ClassID:

164302

G01B11/2441 - page 3 - CPC Classification

Classification description:

Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using interferometry

Recent Application in this class:
#601
20090182528
2009-07-16

Analyzing surface structure using scanning interferometry

#602
20090168076
2009-07-02

Light wave interferometer apparatus

#603
20090168075
2009-07-02

Measurement method, a measurement apparatus, and a computer-readable recording medium

#604
20090168017
2009-07-02

Refractive prescription using optical coherence tomography

#605
20090147269
2009-06-11

Interferometric nanoimaging system

#606
20090135431
2009-05-28

Ultra precision profile measuring method

#607
20090128829
2009-05-21

Method and apparatus for determining a deviation of an actual shape from a desired shape of an optical surface

#608
20090109444
2009-04-30

Methods and systems for white light interferometry and characterization of films

#609
20090091769
2009-04-09

Inner surface measuring apparatus

#610
20090091723
2009-04-09

Measuring apparatus, exposure apparatus, and device fabrication method

#611
20090079993
2009-03-26

Dental optical coherence tomograph

#612
20090079992
2009-03-26

Method and system for measuring a surface of an object

#613
20090059208
2009-03-05

Apparatus and method for a combined interferometric and image based geometric determination, particularly in the microsystem technology

#614
20090044610
2009-02-19

Systems and methods for characterizing thickness and topography of microelectronic workpiece layers

#615
20090010560
2009-01-08

Method for image calibration and apparatus for image acquiring

#616
20090009773
2009-01-08

Method for measuring surface profile, and apparatus using the same

#617
20090002789
2009-01-01

Interferometer

#618
20090002716
2009-01-01

LASER SCANNING INTERFEROMETRIC SURFACE METROLOGY

#619
20080316500
2008-12-25

Methods of testing and manufacturing optical elements

#620
20080285052
2008-11-20

Information processing apparatus for interference signal processing

#621
20080285048
2008-11-20

Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information

#622
20080278730
2008-11-13

METHODS AND SYSTEMS FOR DETERMINING OPTICAL PROPERTIS USING LOW COHERENCE INTERFERENCE SIGNALS

#623
20080259348
2008-10-23

Multiple channel interferometric surface contour measurement system

#624
20080259346
2008-10-23

Optical measuring device for measuring a plurality of surfaces of an object to be measured

#625
20080252898
2008-10-16

Method for optically testing semiconductor devices

#626
20080243441
2008-10-02

Signal analysis method for vibratory interferometry

#627
20080221837
2008-09-11

Method and system for analyzing low-coherence interferometry signals for information about thin film structures

#628
20080215271
2008-09-04

Surface profiling apparatus

#629
20080204741
2008-08-28

Method for quantifying defects in a transparent substrate

#630
20080202229
2008-08-28

Device and method for testing a tire, in particular by means of an interferometric measuring method

#631
20080198366
2008-08-21

Apparatus for measuring defects in a glass sheet

#632
20080180693
2008-07-31

Determining positional error of an optical component using structured light patterns

#633
20080174785
2008-07-24

Apparatus for the contact-less, interferometric determination of surface height profiles and depth scattering profiles

#634
20080170204
2008-07-17

Method and apparatus for determining the shape, distance and orientation of an object

#635
20080165341
2008-07-10

Multiple channel interferometric surface contour measurement system

#636
20080151258
2008-06-26

Shape measuring apparatus, shape measuring method, and exposure apparatus

#637
20080137090
2008-06-12

Hologram and method of manufacturing an optical element using a hologram

#638
20080123103
2008-05-29

Three-dimensional shape measurement method and three-dimensional shape measurement apparatus

#639
20080111996
2008-05-15

Three-dimensional shape measuring method and apparatus

#640
20080079950
2008-04-03

Diffractive null corrector employing a spatial light modulator

#641
20080074676
2008-03-27

Method and device for inspecting a surface of an optical component

#642
20080068613
2008-03-20

Scanning interferometric methods and apparatus for measuring aspheric surfaces and wavefronts

#643
20080063998
2008-03-13

Apparatus for caries detection

#644
20080043247
2008-02-21

Method of manufacturing an optical element

#645
20080018906
2008-01-24

Method and an apparatus for shape measurement, and a frequency comb light generator

#646
20080018901
2008-01-24

Compensation of systematic effects in low coherence interferometry

#647
20080013101
2008-01-17

Repairing method for dark areas on a surface profile and a surface profile measuring method

#648
20080013100
2008-01-17

Surface profile measuring method

#649
20080007694
2008-01-10

Measurement of lenses and lens molds using optical coherence tomography

#650
20070296978
2007-12-27

Chromatic compensation in Fizeau interferometer

#651
20070291274
2007-12-20

Interferometric Measuring System

#652
20070285670
2007-12-13

Method and apparatus for detecting defect on a surface of a specimen

#653
20070279639
2007-12-06

Profilometry apparatus and method of operation

#654
20070279638
2007-12-06

MEMS-based, phase-shifting interferometer

#655
20070268584
2007-11-22

Interferometric measuring device

#656
20070229847
2007-10-04

Interferometers for the measurement of large diameter thin wafers

#657
20070211256
2007-09-13

Linear-carrier phase-mask interferometer

#658
20070206200
2007-09-06

Interferometric measuring device

#659
20070201035
2007-08-30

In situ determination of pixel mapping in interferometry

#660
20070177156
2007-08-02

Surface profiling method and apparatus

#661
20070177153
2007-08-02

Measuring endoscope apparatus

#662
20070165240
2007-07-19

Shape measurement method

#663
20070146724
2007-06-28

Vibration-resistant interferometer apparatus

#664
20070145143
2007-06-28

Optical imaging system

#665
20070139657
2007-06-21

Three-dimensional geometric measurement and analysis system

#666
20070133010
2007-06-14

Off-axis paraboloid interferometric mirror with off focus illumination

#667
20070133008
2007-06-14

Optical fiber delivered reference beam for interferometric imaging

#668
20070127036
2007-06-07

Interference measurement system self-alignment method

#669
20070110334
2007-05-17

Phase unwrapping method, program, and interference measurement apparatus

#670
20070097379
2007-05-03

Integrated interference scanning method

#671
20070086019
2007-04-19

Methods and systems for determining optical properties using low-coherence interference signals

#672
20070035744
2007-02-15

Device and method for a combined interferometry and image-based determination of geometry, especially for use in micro system engineering

#673
20070024866
2007-02-01

Method of combining holograms

#674
20070024858
2007-02-01

Inner surface measuring apparatus

#675
20070019203
2007-01-25

Phase shift interferometer

#676
20070013917
2007-01-18

Measuring apparatus

#677
20070003945
2007-01-04

Method for manufacturing a biosensor element and for testing the same

#678
20070003436
2007-01-04

Method and apparatus for phase contrast quadrature interferometric detection of an immunoassay

#679
20070003163
2007-01-04

Method of assembling a composite data map having a closed-form solution

#680
20060285123
2006-12-21

Method and apparatus for tilt corrected lateral shear in a lateral shear plus rotational shear absolute flat test

#681
20060285122
2006-12-21

Surface profiling apparatus with reference calibrator and method of calibrating same

#682
20060274325
2006-12-07

Method of qualifying a diffraction grating and method of manufacturing an optical element

#683
20060262321
2006-11-23

Method and system for analyzing low-coherence interferometry signals for information about thin film structures

#684
20060256350
2006-11-16

Laser scanning interferometric surface metrology

#685
20060256347
2006-11-16

Interferometric measuring device

#686
20060250618
2006-11-09

Interferometer and method of calibrating the interferometer

#687
20060244974
2006-11-02

Method for optically testing semiconductor devices

#688
20060238774
2006-10-26

Interferometric measuring device

#689
20060221348
2006-10-05

Method for compensating errors in interferometric surface metrology

#690
20060192975
2006-08-31

Surface shape measuring apparatus

#691
20060187467
2006-08-24

Method for measuring optical-phase distribution

#692
20060187465
2006-08-24

Interferometry systems and methods using spatial carrier fringes

#693
20060187463
2006-08-24

Optical-distortion correcting apparatus and optical-distortion correcting method

#694
20060181714
2006-08-17

Method for processing multiwavelength interferometric imaging data

#695
20060176522
2006-08-10

Interferometer system for and a method of determining a surface characteristic by modifying surface height data using corresponding amplitude data

#696
20060158660
2006-07-20

Non-destructive optical imaging system for enhanced lateral resolution

#697
20060158659
2006-07-20

Interferometer for determining characteristics of an object surface

#698
20060158658
2006-07-20

Interferometer with multiple modes of operation for determining characteristics of an object surface

#699
20060158657
2006-07-20

Interferometer for determining characteristics of an object surface, including processing and calibration

#700
20060146342
2006-07-06

Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element

#701
20060146336
2006-07-06

Interferometer arrangement and interferometric measuring method

#702
20060139656
2006-06-29

Overlapping common-path interferometers for two-sided measurement

#703
20060132795
2006-06-22

Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry

#704
20060126077
2006-06-15

Method and apparatus for measuring holding distortion

#705
20060120088
2006-06-08

Mounting mechanism for compensating optics in interferometer

#706
20060119862
2006-06-08

Profilometry through dispersive medium using collimated light with compensating optics

#707
20060119861
2006-06-08

Method for measuring contour variations

#708
20060114475
2006-06-01

Measurement of complex surface shapes using a spherical wavefront

#709
20060114472
2006-06-01

Fizeau interferometer designs for optical coherence tomography

#710
20060109482
2006-05-25

3D and 2D measurement system and method with increased sensitivity and dynamic range

#711
20060098206
2006-05-11

Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometer

#712
20060082781
2006-04-20

Optical image measuring apparatus

#713
20060077395
2006-04-13

Optical image measuring apparatus and optical image measuring method

#714
20060061774
2006-03-23

Optical measuring device for measuring curved surfaces

#715
20060061773
2006-03-23

Feature isolation for frequency-shifting interferometry

#716
20060055939
2006-03-16

Optical image measuring apparatus

#717
20060044567
2006-03-02

Interferometer for measuring virtual contact surfaces

#718
20060033934
2006-02-16

Method and apparatus for interferometric measurement of components with large aspect ratios

#719
20060033929
2006-02-16

Phase measuring method and apparatus for multi-frequency interferometry

#720
20060033925
2006-02-16

Interferometric measuring device utilizing a slanted probe filter

#721
20060028652
2006-02-09

Optical image measuring apparatus and optical image measuring method

#722
20060012582
2006-01-19

Transparent film measurements

#723
20050275848
2005-12-15

Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry

#724
20050259265
2005-11-24

Methods and systems for determining optical properties using low-coherence interference signals

#725
20050249107
2005-11-10

Multi-layer Optical Disc And System

#726
20050248770
2005-11-10

Interferometric apparatus and method for surface profile detection

#727
20050243327
2005-11-03

Compact optical apparatus

#728
20050237535
2005-10-27

Vibration resistant interferometry

#729
20050237534
2005-10-27

Vibration resistant interferometry

#730
20050231733
2005-10-20

Non-destructive testing system using a laser beam

#731
20050225769
2005-10-13

Surface profiling apparatus

#732
20050213102
2005-09-29

Method and apparatus for measuring dynamic configuration surface

#733
20050206889
2005-09-22

Optical fiber inspection device

#734
20050206877
2005-09-22

Shape measuring apparatus, shape measuring method, and aligning method

#735
20050200856
2005-09-15

Interferometry systems and methods

#736
20050190374
2005-09-01

Optical image measuring apparatus for obtaining a signal intensity and spatial phase distribution of interference light

#737
20050177339
2005-08-11

Precision surface measurement

#738
20050174581
2005-08-11

Sensing device for measuring the three-dimension shape and its measuring method

#739
20050162664
2005-07-28

Compensation for errors in off-axis interferometric measurements

#740
20050157311
2005-07-21

Scanning interferometer for aspheric surfaces and wavefronts

#741
20050134864
2005-06-23

Method and apparatus for absolute figure metrology

#742
20050128488
2005-06-16

Method and apparatus for three-dimensional spectrally encoded imaging

#743
20050122529
2005-06-09

Measurement system of three-dimensional shape of transparent thin film using acousto-optic tunable filter

#744
20050117167
2005-06-02

Light interference measurement method using computer-generated hologram, and interferometer using this method

#745
20050107184
2005-05-19

Multi-beam probe with adjustable beam angle

#746
20050083537
2005-04-21

Reconfigurable interferometer system

#747
20050068545
2005-03-31

Caching of intra-layer calculations for rapid rigorous coupled-wave analyses

#748
20050036152
2005-02-17

Vibration-resistant interferometer apparatus

#749
20050024647
2005-02-03

Optical profile determining apparatus and associated methods including the use of a plurality of wavelengths in the reference beam and a plurality of wavelengths in a reflective transit beam

#750
20050007599
2005-01-13

Stroboscopic interferometry with frequency domain analysis

#751
19174940
2025-12-30

Surface topography reconstruction method and system integrating machine learning and spatial frequency analysis

#752
18914858
2025-05-20

Structured light three-dimensional measurement method based on joint multi-frequency heterodyne and time-gated overlapping coding strategy

#753
18885002
2025-01-07

Birefringence mitigation in an optical network

#754
18632298
2024-10-22

System and method for detecting thickness and bow of large-sized wafers

#755
18217431
2025-09-16

Autonomous vehicle sensing through visually obscuring vegetation

#756
17882303
2025-03-11

Autonomous vehicle terrain prediction and detection

#757
17408359
2024-12-10

Solar-based semi-mobile recharge skid

#758
17408355
2025-03-18

Autonomous vehicle charging station

#759
17402269
2024-10-22

Autonomous vehicle terrain prediction and detection

#760
16989157
2024-10-01

Spatially filtered talbot interferometer for wafer distortion measurement

#761
16690141
2020-08-25

Method and optical system for reconstructing surface of object

#762
16509162
2022-03-01

On-axis dynamic interferometer and optical imaging systems employing the same

#763
16296489
2020-05-26

Dynamic fiber optic shape sensing

#764
16203882
2020-04-28

Spectrally-resolved three-dimensional shape measurement device and spectrally-resolved three-dimensional shape measurement method

#765
16147828
2020-01-21

Method and apparatus for automating contact between an ATR crystal and a specimen

#766
15410328
2018-03-13

Inspecting a slab of material

#767
15227837
2018-05-01

Single snap-shot fringe projection system

#768
15212874
2018-06-12

Method and apparatus to determine slider-level flatness as provided on a full carrier

#769
15049080
2017-08-29

High-resolution in-line metrology for roll-to-roll processing operations

#770
14733092
2017-08-29

Side illumination in interferometry

#771
14723803
2017-08-01

Interferometer with real-time fringe-free imaging

#772
14466936
2016-12-06

Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement

#773
14325758
2019-07-16

Systems and methods for wafer structure uniformity monitoring using interferometry wafer geometry tool

#774
14275502
2015-11-24

Systems and methods for using white light interferometry to measure undercut of a bi-layer structure

#775
14180914
2016-11-08

Method for non-destructive evaluation of ceramic coatings