CORRUGATED CARDBOARD PRODUCTION UNIT AND METHOD FOR INSPECTING THE FLATNESS OF CORRUGATED CARDBOARD SHEETS

TESTING SYSTEM AND METHOD THEREOF

Gas Dispersion Plate Inspection Method, Its Electronic Equipment, and Gas Dispersion Plate Inspection Device

Coating Thickness Measuring Device and Coating Device Including the Same

ERROR RESISTANT PHOTOMASK MEASUREMENT TECHNIQUES FOR DIFFERENT SUPPORT POSITIONS

SUBSTRATE FOR HIGH-FREQUENCY DEVICE, AND METHOD FOR PRODUCING SAME

UNEVENNESS MEASURING DEVICE FOR SHEET-SHAPED MATERIAL, AND UNEVENNESS MEASURING METHOD FOR SHEET-SHAPED MATERIAL

SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR

Flatness measuring system, method and apparatus

METHOD FOR EXTRACTING SURFACE MORPHOLOGY AND FABRIC CHARACTERISTICS OF ROCK ORES AND MINERALS

DEVICE, SYSTEM AND METHOD FOR DETERMINING DEGRADATION

OPTICAL DEVICE AND OPTICAL MEASUREMENT METHOD

System and method for detecting a defect in a specimen

Optical inspection apparatus, processing device, optical inspection method, and non-transitory storage medium storing optical inspection program

System with substrate carrier deterioration detection and repair

NON-CONTACT DIMENSIONAL MEASUREMENT DEVICE WITH MICROMETRIC RESOLUTION

UNEVENNESS LEVEL INSPECTING DEVICE, UNEVENNESS LEVEL INSPECTING METHOD, AND STORAGE MEDIUM

PRECISION HIGH RESOLUTION SURFACE PROFILING APPARATUS AND METHOD

APPARATUS AND METHOD FOR QUANTIFYING THE SURFACE FLATNESS OF THREE-DIMENSIONAL POINT CLOUD DATA

METHOD, DEVICE AND SYSTEM FOR MONITORING FLATNESS OF WAFER TABLE, AND STORAGE MEDIUM

Wafer surface defect inspection method and apparatus thereof

METHODS AND SYSTEMS FOR MEASURING FLATNESS OF ALUMINUM ALLOY SHEET IN A HEAT TREATING FURNACE

Device and system for testing flatness

Device and method for distributed detection of straightness of working face of scraper conveyor based on optical fiber sensing

Measuring apparatus and method of wafer geometry

Wafer backside engineering for wafer stress control

Method of measuring a flatness of an object and apparatus for performing the same

Hardness and flatness tester

Systems having light source with extended spectrum for semiconductor chip surface topography metrology

Flatness detection device

TUBULAR BODY INNER SURFACE INSPECTION METHOD AND TUBULAR BODY INNER SURFACE INSPECTION APPARATUS

Substrate carrier deterioration detection and repair

Flatness roller, system for measuring flatness and line for associated rolling operations

Surface scanner, an arrangement and a method for surface defect detection of a cable

Ultrasonic inspection of extents of voids or the like in heated material using fluid blowing

Wafer surface curvature determining system

Shape inspection apparatus and shape inspection method

Reaming and self-rotating anchor rod and using method thereof

Apparatuses and methods for warpage measurement

Hardness and flatness tester

RUBBER SHEET MONITORING APPARATUS AND RUBBER SHEET MONITORING METHOD

Shape-Distortion Standards for Calibrating Measurement Tools for Nominally Flat Objects

Cylindrical body surface inspection device and cylindrical body surface inspection method

Systems for and methods of measuring photomask flatness with reduced gravity-induced error

Mobile and automated apparatus for the detection and classification of damages on the body of a vehicle

Vehicle lighting

Leveling system

Leveling system

Device and method for the automated picking up and laying of a segment to form a lining of a tunnel

Surface inspection apparatus and surface inspection method

Levelness measuring device and levelness measuring method

Inspection method for semiconductor substrates using slope data and inspection apparatus

Portable 3D document scanning device and method

Three-dimensional surface roughness evaluating device, three-dimensional surface roughness evaluating method, three-dimensional surface roughness data acquiring device, and three-dimensional surface roughness data acquiring method

Method for selecting template assembly, method for polishing workpiece, and template assembly

Device and method for optical monitoring of surfaces of an object

Road surface assessment apparatus for vehicle

Metrology system for substrate deformation measurement

Substrate warpage detection device, substrate warpage detection method, and substrate processing apparatus and substrate processing method using the same

Method for producing an OSB

SCANNING DEVICE AND SCANNING SYSTEM FOR WAFER POLISHING APPARATUS

Shape measurement apparatus and shape measurement method

Shape measurement apparatus and shape measurement method

Apparatus and method for the optical detection of inner walls

Vehicle with internal and/or external monitoring

Next generation warpage measurement system

Shape inspection method, shape inspection apparatus, and program

INSTALLATION FOR PRODUCING A FILM WEB AND METHOD FOR OPERATING SUCH AN INSTALLATION

Survey method and survey apparatus

Measuring pavement deflections using data from laser scanning sensors as well as from high precision accelerometers and gyrometers

Concrete screeding system with floor quality feedback/control

Composite Processing Machine for Detecting Material Height and Collision

Measuring device and method for substrate warping amount

MEASUREMENT EQUIPMENT WITH OUTLIER FILTER

Edge registration for interferometry

Communication device

Automatic analysis device and separation and washing method

Evaluation method of road surface property, and evaluation device of road surface property

Pattern accuracy detecting apparatus and processing system

Dynamic digital fringe projection techniques for measuring warpage

Surface texture measuring apparatus and method

Method, device and inspection line for visualizing the flatness of a surface of a container ring

Backlight source flatness detection system and backlight source flatness detection method

Device and method for checking windshield wiper blades

Digital imaging for determining mix ratio of a coating

Method and device for detecting flatness of a fluorescent wheel in a laser light source

Surface measuring device and method thereof

Positioning device for an optical triangulation sensor

Reference mirror converter of Linnik interferometer

Sheet of colloidal crystals immobilized in resin, method of displaying structural color using same, method for detecting unevenness distribution or hardness distribution of subject using same, and structural color sheet

Method for measuring flatness of sheet, device for measuring flatness of sheet, and production method for steel sheet

Surface roughness measurement device

Dent mirror

Specimen measuring device and computer program product

Method and apparatus for quantitative measurement of surface accuracy of an area

Deformation detection tool and method for detecting deformation

Flatness measuring and measuring of residual stresses for a metallic flat product

Concrete screeding system with floor quality feedback/control

Unevenness detecting device

Real-time digitally enhanced imaging for the prediction, application, and inspection of coatings

MONITORING DEVICE FOR A ROLLER CRUSHER

Optical system and optical quality measuring apparatus

Methods and apparatus to monitor material conditioning machines

Methods and apparatus to monitor material conditioning machines

Machine and method for acquiring data for measuring the twist and concavity of agricultural discs

Method and apparatus to monitor and control sheet characteristics on a creping process

Testing device for testing dimensions of workpieces

Method and device for measuring the flatness of a metal product

Apparatus for inspecting warpage of sheet-like member and method for inspecting warpage of sheet-like member

COMPUTING DEVICE AND METHOD FOR MEASURING FLATNESS OF OBJECT

Liquid processing apparatus and liquid processing method

Device for measuring undulation of brake disc in railway wheel with brake discs

Determining the characteristics of a road surface by means of a 3D camera

Semiconductor device and method of calibrating warpage testing system to accurately measure semiconductor package warpage

Method and system for optical camber measurement of flat sheet membranes, films, and webs

Bright-field differential interference contrast system with scanning beams of round and elliptical cross-sections

Methods and apparatus to monitor material conditioning machines

Reshaping device and positioning assembly thereof

Apparatus, system and method for measuring straightness of components of rotating assemblies

Refitting mechanism

Method for calculating warpage of bonded SOI wafer and method for manufacturing bonded SOI wafer

Wrinkle detection device and wrinkle detection method

Method for the absolute measurement of the flatness of the surfaces of optical elements, using an interferometer and a three-flat method

Apparatus for detecting the flatness of wafer and the method thereof

System of measuring warpage and method of measuring warpage

Method and apparatus for measuring shape and thickness variation of a wafer

Method and apparatus to monitor and control sheet characteristics on a creping process

APPARATUS FOR MEASURING WARPAGE CHARACTERISTIC OF SPECIMEN

Method for measuring flatness of sheet material and method for manufacturing steel sheet using the same

Method and apparatus for determining flatness characteristic for reflective facet of polygon assembly

Control device for a parallel slider device, control method and measuring device using same

IMAGING APPARATUS AND CONTROL METHOD THEREFOR

Inspection apparatus and inspection method

Lithographic apparatus and method

Wafer shape thickness and trench measurement

ELECTRONIC DEVICE AND METHOD FOR MEASUREMENT OF FLATNESS OF OBJECTS USING THE ELECTRONIC DEVICE

Electronic device and method for analyzing adjoining parts of a product

Method for measuring sheet material flatness and method for producing steel sheet using said measuring method

Shape measuring method

System and method of measuring irregularity of a glass substrate

UNEVEN AREA INSPECTION SYSTEM

Interferometer with a virtual reference surface

Detecting apparatus

Method of inspecting semiconductor device

Apparatus and method for detecting optical profile

Measuring method of hole diameter, hole position, hole surface roughness, or bending loss of holey optical fiber, manufacturing method of holey optical fiber, and test method of optical line of holey optical fiber

Coplanarity-testing machine

PROFILE MEASURING DEVICE, PROFILE MEASURING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE

Method and system for calibrating a multiple-beam curvature/flatness sensor

Formation method of metallic electrode of semiconductor device and metallic electrode formation apparatus

APPARATUS FOR THE MEASUREMENT OF THE TOPOGRAPHY AND PHOTOELECTRIC PROPERTIES OF TRANSPARENT SURFACES

Structural deflection and load measuring device

Focal position detecting method

Inspecting system and inspecting method

Method and device for sintering an object while determining the geometric surface profile of the object

Method of determination of glass surface shapes and optical distortion by reflected optical imaging

Optical device for observing millimetric or submillimetric structural details of an object with specular behaviour

Method and apparatus for measuring shape or thickness information of a substrate

LIGHTWAVE INTERFERENCE MEASUREMENT DEVICE

SURFACE INSPECTION DEVICE AND AN ARRANGEMENT FOR INSPECTING A SURFACE

Unevenness detecting apparatus, method, and computer readable medium

Lens module distortion measuring system and method

DYNAMIC RANGE EXTENSION TECHNIQUES FOR A WAVEFRONT SENSOR INCLUDING USE IN OPHTHALMIC MEASUREMENT

Optical displacement measuring instrument

Undulation Inspection Device, Undulation Inspecting Method, Control Program for Undulation Inspection Device, and Recording Medium

System and method of measuring and mapping three dimensional structures

Tire inspection device

Apparatus for measuring defects in a glass sheet

Detecting device and method for detecting unevenness of a glass substrate

Calibration Method For Edge Inspection Apparatus

Line profile asymmetry measurement

Inspection apparatus and inspection method

Method of Measuring Peripheral Tilt Angle, Method and Device for Inspecting Inspection Object Having Surface Mounds, Method of Determining Position of Illumination Means, Irregularity Inspection Device, and Light Source Position Determining Device

Distortion evaluating apparatus and distortion evaluating method

Method and apparatus for measuring surface shape profile

Method of measuring warpage of rear surface of substrate

Coplanarity inspection device for printed circuit boards

Surface profile measuring apparatus

Systems and methods for measuring sample surface flatness of continuously moving samples

Method for detecting surface defects on a substrate and device using said method

METHOD OF CALIBRATING OR COMPENSATING SENSOR FOR MEASURING PROPERTY OF A TARGET SURFACE

SURFACE FLATNESS TESTING DEVICE AND METHOD THEREOF

Measurement of pavement unevenness

Apparatus for measuring defects in a glass sheet

Measurement apparatus for measuring surface map

Apparatus for automatically inspecting road surface pavement condition

Unevenness elimination end-point detecting apparatus and unevenness elimination end-point detecting method for CMP apparatus

Surface characteristic analysis

Web planarity gauge and method

Method for measuring doctor blade geometric deviations

Gauge to measure distortion in glass sheet

Device and method for the topographical determination of surface properties

Measuring device having an optical probe tip

Image Rotation Devices and Their Applications

System and method of measuring and mapping three dimensional structures

Method and apparatus for measuring the crepe of a moving sheet

Method and apparatus for bump inspection

Method and apparatus for the treatment of a semiconductor wafer

Interferometers for the measurement of large diameter thin wafers

Method and apparatus for measuring heterodyne optical interference utilizing adjustable polarizing plate

Line profile asymmetry measurement

Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics

Method of measuring warpage of rear surface of substrate

Apparatus and methods for measuring shape of both sides of a plate

Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method

Wafer flatness evaluation method, wafer flatness evaluation apparatus carrying out the evaluation method, wafer manufacturing method using the evaluation method, wafer quality assurance method using the evaluation method, semiconductor device manufacturing method using the evaluation method and semiconductor device manufacturing method using a wafer evaluated by the evaluation method

Surface inspection by amplitude modulated specular light detection

Surface inspection by double pass laser doppler vibrometry

Material independent profiler

Method and device for detecting, determining and documenting damage, especially deformations in lacquered surfaces caused by sudden events

DYNAMIC WAFER STRESS MANAGEMENT SYSTEM

Optical measuring system for detecting geometric data of surfaces

Phase shifting imaging module and method of imaging

Wafer edge inspection

Surface finish roughness measurement

Flatness tester for optical components

Method and apparatus for inspecting front surface shape

Device and method for inspecting surfaces in the interior of holes

Method of characterizing substrate warpage

Measurement system having modulated laser source

Method of combining holograms

Detecting and classifying surface features or defects by controlling the angle of the illumination plane of incidence with respect to the feature or defect

Wafer edge inspection

Wafer edge inspection

Wafer edge inspection

Optical measuring process and precision measuring machine for determining the deviations from ideal shape of technically polished surfaces

Method for processing multiwavelength interferometric imaging data

Method and apparatus for verifying planarity in a probing system

Double sided optical inspection of thin film disks or wafers

Inspection method for warpage of rod and inspection apparatus therefor

Overlapping common-path interferometers for two-sided measurement

Measurement of complex surface shapes using a spherical wavefront

Surface inspection method and apparatus

Apparatuses and methods for measuring head suspensions and head suspension assemblies

System and method for surface profiling a target object

Optical measurements of patterned structures

Displacement and flatness measurements by use of a laser with diffractive optic beam shaping and a multiple point sensor array using the back reflection of an illuminating laser beam

Movable-type flatness measurement apparatus

Systems and methods for measuring sample surface flatness of continuously moving samples

Flatness monitor

Device and method for the quantified evaluation of surface characteristics

Surface inspection apparatus

3D bullet and cartridge case analysis

Measurement device for determining the straightness of shafts or shaft tunnels

Compensation for errors in off-axis interferometric measurements

Method and device for optically measuring the surface shape and for the optical surface inspection of moving strips in rolling and processing installations

Device and method for measuring the profile of a surface

Method and device for correcting guiding errors in a coordinate measuring machine

Flatness measurement system for metal strip

Method for writing a pattern on a surface intended for use in exposure equipment and for measuring the physical properties of the surface

Copper CMP flatness monitor using grazing incidence interferometry

Selecting a hypothetical profile to use in optical metrology

Method of detecting and classifying scratches, particles and pits on thin film disks or wafers

Method and equipment in the measurement of the flatness of the flow surface of the headbox of a paper machine

Method for mobile on and off-line monitoring of colored and high-gloss automobile component surfaces

Automated and accurate high-throughput slider-level flatness inspection

Measurement of thickness, surface profile, and optical power of a transparent sheet

Method and apparatus to determine slider-level flatness as provided on a full carrier

Systems and methods for wafer surface feature detection and quantification