Patents-Review.com
ClassID:

164413 ⎘

G01B2290/20 - CPC Classification

Classification description:

Aspects of interferometers not specifically covered by any group under Dispersive element for generating dispersion

Recent Application in this class:
#1
20240053137
2024-02-15

SIGNAL PROCESSING DEVICE, OCT DEVICE, SIGNAL PROCESSING METHOD, AND PROGRAM

 #2
20230324165
2023-10-12

Broadband interferometry and method for measurement range extension by using same

 #3
20220268565
2022-08-25

Interferometry with pulse broadened diode laser

 #4
20220196385
2022-06-23

Apparatus, systems and methods for detecting light

 #5
20220196381
2022-06-23

Interferometer and optical instrument with integrated optical components

 #6
20210018311
2021-01-21

Interferometry with pulse broadened diode laser

 #7
20200386533
2020-12-10

Heterodyne laser interferometer based on integrated secondary beam splitting component

 #8
20200064117
2020-02-27

Interferometry with pulse broadened diode laser

 #9
20190310072
2019-10-10

Grating measurement apparatus

 #10
20190011248
2019-01-10

Displacement detecting device with controlled heat generation

 #11
20180283852
2018-10-04

Three-dimensional shape measuring apparatus using diffraction grating

 #12
20180259316
2018-09-13

Interferometry with pulse broadened diode laser

 #13
20150366451
2015-12-24

Optical imaging device and method for imaging a sample

 #14
20150338202
2015-11-26

Interferometric apparatus and sample characteristic determining apparatus using such apparatus

 #15
20150205090
2015-07-23

Methods for optical amplified imaging using a two-dimensional spectral brush

 #16
20150043006
2015-02-12

Interferometry employing refractive index dispersion broadening of interference signals

 #17
20150002850
2015-01-01

Optical coherence tomography technique

 #18
20130335548
2013-12-19

Quantitative phase microscopy for high-contrast cell imaging using frequency domain phase shift

 #19
20120050722
2012-03-01

Multiple measuring point configuration for a chromatic point sensor

 #20
20100315652
2010-12-16

Method and system of adjusting a field of view of an interferometric imaging device

 #21
20100183188
2010-07-22

Optical measuring instrument using both reflectometry and white-light interferometry

 #22
20100141829
2010-06-10

Methods for optical amplified imaging using a two-dimensional spectral brush

 #23
20100118292
2010-05-13

Cross-chirped interferometry system and method for light detection and ranging

 #24
20090262359
2009-10-22

Apparatus for optical frequency domain tomography with adjusting system

 #25
20090207416
2009-08-20

Surface characteristic determining apparatus

 #26
20090040521
2009-02-12

Even frequency spacing spectrometer and optical coherence tomography device

 #27
20080316500
2008-12-25

Methods of testing and manufacturing optical elements

 #28
20070229840
2007-10-04

Interferometric measuring device

 #29
20070064241
2007-03-22

Tracking algorithm for linear array signal processor for Fabry-Perot cross-correlation pattern and method of using same

 #30
20060055938
2006-03-16

Transmissive scanning delay line for optical coherence tomography

 #31
20050190371
2005-09-01

Low-coherence inferometric device for light-optical scanning of an object

 #32
17018035
2021-12-21

High speed wide field autocollimator