G01B9/02088 - CPC Classification Index

ClassID:

164238 ⎘

G01B9/02088 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers characterised by particular signal processing and presentation Matching signals with a database

Recent Application in this class:

20240090768

2024-03-21

SYSTEMS AND METHODS FOR SURFACE PROFILE ESTIMATION VIA OPTICAL COHERENCE TOMOGRAPHY

20230251079

2023-08-10

Method and system for measuring a surface of an object comprising different structures using low coherence interferometry

20220011088

2022-01-13

Method and system for measuring a surface of an object comprising different structures using low coherence interferometry

20210145285

2021-05-20

Optical coherence tomography (OCT) apparatus and OCT method for axial tracking and flattening

20210003381

2021-01-07

Measurement device employing color appearing due to interference of white light, system, and program

20170241764

2017-08-24

Method and system for regional phase unwrapping with pattern-assisted correction

20160299121

2016-10-13

Method for assessing the condition of a tissue sample with coherent electromagnetic radiation

20150292860

2015-10-15

Method and apparatus for processing the signal in spectral domain interferometry and method and apparatus for spectral domain optical coherence tomography

20150160124

2015-06-11

Method for measuring characteristics of sample

#10

20140115022

2014-04-24

Program for correcting data measured by PS-OCT and PS-OCT system equipped with the program

#11

20130335747

2013-12-19

Method and apparatus for determining a property of a surface

#12

20130250099

2013-09-26

Measuring apparatus, measuring method, and method of manufacturing an optical component

#13

20120271591

2012-10-25

Thin films and surface topography measurement using reduced library

#14

20120127475

2012-05-24

APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY (LCI)

#15

20120044501

2012-02-23

Film thickness measuring apparatus using interference and film thickness measuring method using interference

#16

20120010494

2012-01-12

Optical three-dimensional structure measuring device and structure information processing method therefor

#17

20100265516

2010-10-21

Interferometer and method for measuring characteristics of optically unresolved surface features

#18

20100134786

2010-06-03

Interferometer with multiple modes of operation for determining characteristics of an object surface

#19

20090182528

2009-07-16

Analyzing surface structure using scanning interferometry

#20

20090147268

2009-06-11

Interferometric analysis of under-resolved features

#21

20090112500

2009-04-30

Memory-based high-speed interferometer

#22

20090079993

2009-03-26

Dental optical coherence tomograph

#23

20090073456

2009-03-19

APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY (LCI)

#24

20090043192

2009-02-12

Method and apparatus for determination of atherosclerotic plaque type by measurement of tissue optical properties

#25

20090036770

2009-02-05

Method and apparatus for determination of atherosclerotic plaque type by measurement of tissue optical properties

#26

20090021723

2009-01-22

Generating model signals for interferometry

#27

20090015844

2009-01-15

Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures

#28

20080266574

2008-10-30

Interferometer and method for measuring characteristics of optically unresolved surface features

#29

20080252896

2008-10-16

Image forming apparatus for forming image on record medium

#30

20080221837

2008-09-11

Method and system for analyzing low-coherence interferometry signals for information about thin film structures

#31

20080180694

2008-07-31

Scanning interferometry for thin film thickness and surface measurements

#32

20080174784

2008-07-24

Apparatus and method for measuring characteristics of surface features

#33

20080088849

2008-04-17

Interferometry for determining characteristics of an object surface, with spatially coherent illumination

#34

20080065350

2008-03-13

Profiling complex surface structures using scanning interferometry

#35

20070247637

2007-10-25

Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures

#36

20070097380

2007-05-03

Profiling complex surface structures using height scanning interferometry

#37

20070081167

2007-04-12

Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures

#38

20070046953

2007-03-01

Interferometer and method for measuring characteristics of optically unresolved surface features

#39

20060262321

2006-11-23

Method and system for analyzing low-coherence interferometry signals for information about thin film structures

#40

20060158659

2006-07-20

Interferometer for determining characteristics of an object surface

#41

20060158658

2006-07-20

Interferometer with multiple modes of operation for determining characteristics of an object surface

#42

20060158657

2006-07-20

Interferometer for determining characteristics of an object surface, including processing and calibration

#43

20060033932

2006-02-16

Scatterometry by phase sensitive reflectometer

#44

20050088663

2005-04-28

Scanning interferometry for thin film thickness and surface measurements

#45

20050073692

2005-04-07

Profiling complex surface structures using scanning interferometry

#46

20050070791

2005-03-31

Signal processing using non-linear regression with a sinusoidal model