164164 ⎘
Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers characterised by controlling or generating intrinsic radiation properties
Sub-classes:Polarization-sensitive probe for low coherence interferometer system
#2AN INTERFEROMETER FOR TEAR FILM MEASUREMENT WITH SUB-MICRON RESOLUTION
#3Laser Interferometer
#4DETERMINING ELECTROMAGNETIC WAVE CONTROL FOR MATTER-WAVE INTERFEROMETRY
#5DEVICE, SYSTEM, AND METHOD FOR IN-SITU MEASUREMENT OF THREE-DIMENSIONAL MORPHOLOGY OF MELT POOLS
#6OPTICAL COHERENCE TOMOGRAPHY APPARATUS, IMAGING METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM STORING IMAGING PROGRAM
#7FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS
#8Laser device
#9Methods and apparatus for an adjustable beam directing optical system
#10Adaptive Optical Sensing Using Speckle Prediction
#11INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
#12AN ILLUMINATION SOURCE AND ASSOCIATED METROLOGY APPARATUS
#13LASER INTERFEROMETER
#14Tomographic imaging system for transparent material composite thin film
#15Stabilized frequency generator
#16Methods and apparatus for an adjustable beam directing optical system
#17Two-Dimensional Second Harmonic Dispersion Interferometer
#18Optical systems and methods for measuring turbine blade tip clearance
#19Swept frequency photonic integrated circuit for absolute metrology
#20Calibration method
#21Atom interferometer
#22Laser device
#23Metrology system and method for measuring diagonal diffraction-based overlay targets
#24Device and method for interferometric measurement of a two or three dimensional translation of an object
#25Two-dimensional second harmonic dispersion interferometer
#26ENDOSCOPIC IMAGING USING NANOSCALE METASURFACES
#27System for interrogating an interferometer, an interferometric system and a method for interrogating an interferometer
#28Laser device
#29Robust interferometer and methods of using same
#30OPTICAL AMPLIFIER, OPTICAL COHERENCE TOMOGRAPHY INCLUDING OPTICAL AMPLIFIER, AND OPTICAL AMPLIFICATION METHOD USING OPTICAL AMPLIFIER
#31Methods, systems and apparatus of interferometry for imaging and sensing
#32Crosstalk elimination or mitigation in optical coherence tomography
#33Gas visualizing methods and systems with birefringent polarization interferometer
#34Interference fringe projection apparatus and measurement apparatus
#35IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD
#36Optical fiber temperature control system and method
#37Apparatus and method for measuring thickness
#38Method For Simultaneously Measuring Magnetic And Gravitational Fields Using Atom Interferometers
#39Laser device
#40Light penetration depth evaluation method, performance test method using evaluation method, and optical tomography apparatus
#41TOMOGRAPHIC IMAGE CAPTURING DEVICE
#42Imaging apparatus and imaging method
#43Caliper sensor and method using mid-infrared interferometry
#44Surface emitting laser, information acquisition apparatus, and imaging apparatus
#45Phase control for dual atom interferometers
#46Grating Light Valve Based Optical Coherence Tomography
#47Robust interferometer and methods of using same
#48Two-path plasmonic interferometer with integrated detector
#49Optical scanning and imaging systems based on dual pulsed laser systems
#50Surface emitting laser and optical coherence tomography apparatus
#51Optical imaging device and method for imaging a sample
#52Detection devices and methods using diffraction wavefront of a pinhole stitching measurement of surface shape
#53SEMICONDUCTOR LIGHT EMITTING ELEMENT AND OPTICAL COHERENCE TOMOGRAPHY APPARATUS
#54Dual-phase interferometry for charge modulation mapping in ICS
#55System for calculation of material properties using reflection terahertz radiation and an external reference structure
#56ARRANGEMENTS, DEVICES, ENDOSCOPES, CATHETERS AND METHODS FOR PERFORMING OPTICAL IMAGING BY SIMULTANEOUSLY ILLUMINATING AND DETECTING MULTIPLE POINTS ON A SAMPLE
#57Wavelength monitor
#58Tunable optofluidic apparatus, method, and applications
#59Laser device
#60Swept source optical coherence tomography and method for stabilizing phase thereof
#61Atom interferometry having spatially resolved phase
#62INTERFEROMETER USING ASYMMETRIC POLARIZATION AND OPTICAL DEVICE USING THE INTERFEROMETER
#63DRIVE CONTROL METHOD OF OPTICAL COHERENCE TOMOGRAPHY APPARATUS
#64Optical carrier based microwave interferometric system and method
#65Tracking and characterizing particles with holographic video microscopy
#66Apparatus for detecting a 3D structure of an object
#67Device for managing pulses in pump-probe spectroscopy
#68OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER-TRANSFORM SPECTROSCOPIC ANALYZER
#69Widely tunable swept source
#70Optical scanning and imaging systems based on dual pulsed laser systems
#71Plasmonic interferometer sensor
#72Optical imaging apparatus, optical imaging method, apparatus for setting characteristics of a light source, and method for setting characteristics of a light source
#73System and method for optical coherence tomography
#74Tracking type laser interferometer for objects with rotational degrees of freedom
#75Interferometer and method for controlling the coalescence of a pair of photons
#76Optical scanning and imaging systems based on dual pulsed laser systems
#77Ring light source system for interferometer with adjustable ring radius and ring radial width
#78Optical scanning and imaging systems based on dual pulsed laser systems
#79OPTICAL SCANNING AND IMAGING SYSTEMS BASED ON DUAL PULSED LASER SYSTEMS
#80Tracking and characterizing particles with holographic video microscopy
#81Optical scanning and imaging systems based on dual pulsed laser systems
#82Arrangements, devices, endoscopes, catheters and methods for performing optical imaging by simultaneously illuminating and detecting multiple points on a sample
#83Interferometric displacement measurement system and method based on phase modulation of polarized light of micro probe
#84Optical coherence tomography (OCT) system for producing profilometry measurements of a specimen
#85Displacement measuring system and machining system comprising the same