ClassID:

164311

G01B11/2531 - CPC Classification

Classification description:

Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device

Recent Application in this class:
#1
20250137775
2025-05-01

COLLIMATING ARRAY FOR AN OPTICAL SENSING DEVICE

#2
20240200934
2024-06-20

MEASUREMENT DEVICE AND BOARD INSPECTION DEVICE

#3
20240053142
2024-02-15

Method for suppressing reflection of binary grating image projection based on high-frequency pattern interference

#4
20230230267
2023-07-20

OBJECT DETECTION

#5
20230184543
2023-06-15

Dual-pattern optical 3D dimensioning

#6
20220290980
2022-09-15

Lighting system with pattern element

#7
20210254969
2021-08-19

Three-dimensional measurement device

#8
20210140764
2021-05-13

Collimating array for an optical sensing device

#9
20210041230
2021-02-11

Three-dimensional shape measuring apparatus and method thereof utilizing point cloud data and top view map imaging

#10
20200309914
2020-10-01

Spatially self-similar patterned illumination for depth imaging

#11
20200232790
2020-07-23

Lighting system with pattern element

#12
20200232789
2020-07-23

Devices and Methods for Calibrating a Measuring Apparatus Using Projected Patterns

#13
20200213577
2020-07-02

Three-Dimensional (3D) Image System and Electronic Device

#14
20190302234
2019-10-03

Spatially self-similar patterned illumination for depth imaging

#15
20190137856
2019-05-09

Meta projectors emitting structured light or uniform light based on polarization of incident light and electronic apparatuses including the same

#16
20190052863
2019-02-14

Three-dimensional (3D) image system and electronic device

#17
20180335506
2018-11-22

Spatially self-similar patterned illumination for depth imaging

#18
20180335298
2018-11-22

THREE-DIMENSIONAL SHAPE MEASURING APPARATUS AND CONTROL METHOD THEREOF

#19
20180218486
2018-08-02

Substrate inspection apparatus and method

#20
20180156601
2018-06-07

Method and apparatus for determining the 3D coordinates of an object

#21
20170254642
2017-09-07

Dynamic digital fringe projection techniques for measuring warpage

#22
20170205495
2017-07-20

Spatially self-similar patterned illumination for depth imaging

#23
20170076458
2017-03-16

Device and method for three-dimensional reconstruction of a scene by image analysis

#24
20160370171
2016-12-22

Diagnosing multipath interference and eliminating multipath interference in 3D scanners using projection patterns

#25
20160364874
2016-12-15

Three-dimensional coordinate scanner and method of operation

#26
20160335472
2016-11-17

Device and method for measuring three-dimensional shape

#27
20160320314
2016-11-03

Visual inspection apparatus and visual inspection method

#28
20160238381
2016-08-18

System for measuring three-dimensional profile of transparent object or refractive index by fringe projection

#29
20160153772
2016-06-02

Shape measurement apparatus and method

#30
20150253129
2015-09-10

INSPECTION APPARATUS

#31
20150253123
2015-09-10

Spatially self-similar patterned illumination for depth imaging

#32
20150164621
2015-06-18

Method and device for carrying out optical pickup

#33
20150124081
2015-05-07

Method of measuring a height of 3-dimensional shape measurement apparatus

#34
20150070472
2015-03-12

Measuring apparatus for three-dimensional profilometry and method thereof

#35
20140377716
2014-12-25

Dental measuring device for three dimensional measurement of teeth

#36
20140333727
2014-11-13

Three-dimensional measuring device

#37
20140268093
2014-09-18

Three-dimensional coordinate scanner and method of operation

#38
20140267629
2014-09-18

Diagnosing multipath interference and eliminating multipath interference in 3D scanners using automated repositioning

#39
20140267623
2014-09-18

Three-dimensional scanner with external tactical probe and illuminated guidance

#40
20140267620
2014-09-18

Diagnosing multipath interference and eliminating multipath interference in 3D scanners by directed probing

#41
20140267619
2014-09-18

Diagnosing multipath interference and eliminating multipath interference in 3D scanners using projection patterns

#42
20140168379
2014-06-19

Device for optically scanning and measuring an environment

#43
20140160243
2014-06-12

Three-dimensional shape measuring apparatus and control method thereof

#44
20140152794
2014-06-05

Measurement microscope device, image generating method, measurement microscope device operation program, and computer-readable recording medium

#45
20140118502
2014-05-01

System and method for extracting a 3D shape of a hot metal surface

#46
20130226156
2013-08-29

Device and method for optical image correction in metrology systems

#47
20130222578
2013-08-29

Shape measurement apparatus and method

#48
20130215262
2013-08-22

Board inspection apparatus and method

#49
20130016338
2013-01-17

SCANNER WITH PHASE AND PITCH ADJUSTMENT

#50
20120127486
2012-05-24

Method of inspecting a substrate

#51
20110310401
2011-12-22

Hybrid sensor

#52
20110310399
2011-12-22

Hybrid sensor

#53
20110265294
2011-11-03

Sensor system and reverse clamping mechanism

#54
20110002529
2011-01-06

Method for inspecting measurement object

#55
20110002527
2011-01-06

Board inspection apparatus and method

#56
20110001818
2011-01-06

Three dimensional shape measurement apparatus

#57
20100309483
2010-12-09

Sensor system and reverse clamping mechanism

#58
20100303341
2010-12-02

Method and device for three-dimensional surface detection with a dynamic reference frame

#59
20100302558
2010-12-02

System and method for dynamic windowing

#60
20100302554
2010-12-02

Hybrid sensor

#61
20100302364
2010-12-02

Three dimensional shape measurement apparatus and method

#62
20100295941
2010-11-25

Shape measurement apparatus and method

#63
20100091302
2010-04-15

Apparatus and method for measuring three-dimensional shape by using multi-wavelength

#64
20090216486
2009-08-27

Method for measuring three-dimension shape

#65
20090190139
2009-07-30

Multi-source sensor for three-dimensional imaging using phased structured light

#66
20090141287
2009-06-04

Surface-distortion measuring device and method

#67
20080281554
2008-11-13

System and method for repairing composite parts

#68
20070177159
2007-08-02

Method for automated measurement of three-dimensional shape of circuit boards

#69
20060244977
2006-11-02

Projector for an arrangement for three-dimensional optical measurement of objects

#70
20060012802
2006-01-19

Apparatus and methods for surface contour measurement

#71
20050110868
2005-05-26

System and method for inputting contours of a three-dimensional subject to a computer

#72
20050090749
2005-04-28

Method and device for carrying out optical pick up

#73
15601036
2018-07-31

Three-dimensional imaging using a multi-phase projector