ClassID:

164203

G01B9/02047 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers characterised by particular imaging or detection techniques using digital holographic imaging, e.g. lensless phase imaging without hologram in the reference path

Recent Application in this class:
#1
20250377603
2025-12-11

HOLOGRAPHIC METROLOGY APPARATUS AND METHOD

#2
20250328107
2025-10-23

SPATIAL PROPERTY OR COLOR IMPLEMENTATION PROPERTY MEASUREMENT DEVICE OF HOLOGRAPHIC IMAGES

#3
20240053135
2024-02-15

OPTICAL DIFFRACTION TOMOGRAPHY MICROSCOPE

#4
20240044636
2024-02-08

OPTICAL DIFFRACTION TOMOGRAPHY MICROSCOPE

#5
20230259070
2023-08-17

Systems and Methods for Reconstruction of Digital Holograms

#6
20230204454
2023-06-29

SPATIAL PROPERTY OR COLOR IMPLEMENTATION PROPERTY MEASUREMENT DEVICE OF HOLOGRAPHIC IMAGES

#7
20220357236
2022-11-10

Device and method for measuring interfaces of an optical element

#8
20220349699
2022-11-03

Surface shape measurement device and surface shape measurement method

#9
20220307815
2022-09-29

System for spatial multiplexing

#10
20220268565
2022-08-25

Interferometry with pulse broadened diode laser

#11
20220196389
2022-06-23

Method for examining a coating of a probe surface

#12
20220018649
2022-01-20

Methods and systems of holographic interferometry

#13
20210034863
2021-02-04

Method for photocopying a sequence of cut surfaces inside a light-scattering object with improved scanning

#14
20210018311
2021-01-21

Interferometry with pulse broadened diode laser

#15
20200348122
2020-11-05

Microscope with rotating beam system

#16
20200271434
2020-08-27

Three-dimensional measurement device

#17
20200064117
2020-02-27

Interferometry with pulse broadened diode laser

#18
20190310085
2019-10-10

METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE

#19
20190250560
2019-08-15

Multiple offset interferometer

#20
20190162520
2019-05-30

Multi wavelength multiplexing for quantitative interferometry

#21
20190017804
2019-01-17

Method for analyzing an object

#22
20180364025
2018-12-20

Balanced detection systems

#23
20180356204
2018-12-13

Calibration method and system for a fast steering mirror

#24
20180266806
2018-09-20

Method and apparatus for digital holographic microtomography

#25
20180259316
2018-09-13

Interferometry with pulse broadened diode laser

#26
20180235461
2018-08-23

Method and device for exposing at least one sectional face inside a light scattering object

#27
20180024008
2018-01-25

Optical system phase acquisition method and optical system evaluation method

#28
20180003499
2018-01-04

METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE

#29
20170322015
2017-11-09

Device for determining a 3D structure of an object

#30
20170299371
2017-10-19

Digital holographic microscope

#31
20170205222
2017-07-20

Digital holographic microscope with electro fluidic system, said electro-fluidic system and methods of use

#32
20170153106
2017-06-01

LENS-FREE TOMOGRAPHIC IMAGING DEVICES AND METHODS

#33
20170038191
2017-02-09

Method for analyzing an object using a combination of long and short coherence interferometry

#34
20160334205
2016-11-17

INTERFEROMETER

#35
20160305761
2016-10-20

System and a method for quantitative sample imaging using off-axis interferometry with extended field of view or faster frame rate

#36
20150338209
2015-11-26

Apparatus for detecting a 3D structure of an object

#37
20150300803
2015-10-22

Three-dimensional shape measuring device, method for acquiring hologram image, and method for measuring three-dimensional shape

#38
20150176966
2015-06-25

Digital holography three-dimensional imaging apparatus and digital holography three-dimensional imaging method

#39
20140320865
2014-10-30

Apparatus for detecting a 3D structure of an object

#40
20140028974
2014-01-30

Line-field holoscopy

#41
20130057935
2013-03-07

Apparatus for the exact reconstruction of the object wave in off-axis digital holography

#42
20130003152
2013-01-03

INTERFEROMETRY-BASED STRESS ANALYSIS

#43
20120307035
2012-12-06

Single shot full-field reflection phase microscopy

#44
20120250032
2012-10-04

Grating-enhanced optical imaging

#45
20120044320
2012-02-23

High resolution 3-D holographic camera

#46
20110255093
2011-10-20

Interferometric system with spatial carrier frequency capable of imaging in polychromatic radiation

#47
20110242543
2011-10-06

Interferometric systems having reflective chambers and related methods

#48
20100331672
2010-12-30

Method and apparatus for motility contrast imaging

#49
20080236306
2008-10-02

SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OPTICAL PATH OF A HOLOGRAPHIC INTERFEROMETRY SYSTEM

#50
17458024
2025-10-14

Phase compensation method for digital holography systems