G01B11/2536 - CPC Classification Index

ClassID:

164312 ⎘

G01B11/2536 - CPC Classification

Classification description:

Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence

Recent Application in this class:

20250130037

2025-04-24

METROLOGY FOR ADDITIVE MANUFACTURING

20240369352

2024-11-07

DETERMINING AND RECONSTRUCTING A SHAPE AND A MATERIAL PROPERTY OF AN OBJECT

20230392920

2023-12-07

MULTIPLE CHANNEL LOCATING

20220252392

2022-08-11

Metrology for additive manufacturing

20220074738

2022-03-10

THREE DIMENSIONAL IMAGING

20210325174

2021-10-21

Metrology apparatus and method for determining a characteristic of one or more structures on a substrate

20210314549

2021-10-07

Switchable fringe pattern illuminator

20210231434

2021-07-29

Estimation method, measurement method, and estimation apparatus

20210123723

2021-04-29

Apparatus for three-dimensional shape measurement

#10

20200402247

2020-12-24

Method for augmenting a scene in real space with projected visual content

#11

20200386542

2020-12-10

Position detection system and position detection method for detecting position of object

#12

20200355494

2020-11-12

STRUCTURED LIGHT PROJECTION

#13

20200260058

2020-08-13

PROJECTION SYSTEM

#14

20200240774

2020-07-30

Method of measuring 3D profile

#15

20200213577

2020-07-02

Three-Dimensional (3D) Image System and Electronic Device

#16

20200166333

2020-05-28

Hybrid light measurement method for measuring three-dimensional profile

#17

20200150419

2020-05-14

Camera assembly with programmable diffractive optical element for depth sensing

#18

20200138286

2020-05-07

Eye surface topographer

#19

20190353472

2019-11-21

Multiple channel locating

#20

20190281263

2019-09-12

Projection system

#21

20190265028

2019-08-29

Metrology apparatus and method for determining a characteristic of one or more structures on a substrate

#22

20190137856

2019-05-09

Meta projectors emitting structured light or uniform light based on polarization of incident light and electronic apparatuses including the same

#23

20190137267

2019-05-09

Apparatus for projecting a time-variable optical pattern onto an object to be measured in three dimensions

#24

20190052863

2019-02-14

Three-dimensional (3D) image system and electronic device

#25

20180347971

2018-12-06

Systems, methods, and media for performing shape measurement

#26

20180306577

2018-10-25

System and methods for shape measurement using dual frequency fringe pattern

#27

20180189968

2018-07-05

Shape reconstruction of specular and/or diffuse objects using multiple layers of movable sheets

#28

20180094918

2018-04-05

Apparatus and method for measuring 3D form or deformation of an object surface using a grid pattern and reference plane

#29

20180045503

2018-02-15

Multiple channel locating

#30

20180031470

2018-02-01

Control of amplitude and phase of diffraction orders using polarizing targets and polarized illumination

#31

20170254642

2017-09-07

Dynamic digital fringe projection techniques for measuring warpage

#32

20170059408

2017-03-02

Method and device for generating multispectral or hyperspectral light, for hyperspectral imaging and/or for distance measurement and/or 2D or 3D profile measurement of an object by means of spectrometry

#33

20160191873

2016-06-30

Projection device, and projection method

#34

20160069669

2016-03-10

Information processing apparatus, information processing method, and storage medium

#35

20160054118

2016-02-25

Measurement system, measurement method, and vision chip

#36

20150292875

2015-10-15

SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT

#37

20150204663

2015-07-23

3D scanner using structured lighting

#38

20150176982

2015-06-25

Systems, methods, and media for performing shape measurement

#39

20150077764

2015-03-19

Multiple channel locating

#40

20140293081

2014-10-02

Computing device and method of image matching

#41

20130155417

2013-06-20

Three-dimensional measurement apparatus, method for three-dimensional measurement, and computer program

#42

20130076896

2013-03-28

Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium

#43

20130016338

2013-01-17

SCANNER WITH PHASE AND PITCH ADJUSTMENT

#44

20130016190

2013-01-17

Grating-based scanner with phase and pitch adjustment

#45

20120176478

2012-07-12

FORMING RANGE MAPS USING PERIODIC ILLUMINATION PATTERNS

#46

20120133954

2012-05-31

Measuring apparatus, measuring method, and program

#47

20120120413

2012-05-17

Structured light 3-D measurement module and system for illuminating a subject-under-test in relative linear motion with a fixed-pattern optic

#48

20120092463

2012-04-19

Dual-frequency phase multiplexing (DFPM) and period coded phase measuring (PCPM) pattern strategies in 3-D structured light systems, and lookup table (LUT) based data processing

#49