ClassID:

164184

G01B9/02024 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers characterised by the beam path configuration Measuring in transmission, i.e. light traverses the object

Recent Application in this class:
#1
20250305935
2025-10-02

BONDING ENERGY MEASUREMENT

#2
20250044075
2025-02-06

METHODS AND SYSTEMS FOR THREE-DIMENSIONAL IMAGING OF A TRANSPARENT BIOLOGICAL OBJECT IN A BIOLOGICAL SAMPLE BY FULL-FIELD OPTICAL TOMOGRAPHY

#3
20240302158
2024-09-12

INTERFEROMETRIC SPECKLE VISIBILITY SPECTROSCOPY

#4
20230366668
2023-11-16

THREE-DIMENSIONAL MEASUREMENT DEVICE

#5
20230366667
2023-11-16

HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRACTION

#6
20230266116
2023-08-24

Optical systems with controlled mirror arrangements

#7
20230243643
2023-08-03

Three-dimensional measurement device

#8
20230049259
2023-02-16

In-Situ Residual Intensity Noise Measurement Method And System

#9
20220341723
2022-10-27

Interferometric speckle visibility spectroscopy

#10
20220091032
2022-03-24

Two-Dimensional Second Harmonic Dispersion Interferometer

#11
20210199575
2021-07-01

Two-dimensional second harmonic dispersion interferometer

#12
20210123721
2021-04-29

Optical measurement apparatus and optical measurement method

#13
20200386535
2020-12-10

Interferometric speckle visibility spectroscopy

#14
20200205654
2020-07-02

Ophthalmic apparatus

#15
20200200523
2020-06-25

Distance measuring arrangement for determining a distance from an object

#16
20200191551
2020-06-18

DEVICE FOR MEASURING THE PARAMETERS OF PHASE ELEMENTS AND OPTICAL FIBER DISPERSION AND A METHOD OF MEASURING THE PARAMETERS OF PHASE ELEMENTS AND OPTICAL FIBER DISPERSION

#17
20200158502
2020-05-21

SURFACE MEASURING DEVICE AND SURFACE MEASURING METHOD

#18
20200049492
2020-02-13

Interferometric waviness detection systems

#19
20200047779
2020-02-13

Vehicle size measurement apparatus and vehicle size measuring method

#20
20190353474
2019-11-21

Interferometry system and associated methods

#21
20190331932
2019-10-31

Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample

#22
20190323821
2019-10-24

Interferometer system and use thereof

#23
20190145757
2019-05-16

Multiple beam scanning system for measuring machine

#24
20180347965
2018-12-06

Optical measurement apparatus and optical measurement method

#25
20180347964
2018-12-06

Optical measurement apparatus and optical measurement method

#26
20180113321
2018-04-26

Methods and apparatus for high resolution imaging with reflectors at staggered depths beneath sample

#27
20180106590
2018-04-19

Three-dimensional measurement device

#28
20180051980
2018-02-22

Interferometry system and associated methods

#29
20170160178
2017-06-08

Particle counter

#30
20160290784
2016-10-06

INTERFEROMETRIC METHOD AND APPARATUS FOR SPATIO-TEMPORAL OPTICAL COHERENCE MODULATION

#31
20160238369
2016-08-18

Polarization laser sensor

#32
20150049343
2015-02-19

Portable interferometric device

#33
20130329226
2013-12-12

System for tomographic imaging using coherent light that has a random phase distribution

#34
20130314712
2013-11-28

Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths

#35
20130230073
2013-09-05

Method and arrangement for determining the heating condition of a mirror in an optical system

#36
20130087724
2013-04-11

Observation device and method of observing

#37
20120038927
2012-02-16

Light reflection mechanism, optical interferometer and spectrometric analyzer

#38
20110292401
2011-12-01

Apparatus and method for optical interrogation

#39
20110242543
2011-10-06

Interferometric systems having reflective chambers and related methods

#40
20110228260
2011-09-22

System and method for measuring an optical fiber

#41
20110102803
2011-05-05

In-line single fiber Mach-Zehnder interferometer

#42
20110026033
2011-02-03

Optical Inspection Using Spatial Light Modulation

#43
20100271636
2010-10-28

Talbot interferometer, its adjustment method, and measurement method

#44
20100259759
2010-10-14

Polarimeter employing a fizeau interferometer

#45
20100231895
2010-09-16

Quantitative phase-imaging systems

#46
20100027027
2010-02-04

Jones phase microscopy of transparent samples

#47
20090128830
2009-05-21

Interferometer device and method

#48
20090002789
2009-01-01

Interferometer

#49
20080285053
2008-11-20

Measuring the shape, thickness variation, and material inhomogeneity of a wafer

#50
20080285019
2008-11-20

Interferometry testing of lenses, and systems and devices for same

#51
20080151236
2008-06-26

Cuvette for ophthalmic lens

#52
20070070352
2007-03-29

Device and method for the non-invasive detection and measurement of the properties of a medium

#53
20070019210
2007-01-25

Time-delayed source and interferometric measurement of windows and domes

#54
20060250620
2006-11-09

Apparatus and method of in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry

#55
20060139653
2006-06-29

Sensor for optically sensing air borne acoustic waves

#56
20050206909
2005-09-22

Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy

#57
20050179911
2005-08-18

Aspheric diffractive reference for interferometric lens metrology

#58
20050146730
2005-07-07

Coherent beam device for observing and measuring sample

#59
20050083534
2005-04-21

Agile high sensitivity optical sensor

#60
20050046863
2005-03-03

Common optical-path testing of high-numerical-aperture wavefronts

#61
20050007601
2005-01-13

Optical characterization of surfaces and plates

#62
16989157
2024-10-01

Spatially filtered talbot interferometer for wafer distortion measurement

#63
16546586
2020-09-15

Testing device

#64
15447042
2019-06-25

Light pulse atom interferometer velocity reference