LATERAL SHEARING INTERFEROMETRY FOR SURFACE PROFILE MEASUREMENT OF PATTERN WAFERS

METHOD FOR SUPER-RESOLUTION MICROSCOPIC INTERFEROMETRIC MEASUREMENT BASED ON BROADBAND ANNULAR RADIALLY POLARIZED LIGHT

INTERFEROMETRIC MEASURING DEVICE

LASER TRACKING INTERFEROMETRIC SPATIAL COORDINATE MEASUREMENT SYSTEM AND METHOD BASED ON DUAL ELECTRO-OPTICAL FREQUENCY COMB

SYSTEMS AND METHODS FOR INSPECTION AND METROLOGY OF VERTICAL INTERCONNECT ACCESS IN SEMICONDUCTOR SUBSTRATES

CONTACTLESS ONLINE FUSION DRAW GLASS THICKNESS MEASUREMENT SYSTEM AND METHOD

APPARATUS AND METHOD FOR OPTICAL TOMOGRAPHY WITH EXTENDED IMAGING DEPTH

DEBRIS DETERMINATION METHOD

SYSTEM AND METHOD FOR SYNCHRONOUSLY DETECTING THICKNESS AND DOUBLE-SIDE SURFACE PROFILES

PROBE, AND SHAPE MEASURING DEVICE

SYSTEMS AND METHODS FOR QUASI-DOPPLER SHIFT INTERFEROMETER

COHERENT SPECTROSCOPY FOR TSV

SURFACE TOPOGRAPHY RECONSTRUCTION METHOD AND SYSTEM INTEGRATING MACHINE LEARNING AND SPATIAL FREQUENCY ANALYSIS

System and Method of Measuring an Optical Surface by Collimating a Divergent Beam

METHOD FOR THE INTERFEROMETRIC DETERMINATION OF THE SURFACE SHAPE OF A TEST OBJECT

Additive Manufacturing with Photo-Acoustic Tomography Defect Testing

INSPECTION DEVICE AND INSPECTION METHOD

SEMICONDUCTOR MEASUREMENT DEVICE

INTERFERENCE FRINGE PROJECTION OPTICAL SYSTEM, SHAPE MEASUREMENT DEVICE, AND SHAPE MEASUREMENT METHOD

CALCULATING DISTRIBUTED TWIST OF A MULTI-FIBER 3D SHAPE SENSOR BUNDLE (MFB) USING OPTICAL FREQUENCY DOMAIN REFLECTOMETRY (OFDR) PHASE INTERROGATION DATA

SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY

METHOD FOR SEEDING CELLS ON A SENSOR SURFACE

Methods and Systems for Characterizing Laser Machining Properties by Measuring Keyhole Dynamics Using Interferometry

DEVICE FOR MEASURING SEMICONDUCTORS

CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING

METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME

MEASUREMENT DEVICE

MEASUREMENT DEVICE

THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM

LASER AND SYNTHETIC PROFILOMETRY OF A POSITIVE DISPLACEMENT MOTOR (PDM) AND ML METHODS, SYSTEMS, AND COMPUTER MEDIUM STORING INSTRUCTIONS FOR PREDICTING PDM ATTRIBUTES

BIREFRINGENCE MITIGATION IN AN OPTICAL NETWORK

DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSIONAL MORPHOLOGY OF MELT POOLS

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETRIC MEASUREMENTS

THREE-DIMENSIONAL SHAPE MEASURING DEVICE AND THREE-DIMENSIONAL SHAPE MEASURING METHOD

Calculating distributed twist of a multi-fiber 3D shape sensor bundle (MFB) using optical frequency domain reflectometry (OFDR) phase interrogation data

INFEROMETRIC MEASURING APPARATUS

SURFACE PROCESSING EQUIPMENT

OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR

METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED ON OCT IMAGES

METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

SURFACE METROLOGY SYSTEMS AND METHODS THEREOF

METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL

Analysis System

SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASUREMENT METHOD

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITION ADJUSTMENT METHOD THEREFOR, AND MEASUREMENT MODE SWITCHING METHOD THEREFOR

IN-LINE WAFER EDGE SEALING MONITORING SYSTEM AND METHODS OF OPERATION

OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETERODYNE INTERFERENCE MEASUREMENT METHOD

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

Optical Metrology System and Methods for the Measurement of Optical Surfaces

Method for Eliminating Interference Pattern in Image, and Apparatus

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO INTERFEROGRAMS

Measurement system and measurement method

SYSTEMS AND METHODS FOR MEASURING HEIGHT PROPERTIES OF SURFACES

MEASUREMENT SYSTEM FOR DETECTING DEEP-HOLE SURFACE TOPOGRAPHY BASED ON LOW-COHERENCE INTERFEROMETRY

SURFACE INSPECTION DEVICE AND SHAPE MEASUREMENT SOFTWARE

Shape Sensing of Multimode Optical Fibers

Method and system for determining a three-dimensional definition of an object by reflectometry

System and method for determining post bonding overlay

MEASUREMENT DEVICE FOR INTERFEROMETRIC MEASUREMENT OF A SURFACE SHAPE

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

Optically computed phase microscopy

MEASURING DEVICE AND MACHINING DEVICE

MEASUREMENT APPARATUS, METHOD FOR MEASURING BY INTERFEROMETRY, PROCESSING METHOD, OPTICAL ELEMENT AND LITHOGRAPHY SYSTEM

3D PROFILOMETRY WITH A LINNIK INTERFEROMETER

MEASURING DEVICE FOR INTERFEROMETRICALLY MEASURING A SURFACE FORM

Optical fiber sensor, optical system and method of optically interrogating an optical fiber sensor

Semiconductor measurement apparatus

THREE-DIMENSIONAL MEASUREMENT DEVICE

DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

MEASUREMENT METHOD OF SURFACE SHAPE AND SURFACE SHAPE MEASUREMENT DEVICE

MEASUREMENT METHOD OF SURFACE SHAPE AND SURFACE SHAPE MEASUREMENT DEVICE

COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE

Non-Contact Automated Measurement for Interface Gaps

PRODUCTION METHOD AND MEASUREMENT METHOD

Three-dimensional measurement device

INTERFEROMETRIC MEASURING DEVICE

THREE-DIMENSIONAL MEASUREMENT DEVICE

Calibration method of optical coherence tomography device and camera

SYSTEMS AND METHODS FOR INSPECTING PHOTOMASKS

SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM

SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM

METHOD FOR OBTAINING THE PROFILE OF A SURFACE MOVING IN RELATION TO THE SYSTEM

Low-coherence interferometer with surface power compensation

Polarization-separated, phase-shifted interferometer

SYSTEMS AND METHODS FOR SEMICONDUCTOR CHIP SURFACE TOPOGRAPHY METROLOGY

Alignment of a measurement optical system and a sample under test

Fast measurement method for micro-nano deep groove structure based on white light interference

Method and device for characterizing the surface shape of an optical element

DISTANCE MEASUREMENT DEVICE, DISTANCE MEASUREMENT METHOD, AND MACHINE TOOL

Polarizing Fizeau interferometer

VIBRATION INSENSITIVE INTERFEROMETRY FOR MEASURING THICKNESS AND PROFILE OF MULTILAYER THIN-FILM

Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry

Thin films and surface topography measurement using polarization resolved interferometry

SYSTEM AND METHOD FOR DETECTING PARTICLE CONTAMINATION ON A BONDING TOOL

Interferometric lens aligner and method

PARTS SUPPLY DEVICE AND PARTS TRANSFER SYSTEM

Device and method for imaging and interferometry measurements

Operation accuracy measuring method

Detection aided two-stage phase unwrapping on pattern wafer geometry measurement

MEASURING DEVICE FOR INTERFEROMETRIC SHAPE MEASUREMENT

NON-CONTACT OPTICAL MEASUREMENT DEVICES AND EXCHANGEABLE OPTICAL PROBES

Surface profile inspection methods and systems

Device and method for measuring interfaces of an optical element

MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT

OPTICAL MEASURING DEVICE, ASSEMBLING DEVICE OF MOUNTING SUBSTRATE, AND ASSEMBLING METHOD FOR MOUNTING SUBSTRATE

Interferometric speckle visibility spectroscopy

MEASUREMENT APPARATUS FOR SURFACE SHAPE OF HIGHLY REFLECTIVE MIRROR

Interferometric measurement method and interferometric measurement arrangement

Intra-oral scanning device with integrated optical coherence tomography (OCT)

Method for measuring wafer profile

Transient digital moire phase-shifting interferometric measuring device and method for the surface shape of an optical element

Method and device for characterizing the surface shape of an optical element

Measuring apparatus for interferometrically determining a surface shape

METHOD FOR NON-DESTRUCTIVE INSPECTION OF A STRUCTURE AND CORRESPONDING SYSTEM

All-in-focus imager and associated method

Surface processing equipment and surface processing method

On-chip signal processing method and pixel-array signal

Method for examining a coating of a probe surface

System and method for determining post bonding overlay

Method for calibrating a measuring apparatus

Shape measuring system and shape measuring method

Diffractive optical element for a test interferometer

Displacement sensor and profile measurement apparatus

Measuring apparatus and method of wafer geometry

Surface quality sensing using self-mixing interferometry

METHOD FOR DETERMINING INITIATION POSITION OF FRETTING FATIGUE CRACKS

Optical measurement device and multiple mirror

Surface metrology systems and methods thereof

Spectroscopic measuring apparatus and method, and method for fabricating semiconductor device using the measuring method

Method for determining geometrical parameters of a soft contact lens

Three-dimensional optical tomography method and apparatus using partially coherent light and multi-illumination pattern

MEASUREMENT METHOD FOR INTERFEROMETRICALLY DETERMINING A SURFACE SHAPE

APPARATUS, SYSTEMS AND METHODS FOR COMPRESSIVE SENSING

High resolution distributed sensor utilizing offset core optical fiber

Detection device for detecting lens surface in stitching interferometer

Additive Manufacturing With Photo-Acoustic Tomography Defect Testing

Device and method for characterizing the surface shape of a test object

Method And Device For Measuring Apex Radius Of Optical Element Based On Computer-Generated Hologram

Optical fiber sensor, optical system and method of optically interrogating an optical fiber sensor

Surface sensing probe and methods of use

Variable Interference-Fringe-Interval Optical Circuit and Fringe Projection Device

Stitching-measurement device and stitching-measurement method

Alignment method for a beam-directing unit of an interferometric measuring device, and measuring device for carrying out an interferometric measurement by means of laser radiation

Systems and methods for semiconductor chip surface topography metrology

Ultra-sensitive speckle analyzing system

TOOL ARCHITECTURE FOR WAFER GEOMETRY MEASUREMENT IN SEMICONDUCTOR INDUSTRY

Composite laminate damage detection method using an in-situ thermal gradient and expansion differences across the damage

Method and device for inspecting a surface of an object comprising nonsimilar materials

Optical vehicle diagnostic system

Device and method for analyzing the surface of parts having cooling fluid openings

Wafer shape and flatness measurement apparatus and method

MACHINE TOOL AND ELECTRIC DISCHARGE MACHINING APPARATUS

Single sideband frequency modulated laser measurement for detecting a difference in a propagation distance

System and method for compensating for non-linear response characteristic in phase-shifting deflectometry

Systems and methods for real time measurement of surface curvature and thermal expansion of small samples

Fast phase-shift interferometry by laser frequency shift

Light emitting device, optical detection system, optical detection device and optical detection method

Method and device for characterizing the surface shape of an optical element

Hybrid 3D inspection system

Analysis apparatus, analysis method, and interference measurement system

MEMS tunable VCSEL powered swept source OCT for 3D metrology applications

Structured beam generation device and method based on beam shaping

Surface analysis tools for process control of laser treatment of composites

Active alignment technique for measuring tilt errors in aspheric surfaces during optical assembly using lens alignment station (LAS)

Systems, methods and devices for generating depth image

Optical shape sensing method and system

Measurement device employing color appearing due to interference of white light, system, and program

Interferometric speckle visibility spectroscopy

Adjustable depth of field optical coherence tomography

Dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation

Single-shot, adaptive metrology of rotationally variant optical surfaces using a spatial light modulator

Intra-oral scanning device with integrated optical coherence tomography (OCT)

Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry

Method and device for characterizing the surface shape of an optical element

Compensation optical system for an interferometric measuring system

Interferometric system with motion mechanism for inspecting multi-channel fiber optic connectors

Additive manufacturing apparatus and additive manufacturing method

INSPECTING A SLAB OF MATERIAL

Tomographic image imaging device

3D IC bump height metrology APC

MEASUREMENT DEVICE

Removable opaque coating for accurate optical topography measurements on top surfaces of transparent films

MEMS tunable VCSEL powered swept source OCT for 3D metrology applications

SYSTEM AND METHOD FOR SUPER-RESOLUTION FULL-FIELD OPTICAL METROLOGY ON THE FAR-FIELD NANOMETRE SCALE

Test of operational status of a digital scanner during lithographic exposure process

Metrology and profilometry using light field generator

Interferometric waviness detection systems

Vehicle size measurement apparatus and vehicle size measuring method

Systems for and methods of measuring photomask flatness with reduced gravity-induced error

Apparatus and method for measuring topography and gradient of the surfaces, shape, and thickness of patterned and unpatterned wafers

Method and apparatus for remote sensing of objects utilizing radiation speckle

Dual-interferometry wafer thickness gauge

Telecentric and broadband achromatic objective lens systems

Steerable focal adjustment for optical coherence tomography

Physical parameter estimating method, physical parameter estimating device, and electronic apparatus using sampling theorem in the fractional fourier transform domain

Method and apparatus for measuring a structure on a substrate

Workpiece holder, inspection apparatus, and workpiece position correction method

3D intraoral camera using frequency modulation

OPTICAL MEASUREMENT APPARATUS

Illumination apparatus

Method and system for object reconstruction

Method for operating a component that is cyclically loaded during operation

Instantaneous phase mapping deflectometry

Micro resolution imaging range sensor system

Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry

Shape measuring apparatus and shape measuring method using matched frequency measuring light

Optical interference measuring device

Optical measuring device

Measurement apparatus for measuring height or shape of a surface of a material

Sample shape measuring apparatus for calculating a shape of a sample disposed between an illumination optical system and an observation optical system

Metrology of multi-layer stacks

System and method for a displacement measurement

Method and apparatus for detecting concave cylinder and cylindrical diverging lens

3D-shape auto-tracing method and measuring apparatus

Method and apparatus for detecting cylinder and cylindrical converging lens

Determination of operability of a digital scanner with shearing interferometry

Method and apparatus for the determination of the index of refraction of lens material

Asymmetric optical interference measurement method and apparatus

Substance Wettability Assessment Method and Assessment Device

Interferometric touch probe

Exchangeable lens module system for probes of interferometric optical measuring machines

Multi wavelength multiplexing for quantitative interferometry

Measuring device for interferometric determination of a shape of an optical surface

Multiple beam scanning system for measuring machine

3D IC bump height metrology APC

METHOD AND SYSTEM FOR THE OPTICAL INSPECTION AND MEASUREMENT OF A FACE OF AN OBJECT

Steerable focal adjustment for optical coherence tomography

System and method of surface inspection of an object using mulitplexed optical coherence tomography

Adjustable depth of field optical coherence tomography

Method and device for determining whether or not a single use mold is acceptable

Shape measuring device

Calibration method of image measuring device

FREQUENCY MODULATED MULTIPLE WAVELENGTH PARALLEL PHASE SHIFT INTERFEROMETRY

Apparatus for measuring thickness and surface profile of multilayered film structure using imaging spectral optical system and measuring method

Shape measurement method and shape measurement device

Full-field statistical and characterizing method of fluid micro-explored strain for alloy microstructure

Inspecting a slab of material

Three-dimensional form measurement device

Shape measuring apparatus and method for manufacturing target object to be coated

Optical system, optical device, and program

Optical roughness sensor for a coordinate measuring machine

Method of measuring volume of micro projection and method of applying liquid material

Inspecting a slab of material

Three-dimensional shape measuring apparatus, three-dimensional shape measuring probe

Device and method for distance measurement for a laser processing system, and a laser processing system

Optical coherence tomography with a fizeau-type interferometer

Photodetection device including interference element

Methods and systems of holographic interferometry

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND CONTROL METHOD THEREOF

Fourier transform-type spectroscopic device

Radius-of-curvature measurement by spectrally-controlled interferometry

Light source device and measuring instrument using change over time of intensity of mode-locked oscillated output light

Spectrally and temporally engineered processing using photoelectrochemistry

Three-dimensional shape measuring apparatus using diffraction grating

Vibration measurement device

METHOD AND APPARATUS FOR MEASURING BIOFILM THICKNESS AND TOPOLOGY

Interference measurement device having a variable phase element

OPTICAL PROFILOMETER

Sensitive optical fiber shape sensing based on shape-related optical polarization evolution

Method and apparatus for deriving a topography of an object surface

Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronics

Transparent film error correction pattern in wafer geometry system

Device for inspecting by interferometry

Methods and systems for characterizing laser machining properties by measuring keyhole dynamics using interferometry

Determination of operability of a digital scanner with shearing interferometry

HIGH DEFINITION OPTICAL COHERENCE TOMOGRAPHY IMAGING FOR NON-INVASIVE EXAMINATION OF HERITAGE WORKS

Exchangeable lens module system for probes of optical measuring machines

Method and system for reproducing visual content

Gradient light interference microscopy for 3D imaging of unlabeled specimens

Optical measurement device having a plurality of rotary shafts and displacement detectors for detecting axial displacement of each rotary shaft and using the detected axial displacement for three-dimensional image correction

Optical shape sensing system and method for sensing a position and/or shape of a medical device using backscatter reflectometry

Noise reduction techniques, fractional bi-spectrum and fractional cross-correlation, and applications

Method for processing scan data

Interferometric measuring arrangement

Three-dimensional measurement device

Shape measuring device

Shape measuring device

3D IC bump height metrology APC

Method for identifying blood particles using a photodetector

Interference fringe projection apparatus and measurement apparatus

Illumination apparatus and measurement apparatus

Measurement method and measurement device

Physical parameter estimating method that determines a matched order of an intensity distribution signal according to calculated magnitude spectrums and electronic apparatus

MEASUREMENT EQUIPMENT WITH OUTLIER FILTER

Precision surface measurement in a vacuum

System and method for a displacement measurement

Systems and methods for performing phase shift interferometry while a wafer is vibrating

Precision alignment of the substrate coordinate system relative to the inkjet coordinate system

Device for determining a 3D structure of an object

OPTICAL PROFILOMETER

Device and method for surface profilometry for the control of wafers during processing

Method and system for object reconstruction

Measuring probe and measuring probe system

Shape measurement device and shape measurement method

Part program generating device of surface texture measuring apparatus

Measuring microscope for measuring masks for lithographic methods and measuring method and calibration method therefor

Three-dimensional interferometer, method for calibrating such an interferometer and method for reconstructing an image

ADDITIVE MANUFACTURING APPARATUS AND ADDITIVE MANUFACTURING METHOD