACE METROLOGY
#619Methods of testing and manufacturing optical elements
#620Information processing apparatus for interference signal processing
#621Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information
#622METHODS AND SYSTEMS FOR DETERMINING OPTICAL PROPERTIS USING LOW COHERENCE INTERFERENCE SIGNALS
#623Multiple channel interferometric surface contour measurement system
#624Optical measuring device for measuring a plurality of surfaces of an object to be measured
#625Method for optically testing semiconductor devices
#626Signal analysis method for vibratory interferometry
#627Method and system for analyzing low-coherence interferometry signals for information about thin film structures
#628Surface profiling apparatus
#629Method for quantifying defects in a transparent substrate
#630Device and method for testing a tire, in particular by means of an interferometric measuring method
#631Apparatus for measuring defects in a glass sheet
#632Determining positional error of an optical component using structured light patterns
#633Apparatus for the contact-less, interferometric determination of surface height profiles and depth scattering profiles
#634Method and apparatus for determining the shape, distance and orientation of an object
#635Multiple channel interferometric surface contour measurement system
#636Shape measuring apparatus, shape measuring method, and exposure apparatus
#637Hologram and method of manufacturing an optical element using a hologram
#638Three-dimensional shape measurement method and three-dimensional shape measurement apparatus
#639Three-dimensional shape measuring method and apparatus
#640Diffractive null corrector employing a spatial light modulator
#641Method and device for inspecting a surface of an optical component
#642Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts
#643Apparatus for caries detection
#644Method of manufacturing an optical element
#645Method and an apparatus for shape measurement, and a frequency comb light generator
#646Compensation of systematic effects in low coherence interferometry
#647Repairing method for dark areas on a surface profile and a surface profile measuring method
#648Surface profile measuring method
#649Measurement of lenses and lens molds using optical coherence tomography
#650Chromatic compensation in Fizeau interferometer
#651Interferometric Measuring System
#652Method and apparatus for detecting defect on a surface of a specimen
#653Profilometry apparatus and method of operation
#654MEMS-based, phase-shifting interferometer
#655Interferometric measuring device
#656Interferometers for the measurement of large diameter thin wafers
#657Linear-carrier phase-mask interferometer
#658Interferometric measuring device
#659In situ determination of pixel mapping in interferometry
#660Surface profiling method and apparatus
#661Measuring endoscope apparatus
#662Shape measurement method
#663Vibration-resistant interferometer apparatus
#664Optical imaging system
#665Three-dimensional geometric measurement and analysis system
#666Off-axis paraboloid interferometric mirror with off focus illumination
#667Optical fiber delivered reference beam for interferometric imaging
#668Interference measurement system self-alignment method
#669Phase unwrapping method, program, and interference measurement apparatus
#670Integrated interference scanning method
#671Methods and systems for determining optical properties using low-coherence interference signals
#672Device and method for a combined interferometry and image-based determination of geometry, especially for use in micro system engineering
#673Method of combining holograms
#674Inner surface measuring apparatus
#675Phase shift interferometer
#676Measuring apparatus
#677Method for manufacturing a biosensor element and for testing the same
#678Method and apparatus for phase contrast quadrature interferometric detection of an immunoassay
#679Method of assembling a composite data map having a closed-form solution
#680Method and apparatus for tilt corrected lateral shear in a lateral shear plus rotational shear absolute flat test
#681Surface profiling apparatus with reference calibrator and method of calibrating same
#682Method of qualifying a diffraction grating and method of manufacturing an optical element
#683Method and system for analyzing low-coherence interferometry signals for information about thin film structures
#684Laser scanning interferometric surface metrology
#685Interferometric measuring device
#686Interferometer and method of calibrating the interferometer
#687Method for optically testing semiconductor devices
#688Interferometric measuring device
#689Method for compensating errors in interferometric surface metrology
#690Surface shape measuring apparatus
#691Method for measuring optical-phase distribution
#692Interferometry systems and methods using spatial carrier fringes
#693Optical-distortion correcting apparatus and optical-distortion correcting method
#694Method for processing multiwavelength interferometric imaging data
#695Interferometer system for and a method of determining a surface characteristic by modifying surface height data using corresponding amplitude data
#696Non-destructive optical imaging system for enhanced lateral resolution
#697Interferometer for determining characteristics of an object surface
#698Interferometer with multiple modes of operation for determining characteristics of an object surface
#699Interferometer for determining characteristics of an object surface, including processing and calibration
#700Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element
#701Interferometer arrangement and interferometric measuring method
#702Overlapping common-path interferometers for two-sided measurement
#703Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
#704Method and apparatus for measuring holding distortion
#705Mounting mechanism for compensating optics in interferometer
#706Profilometry through dispersive medium using collimated light with compensating optics
#707Method for measuring contour variations
#708Measurement of complex surface shapes using a spherical wavefront
#709Fizeau interferometer designs for optical coherence tomography
#7103D and 2D measurement system and method with increased sensitivity and dynamic range
#711Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometer
#712Optical image measuring apparatus
#713Optical image measuring apparatus and optical image measuring method
#714Optical measuring device for measuring curved surfaces
#715Feature isolation for frequency-shifting interferometry
#716Optical image measuring apparatus
#717Interferometer for measuring virtual contact surfaces
#718Method and apparatus for interferometric measurement of components with large aspect ratios
#719Phase measuring method and apparatus for multi-frequency interferometry
#720Interferometric measuring device utilizing a slanted probe filter
#721Optical image measuring apparatus and optical image measuring method
#722Transparent film measurements
#723Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry
#724Methods and systems for determining optical properties using low-coherence interference signals
#725Multi-layer Optical Disc And System
#726Interferometric apparatus and method for surface profile detection
#727Compact optical apparatus
#728Vibration resistant interferometry
#729Vibration resistant interferometry
#730Non-destructive testing system using a laser beam
#731Surface profiling apparatus
#732Method and apparatus for measuring dynamic configuration surface
#733Optical fiber inspection device
#734Shape measuring apparatus, shape measuring method, and aligning method
#735Interferometry systems and methods
#736Optical image measuring apparatus for obtaining a signal intensity and spatial phase distribution of interference light
#737Precision surface measurement
#738Sensing device for measuring the three-dimension shape and its measuring method
#739Compensation for errors in off-axis interferometric measurements
#740Scanning interferometer for aspheric surfaces and wavefronts
#741Method and apparatus for absolute figure metrology
#742Method and apparatus for three-dimensional spectrally encoded imaging
#743Measurement system of three-dimensional shape of transparent thin film using acousto-optic tunable filter
#744Light interference measurement method using computer-generated hologram, and interferometer using this method
#745Multi-beam probe with adjustable beam angle
#746Reconfigurable interferometer system
#747Caching of intra-layer calculations for rapid rigorous coupled-wave analyses
#748Vibration-resistant interferometer apparatus
#749Optical profile determining apparatus and associated methods including the use of a plurality of wavelengths in the reference beam and a plurality of wavelengths in a reflective transit beam
#750Stroboscopic interferometry with frequency domain analysis
#751Surface topography reconstruction method and system integrating machine learning and spatial frequency analysis
#752Structured light three-dimensional measurement method based on joint multi-frequency heterodyne and time-gated overlapping coding strategy
#753Birefringence mitigation in an optical network
#754System and method for detecting thickness and bow of large-sized wafers
#755Autonomous vehicle sensing through visually obscuring vegetation
#756Autonomous vehicle terrain prediction and detection
#757Solar-based semi-mobile recharge skid
#758Autonomous vehicle charging station
#759Autonomous vehicle terrain prediction and detection
#760Spatially filtered talbot interferometer for wafer distortion measurement
#761Method and optical system for reconstructing surface of object
#762On-axis dynamic interferometer and optical imaging systems employing the same
#763Dynamic fiber optic shape sensing
#764Spectrally-resolved three-dimensional shape measurement device and spectrally-resolved three-dimensional shape measurement method
#765Method and apparatus for automating contact between an ATR crystal and a specimen
#766Inspecting a slab of material
#767Single snap-shot fringe projection system
#768Method and apparatus to determine slider-level flatness as provided on a full carrier
#769High-resolution in-line metrology for roll-to-roll processing operations
#770Side illumination in interferometry
#771Interferometer with real-time fringe-free imaging
#772Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement
#773Systems and methods for wafer structure uniformity monitoring using interferometry wafer geometry tool
#774Systems and methods for using white light interferometry to measure undercut of a bi-layer structure
#775Method for non-destructive evaluation of ceramic coatings