ClassID:

164146

G01B7/281 - CPC Classification

Classification description:

Measuring arrangements characterised by the use of electric or magnetic means for measuring contours or curvatures for measuring contour or curvature along an axis, e.g. axial curvature of a pipeline or along a series of feeder rollers

Recent Application in this class:
#1
20250012555
2025-01-09

CURVE INDUCTIVE SENSOR

#2
20240053133
2024-02-15

Curved Surface Measurement Device and Method for Preparation Thereof

#3
20230152079
2023-05-18

METHOD AND DEVICE FOR DETERMINING CENTERS OF A HOLLOW SHAFT ROTATABLY CLAMPED AS A WORKPIECE IN A MACHINE TOOL

#4
20210238991
2021-08-05

System, method and device for fluid conduit inspection

#5
20210080243
2021-03-18

Sensor device for measuring the rotational position of an element

#6
20190368665
2019-12-05

Mount assembly, a system and a method for collecting fluid conduit data

#7
20170010085
2017-01-12

Wire electrical discharge machine

#8
20160040972
2016-02-11

Three-dimensional edge profile determination

#9
20140084054
2014-03-27

Apparatus, system, and method for automated item tracking

#10
20130312541
2013-11-28

Non-differential elastomer curvature sensor

#11
20120300224
2012-11-29

Inspection device for measuring pipe size

#12
20120290258
2012-11-15

Method for measuring and aligning a rotary cylindrical apparatus

#13
20120222489
2012-09-06

Method and device for ascertaining the deformation of a fuel assembly in a pressurized-water reactor

#14
20110234398
2011-09-29

Apparatus, system, and method for automated item tracking

#15
20110164717
2011-07-07

Device for measuring and correcting a parallelism error in a nuclear fuel rod

#16
20110095752
2011-04-28

PIPELINE MONITORING APPARATUS AND METHOD

#17
20110032542
2011-02-10

Method of measuring a length of sections of extrados or intrados curves of an elongated workpiece, and relevant length measuring instrument

#18
20080208524
2008-08-28

SURFACE PROFILE MEASURING INSTRUMENT

#19
20080166823
2008-07-10

Method for evaluating semiconductor wafer, apparatus for evaluating semiconductor wafer, and method for manufacturing semiconductor wafer

#20
20050120812
2005-06-09

Apparatus for inspecting deformation of pipes

#21
20050075800
2005-04-07

System and method for monitoring defects in structures

#22
17489200
2024-02-27

Geometry sensor for inline inspection tool