164184 ⎘
Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers characterised by the beam path configuration Measuring in transmission, i.e. light traverses the object
BONDING ENERGY MEASUREMENT
#2METHODS AND SYSTEMS FOR THREE-DIMENSIONAL IMAGING OF A TRANSPARENT BIOLOGICAL OBJECT IN A BIOLOGICAL SAMPLE BY FULL-FIELD OPTICAL TOMOGRAPHY
#3INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY
#4THREE-DIMENSIONAL MEASUREMENT DEVICE
#5HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRACTION
#6Optical systems with controlled mirror arrangements
#7Three-dimensional measurement device
#8In-Situ Residual Intensity Noise Measurement Method And System
#9Interferometric speckle visibility spectroscopy
#10Two-Dimensional Second Harmonic Dispersion Interferometer
#11Two-dimensional second harmonic dispersion interferometer
#12Optical measurement apparatus and optical measurement method
#13Interferometric speckle visibility spectroscopy
#14Ophthalmic apparatus
#15Distance measuring arrangement for determining a distance from an object
#16DEVICE FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS AND OPTICAL FIBER DISPERSION AND A METHOD OF MEASURING THE PARAMETERS OF PHASE ELEMENTS AND OPTICAL FIBER DISPERSION
#17SURFACE MEASURING DEVICE AND SURFACE MEASURING METHOD
#18Interferometric waviness detection systems
#19Vehicle size measurement apparatus and vehicle size measuring method
#20Interferometry system and associated methods
#21Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
#22Interferometer system and use thereof
#23Multiple beam scanning system for measuring machine
#24Optical measurement apparatus and optical measurement method
#25Optical measurement apparatus and optical measurement method
#26Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample
#27Three-dimensional measurement device
#28Interferometry system and associated methods
#29Particle counter
#30INTERFEROMETRIC METHOD AND APPARATUS FOR SPATIO-TEMPORAL OPTICAL COHERENCE MODULATION
#31Polarization laser sensor
#32Portable interferometric device
#33System for tomographic imaging using coherent light that has a random phase distribution
#34Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths
#35Method and arrangement for determining the heating condition of a mirror in an optical system
#36Observation device and method of observing
#37Light reflection mechanism, optical interferometer and spectrometric analyzer
#38Apparatus and method for optical interrogation
#39Interferometric systems having reflective chambers and related methods
#40System and method for measuring an optical fiber
#41In-line single fiber Mach-Zehnder interferometer
#42Optical Inspection Using Spatial Light Modulation
#43Talbot interferometer, its adjustment method, and measurement method
#44Polarimeter employing a fizeau interferometer
#45Quantitative phase-imaging systems
#46Jones phase microscopy of transparent samples
#47Interferometer device and method
#48Interferometer
#49Measuring the shape, thickness variation, and material inhomogeneity of a wafer
#50Interferometry testing of lenses, and systems and devices for same
#51Cuvette for ophthalmic lens
#52Device and method for the non-invasive detection and measurement of the properties of a medium
#53Time-delayed source and interferometric measurement of windows and domes
#54Apparatus and method of in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry
#55Sensor for optically sensing air borne acoustic waves
#56Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy
#57Aspheric diffractive reference for interferometric lens metrology
#58Coherent beam device for observing and measuring sample
#59Agile high sensitivity optical sensor
#60Common optical-path testing of high-numerical-aperture wavefronts
#61Optical characterization of surfaces and plates
#62Spatially filtered talbot interferometer for wafer distortion measurement
#63Testing device
#64Light pulse atom interferometer velocity reference